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                             41 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A generalizable TCAD framework for silicon FinFET spin qubit devices with electrical control Ding, Qian

200 C p.
artikel
2 Analysis of 1/f and G–R noise in Phosphorene FETs Pon, Adhithan

200 C p.
artikel
3 A novel ferroelectric nanopillar multi-level cell memory Lee, Hyeongu

200 C p.
artikel
4 A proposal of quantum computing algorithm to solve Poisson equation for nanoscale devices under Neumann boundary condition Matsuo, Shingo

200 C p.
artikel
5 Automatic grid refinement for thin material layer etching in process TCAD simulations Lenz, Christoph

200 C p.
artikel
6 Building robust machine learning force fields by composite Gaussian approximation potentials Milardovich, Diego

200 C p.
artikel
7 Compact modeling of photonic devices in Verilog-A for integrated circuit design de Foucauld, Emeric

200 C p.
artikel
8 Comparative analysis of NBTI modeling frameworks BAT and Comphy Ansari, Aseer Israr

200 C p.
artikel
9 Coupling a phase field model with an electro-thermal solver to simulate PCM intermediate resistance states for neuromorphic computing Cueto, O.

200 C p.
artikel
10 Deriving a novel methodology for nano-BioFETs and analysing the effect of high-k oxides on the amino-acids sensing application Dhar, Rakshita

200 C p.
artikel
11 Discontinuous Galerkin concept for Quantum-Liouville type equations Ganiu, Valmir

200 C p.
artikel
12 3D-TCAD benchmark of two-gate dual-doped Reconfigurable FETs on FDSOI28 technology Navarro, C.

200 C p.
artikel
13 Editorial Board
200 C p.
artikel
14 Effect of layer-specific synaptic retention characteristics on the accuracy of deep neural networks Yoo, Ho-Nam

200 C p.
artikel
15 Effects of oxygen gas in the sputtering process of the WO3 sensing layer on NO2 sensing characteristics of the FET-type gas sensor Jeong, Yujeong

200 C p.
artikel
16 Electrical instabilities in amorphous Si-Zn-sn-O thin film transistors under ultra-violet irradiation depending on oxygen content Murugan, Balaji

200 C p.
artikel
17 Ferroelectric FDSOI FET modeling for memory and logic applications Chatterjee, Swetaki

200 C p.
artikel
18 Hierarchical modeling for TCAD simulation of short-channel 2D material-based FETs Silvestri, Luca

200 C p.
artikel
19 H2S gas sensing properties in polysilicon control-gate FET-type gas sensor Park, Jinwoo

200 C p.
artikel
20 Hybrid 2D/3D mesh for efficient device simulation of locally deformed cylindrical semiconductor devices Jang, Geon-Tae

200 C p.
artikel
21 Impact of the channel doping on the low-frequency noise of gate-all-around silicon vertical nanowire pMOSFETs Simoen, Eddy

200 C p.
artikel
22 Investigation of effects of lateral boundary conditions on current filament movements in Trench-Gate IGBTs Suwa, Takeshi

200 C p.
artikel
23 Macroscopic analysis and design of Si HFGFET gas sensor for sensitive gas detection Hong, Seongbin

200 C p.
artikel
24 Microstructural impact on electromigration reliability of gold interconnects Ceric, H.

200 C p.
artikel
25 Modeling of SiC transistor with counter-doped channel Vyas, Pratik B.

200 C p.
artikel
26 Modeling thermal effects in STT-MRAM Hadámek, Tomáš

200 C p.
artikel
27 New insights into low frequency noise (LFN) sources analysis in GaN/Si MIS-HEMTs Kom Kammeugne, R.

200 C p.
artikel
28 28 nm FD-SOI MEOL parasitic capacitance segmentation using electrical testing and semiconductor process modeling Vianne, B.

200 C p.
artikel
29 Non-local transport effects in semiconductors under low-field conditions Ancona, M.G.

200 C p.
artikel
30 Novel experimental methodologies to reconcile large- and small-signal responses of Hafnium-based Ferroelectric Tunnel Junctions Massarotto, Marco

200 C p.
artikel
31 Performance enhancement for AlGaN/GaN HEMTs with dual discrete field-plate Zhou, Yunlu

200 C p.
artikel
32 Performance of vertical gate-all-around nanowire p-MOS transistors determined by boron depletion during oxidation Rossi, Chiara

200 C p.
artikel
33 Prediction of the evolution of defects induced by the heated implantation process: Contribution of kinetic Monte Carlo in a multi-scale modeling framework Julliard, P.L.

200 C p.
artikel
34 Sensitivity enhancement in OCD metrology by optimizing azimuth angle based on the RCWA simulation Choi, Hyunsuk

200 C p.
artikel
35 Strong quantization of current-carrying electron states in δ -layer systems Mamaluy, Denis

200 C p.
artikel
36 Synaptic array using multi-level AND flash memory cells for hardware-based neural networks Lee, Soochang

200 C p.
artikel
37 TCAD-based design and verification of the components of a 200 V GaN-IC platform Vudumula, Pavan

200 C p.
artikel
38 The core-shell junctionless MOSFET Cristoloveanu, Sorin

200 C p.
artikel
39 Theoretical study of carrier transport in supported and gated two-dimensional transition metal dichalcogenides Gopalan, Sanjay

200 C p.
artikel
40 Transcapacitances Modeling in ultra-thin gate-all-around junctionless nanowire FETs, including 2D quantum confinement Alshebly, Wisam

200 C p.
artikel
41 Trap and self-heating effect based reliability analysis to reveal early aging effect in nanosheet FET Rathore, Sunil

200 C p.
artikel
                             41 gevonden resultaten
 
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