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Journal description
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Details for article 15 of 47 found articles
| Title: |
Cost-benefit analysis of a system with intermittent repair and inspection under abnormal weather |
| Author: |
Goel, L.R. Sharma, G.C. Gupta, Praveen |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 25 (1985) nr. 4 pages 4 p. |
| Year: |
1985 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 15 of 47 found articles
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