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                             16 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 An efficient equivalent static methodology for simulating electronic packages subjected to resonant vibrations Gharaibeh, Mohammad A.

145 C p.
artikel
2 A novel p-GaN HEMT with AlInN/AlN/GaN double heterostructure and InAlGaN back-barrier Garg, Tanvika

145 C p.
artikel
3 Design and manufacturing of aspherical GaAs-SILs for a versatile optical semiconductor failure analysis system Arata, Ikuo

145 C p.
artikel
4 Dynamic on-resistance stability of SiC and GaN power devices during high-frequency (100–300 kHz) hard switching and zero voltage switching operations Huang, Zhen-Hong

145 C p.
artikel
5 Editorial Board
145 C p.
artikel
6 Enhanced solder fatigue life of chip resistor by optimizing solder shape Ha, Jonghwan

145 C p.
artikel
7 Impact of device-to-device interference in nanosheet field-effect transistors Lee, Khwang-Sun

145 C p.
artikel
8 Impact of hole trap-detrap mechanism on X-ray irradiation induced threshold voltage shift of radiation-hardened GAA TFET device Kumar, Pankaj

145 C p.
artikel
9 Lifetime prediction for press pack IGBT device by considering fretting wear failure Yao, Ran

145 C p.
artikel
10 Low-temperature reliability enhancement of system-in-package with silicon-based resistors and its electrothermal analysis Wang, Lu

145 C p.
artikel
11 Modelling and analysis of contactless sensor for TSV fault based on resonant inductive coupling Liu, X.Y.

145 C p.
artikel
12 Physics of failure based lifetime modelling for sintered silver die attach in power electronics: Accelerated stress testing by isothermal bending and thermal shock in comparison Heilmann, Jens

145 C p.
artikel
13 Remaining useful life prediction of lithium-ion batteries based on KS agglomeration function integrating multi-expert knowledge Zhigang, Lv

145 C p.
artikel
14 Review of condition monitoring methods for capacitors used in power converters Nathan, Leema Prasila Arokia

145 C p.
artikel
15 Scaling-friendly approaches to minimize the magnitude and asymmetry of wafer warpage during 3-D NAND fabrication Okudur, Oguzhan Orkut

145 C p.
artikel
16 Stout hourglass – The ideal shape for robust solder joints Wong, E.H.

145 C p.
artikel
                             16 gevonden resultaten
 
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