| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A certain model of reliability diagnostic of renewal objects
|
Czaplicki, Jacek M.
|
|
1985
|
25 |
4 |
p. 695-698
4 p.
|
artikel
|
| 2 |
Analysis of a two-unit system subject to repair and preventive maintenance with non-linear revenue and costs
|
Gopalan, M.N.
|
|
1985
|
25 |
4 |
p. 621-623
3 p.
|
artikel
|
| 3 |
A new measure for time-dependent queueing systems with statistically dependent arrivals
|
Sharda,
|
|
1985
|
25 |
4 |
p. 651-653
3 p.
|
artikel
|
| 4 |
A new method for system reliability bounds
|
Gopal, Krishna
|
|
1985
|
25 |
4 |
p. 703-708
6 p.
|
artikel
|
| 5 |
A queueing problem with random memory arrivals and heterogeneous servers
|
Sharda,
|
|
1985
|
25 |
4 |
p. 645-650
6 p.
|
artikel
|
| 6 |
4500836 Automatic wafer prober with programmable tester interface
|
Staudacher, George
|
|
1985
|
25 |
4 |
p. 810-
1 p.
|
artikel
|
| 7 |
Bibliography of literature on telecommunication systems reliability
|
Dhillon, Balbir S.
|
|
1985
|
25 |
4 |
p. 715-727
13 p.
|
artikel
|
| 8 |
Busy period analysis of a two-unit warm standby system with imperfect switch
|
Garg, Rajiv
|
|
1985
|
25 |
4 |
p. 675-679
5 p.
|
artikel
|
| 9 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1985
|
25 |
4 |
p. 607-610
4 p.
|
artikel
|
| 10 |
4503386 Chip partitioning aid (CPA)—A structure for test pattern generation for large logic networks
|
DasGupta, Sumit
|
|
1985
|
25 |
4 |
p. 812-
1 p.
|
artikel
|
| 11 |
Computer aided fault tree synthesis
|
Bossche, A.
|
|
1985
|
25 |
4 |
p. 773-788
16 p.
|
artikel
|
| 12 |
4495468 Controlled phase off-set digital test system
|
Richards, EdwardW
|
|
1985
|
25 |
4 |
p. 810-
1 p.
|
artikel
|
| 13 |
Cost analysis of a two unit cold standby system under different weather conditions
|
Goel, L.R.
|
|
1985
|
25 |
4 |
p. 655-659
5 p.
|
artikel
|
| 14 |
Cost analysis of a two-unit warm standby reliability system with two types of repair facilities
|
Murari, K.
|
|
1985
|
25 |
4 |
p. 681-689
9 p.
|
artikel
|
| 15 |
Cost-benefit analysis of a system with intermittent repair and inspection under abnormal weather
|
Goel, L.R.
|
|
1985
|
25 |
4 |
p. 665-668
4 p.
|
artikel
|
| 16 |
Cost-benefit analysis of one-server two-unit system with imperfect switch
|
Gopalan, M.N.
|
|
1985
|
25 |
4 |
p. 643-644
2 p.
|
artikel
|
| 17 |
4504782 Detection of catastrophic failure of dielectric, improper connection, and temperature of a printed circuit assembly via one wire
|
Zbinden, TerryB
|
|
1985
|
25 |
4 |
p. 812-813
2 p.
|
artikel
|
| 18 |
Effect of reliability on the efficiency of communication systems
|
Aggarwal, K.K.
|
|
1985
|
25 |
4 |
p. 691-693
3 p.
|
artikel
|
| 19 |
Estimation of failure probability from a bivariate normal stress-strength distribution
|
Mukherjee, S.P.
|
|
1985
|
25 |
4 |
p. 699-702
4 p.
|
artikel
|
| 20 |
4502209 Forming low-resistance contact to silicon
|
Eizenberg, Moshe
|
|
1985
|
25 |
4 |
p. 811-812
2 p.
|
artikel
|
| 21 |
4502140 Go/no go margin test circuit for semiconductor memory
|
Proebsting, RobertJ
|
|
1985
|
25 |
4 |
p. 811-
1 p.
|
artikel
|
| 22 |
Heat flow resistance measurements of silicon p +-v-n + diodes under forward and reverse biased conditions
|
Eranna, G.
|
|
1985
|
25 |
4 |
p. 709-712
4 p.
|
artikel
|
| 23 |
4500993 In-circuit digital tester for testing microprocessor boards
|
Jacobson, Robert
|
|
1985
|
25 |
4 |
p. 811-
1 p.
