nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A closed-form charge-based expression for drain current in symmetric and asymmetric double gate MOSFET
|
Roy, A.S. |
|
2006 |
50 |
4 |
p. 687-693 7 p. |
artikel |
2 |
Advanced memory concepts for DRAM and nonvolatile memories
|
Horiguchi, Fumio |
|
2006 |
50 |
4 |
p. 545-550 6 p. |
artikel |
3 |
A new CMP-less integration approach for highly scaled totally silicided (TOSI) gate bulk transistors based on the use of selective S/D Si epitaxy and ultra-low gates
|
Müller, Markus |
|
2006 |
50 |
4 |
p. 620-625 6 p. |
artikel |
4 |
A physics-based low frequency noise model for MOSFETs under periodic large signal excitation
|
Brederlow, Ralf |
|
2006 |
50 |
4 |
p. 668-673 6 p. |
artikel |
5 |
A robust 45nm gate-length CMOSFET for 90nm Hi-speed technology
|
Lim, K.Y. |
|
2006 |
50 |
4 |
p. 579-586 8 p. |
artikel |
6 |
A semiempirical surface scattering model for quantum corrected full-band Monte-Carlo simulation of biaxially strained Si/SiGe NMOSFETs
|
Pham, A.T. |
|
2006 |
50 |
4 |
p. 694-700 7 p. |
artikel |
7 |
A SrRuO3/IrO2 top electrode FeRAM with Cu BEOL process for embedded memory of 130nm generation and beyond
|
Kumura, Y. |
|
2006 |
50 |
4 |
p. 606-612 7 p. |
artikel |
8 |
BioMEMS for medicine: On-chip cell characterization and implantable microelectrodes
|
Cheung, Karen C. |
|
2006 |
50 |
4 |
p. 551-557 7 p. |
artikel |
9 |
Calculations of hole mass in [110]-uniaxially strained silicon for the stress-engineering of p-MOS transistors
|
Guillaume, T. |
|
2006 |
50 |
4 |
p. 701-708 8 p. |
artikel |
10 |
Differential magnetoresistance technique for mobility extraction in ultra-short channel FDSOI transistors
|
Chaisantikulwat, W. |
|
2006 |
50 |
4 |
p. 637-643 7 p. |
artikel |
11 |
Do hot electrons cause excess noise?
|
Jungemann, C. |
|
2006 |
50 |
4 |
p. 674-679 6 p. |
artikel |
12 |
Electron mobility in quasi-ballistic Si MOSFETs
|
Łusakowski, J. |
|
2006 |
50 |
4 |
p. 632-636 5 p. |
artikel |
13 |
Generic device abstractions for information processing technologies
|
Cavin, Ralph K. |
|
2006 |
50 |
4 |
p. 520-526 7 p. |
artikel |
14 |
IFC - Editorial Board
|
|
|
2006 |
50 |
4 |
p. CO2- 1 p. |
artikel |
15 |
Impact of dopant segregation on fully depleted Schottky-barrier SOI-MOSFETs
|
Zhang, M. |
|
2006 |
50 |
4 |
p. 594-600 7 p. |
artikel |
16 |
Influence of band structure on electron ballistic transport in silicon nanowire MOSFET’s: An atomistic study
|
Nehari, K. |
|
2006 |
50 |
4 |
p. 716-721 6 p. |
artikel |
17 |
Lateral coupling and immunity to substrate effect in ΩFET devices
|
Ritzenthaler, R. |
|
2006 |
50 |
4 |
p. 558-565 8 p. |
artikel |
18 |
Low temperature characterization of effective mobility in uniaxially and biaxially strained nMOSFETs
|
Lime, F. |
|
2006 |
50 |
4 |
p. 644-649 6 p. |
artikel |
19 |
Method of activation energy analysis and application to individual cells of 256Mb DRAM in 110nm technology
|
Weber, A. |
|
2006 |
50 |
4 |
p. 613-619 7 p. |
artikel |
20 |
Minimization of specific contact resistance in multiple gate NFETs by selective epitaxial growth of Si in the HDD regions
|
Dixit, A. |
|
2006 |
50 |
4 |
p. 587-593 7 p. |
artikel |
21 |
Nanotechnology: Role in emerging nanoelectronics
|
Yu, B. |
|
2006 |
50 |
4 |
p. 536-544 9 p. |
artikel |
22 |
65nm LP/GP mix low cost platform for multi-media wireless and consumer applications
|
Tavel, B. |
|
2006 |
50 |
4 |
p. 573-578 6 p. |
artikel |
23 |
[No title]
|
Ghibaudo, G. |
|
2006 |
50 |
4 |
p. 515- 1 p. |
artikel |
24 |
On the mobility in high-κ/metal gate MOSFETs: Evaluation of the high-κ phonon scattering impact
|
Weber, Olivier |
|
2006 |
50 |
4 |
p. 626-631 6 p. |
artikel |
25 |
Organic CuTCNQ non-volatile memories for integration in the CMOS backend-of-line: Preparation from gas/solid reaction and downscaling to an area of 0.25μm2
|
Müller, Robert |
|
2006 |
50 |
4 |
p. 601-605 5 p. |
artikel |
26 |
Performance and physics of sub-50nm strained Si on Si1−x Ge x -on-insulator (SGOI) nMOSFETs
|
Andrieu, F. |
|
2006 |
50 |
4 |
p. 566-572 7 p. |
artikel |
27 |
Pushing CMOS beyond the roadmap
|
Risch, L. |
|
2006 |
50 |
4 |
p. 527-535 9 p. |
artikel |
28 |
Quantum-mechanical analysis of the electrostatics in silicon-nanowire and carbon-nanotube FETs
|
Gnani, Elena |
|
2006 |
50 |
4 |
p. 709-715 7 p. |
artikel |
29 |
Quantum Short-channel Compact Modelling of Drain-Current in Double-Gate MOSFET
|
Munteanu, Daniela |
|
2006 |
50 |
4 |
p. 680-686 7 p. |
artikel |
30 |
Silicon forever! Really?
|
Stormer, Horst L. |
|
2006 |
50 |
4 |
p. 516-519 4 p. |
artikel |
31 |
Sub-25nm UTB SOI SRAM cell under the influence of discrete random dopants
|
Samsudin, K. |
|
2006 |
50 |
4 |
p. 660-667 8 p. |
artikel |
32 |
Wavelet-based adaptive mesh generation for device simulation
|
De Marchi, Luca |
|
2006 |
50 |
4 |
p. 650-659 10 p. |
artikel |