|
artikel
|
| 24 |
4504887 Leadless integrated circuit package housing having means for contact replacement
|
Bakermans, Johannes
|
|
1985
|
25 |
4 |
p. 813-
1 p.
|
artikel
|
| 25 |
4506212 Method and apparatus for testing integrated circuits using AC test input and comparison of resulting frequency spectrum outputs
|
Melia, Alan
|
|
1985
|
25 |
4 |
p. 814-
1 p.
|
artikel
|
| 26 |
4504784 Method of electrically testing a packaging structure having n interconnected integrated circuit chips
|
Goel, Prabhakar
|
|
1985
|
25 |
4 |
p. 813-
1 p.
|
artikel
|
| 27 |
4494066 Method of electrically testing a packaging structure having N interconnected integrated circuit chips
|
Goel, Prabhaka
|
|
1985
|
25 |
4 |
p. 809-
1 p.
|
artikel
|
| 28 |
4506215 Modular test probe
|
Coughlin, Charles
|
|
1985
|
25 |
4 |
p. 814-
1 p.
|
artikel
|
| 29 |
On a two-dissimilar unit standby redundant system with imperfect switch
|
Mahmoud, M.A.W.
|
|
1985
|
25 |
4 |
p. 753-758
6 p.
|
artikel
|
| 30 |
On the stochastic behaviour of a one-server n-unit system subject to random inspection
|
Naidu, R.Subramanyam
|
|
1985
|
25 |
4 |
p. 625-629
5 p.
|
artikel
|
| 31 |
4494069 Optical scanning method of testing material defects
|
Lin, HungC
|
|
1985
|
25 |
4 |
p. 809-
1 p.
|
artikel
|
| 32 |
Optimal number of major failures before replacement
|
Park, Kyung S.
|
|
1985
|
25 |
4 |
p. 797-805
9 p.
|
artikel
|
| 33 |
Power system reliability, safety and management
|
G.W.A.D.,
|
|
1985
|
25 |
4 |
p. 808-
1 p.
|
artikel
|
| 34 |
4506363 Programmable logic array in ECL technology
|
Barre, Claude
|
|
1985
|
25 |
4 |
p. 814-
1 p.
|
artikel
|
| 35 |
Publications, notices, calls for papers, etc.
|
|
|
1985
|
25 |
4 |
p. 611-617
7 p.
|
artikel
|
| 36 |
Reliability derivation by cutset approach
|
Jamil, A.T.M.
|
|
1985
|
25 |
4 |
p. 789-795
7 p.
|
artikel
|
| 37 |
Reliability evaluation of human operators under stress
|
Dhillon, Balbir S.
|
|
1985
|
25 |
4 |
p. 729-752
24 p.
|
artikel
|
| 38 |
Stochastic analysis of a man-machine system with critical human error
|
Goel, L.R.
|
|
1985
|
25 |
4 |
p. 669-674
6 p.
|
artikel
|
| 39 |
Stochastic analysis of a one-server two-unit (dissimilar) system subject to slow switch
|
Gopalan, M.N.
|
|
1985
|
25 |
4 |
p. 631-636
6 p.
|
artikel
|
| 40 |
Stochastic analysis of a two unit adaptive system subject to slow switch with random service
|
Radhakrishnan, R.
|
|
1985
|
25 |
4 |
p. 759-771
13 p.
|
artikel
|
| 41 |
Stochastic analysis of one-server two-unit adaptive system with slow switch
|
Gopalan, M.N.
|
|
1985
|
25 |
4 |
p. 637-642
6 p.
|
artikel
|
| 42 |
Stochastic behaviour and profit function of a system with precautionary measures under abnormal weather
|
Goel, L.R.
|
|
1985
|
25 |
4 |
p. 661-664
4 p.
|
artikel
|
| 43 |
Systems reliability, maintainability and management
|
G.W.A.D.,
|
|
1985
|
25 |
4 |
p. 807-
1 p.
|
artikel
|
| 44 |
Technique for lifting off thick film print fired on alumina
|
Singh, Awatar
|
|
1985
|
25 |
4 |
p. 619-620
2 p.
|
artikel
|
| 45 |
4495603 Test system for segmented memory
|
Varshney, RameshC
|
|
1985
|
25 |
4 |
p. 810-
1 p.
|
artikel
|
| 46 |
The new applications of the hypergeometric distribution model on software reliability
|
Xizi, Huang
|
|
1985
|
25 |
4 |
p. 713-714
2 p.
|
artikel
|
| 47 |
The problem of reliability
|
G.W.A.D.,
|
|
1985
|
25 |
4 |
p. 617-
1 p.
|
artikel
|
Tijdschrift beschrijving