nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Absorption coefficients of GeSn extracted from PIN photodetector response
|
Ye, Kaiheng |
|
2015 |
110 |
C |
p. 71-75 5 p. |
artikel |
2 |
Arsenic atomic layer doping in Si using AsH3
|
Yamamoto, Yuji |
|
2015 |
110 |
C |
p. 29-34 6 p. |
artikel |
3 |
Compositional dependence of optical interband transition energies in GeSn and GeSiSn alloys
|
Xu, Chi |
|
2015 |
110 |
C |
p. 76-82 7 p. |
artikel |
4 |
Editorial Board
|
|
|
2015 |
110 |
C |
p. IFC- 1 p. |
artikel |
5 |
Effect of Sn on crystallinity and electronic property of low temperature grown polycrystalline-Si1− x − y Ge x Sn y layers on SiO2
|
Yamaha, Takashi |
|
2015 |
110 |
C |
p. 54-58 5 p. |
artikel |
6 |
Electrical characterization of p-GeSn/n-Ge diodes with interface traps under dc and ac regimes
|
Baert, B. |
|
2015 |
110 |
C |
p. 65-70 6 p. |
artikel |
7 |
Enhanced light emission from Ge by GeO2 micro hemispheres
|
Chen, Yen-Yu |
|
2015 |
110 |
C |
p. 83-85 3 p. |
artikel |
8 |
Epitaxial formation of Ni germanide on Ge(001) substrate by reactive deposition
|
Deng, Yunsheng |
|
2015 |
110 |
C |
p. 44-48 5 p. |
artikel |
9 |
Epitaxial growth and crystalline properties of Ge1− x − y Si x Sn y on Ge(001) substrates
|
Asano, Takanori |
|
2015 |
110 |
C |
p. 49-53 5 p. |
artikel |
10 |
Facet engineering for SiGe/Si stressors in advanced CMOS technology
|
Kasim, Johnson |
|
2015 |
110 |
C |
p. 19-22 4 p. |
artikel |
11 |
Low-temperature reduction of Ge oxide by Si and SiH4 in low-pressure H2 and Ar environment
|
Minami, Kaichiro |
|
2015 |
110 |
C |
p. 40-43 4 p. |
artikel |
12 |
Novel Si–Ge–C superlattices and their applications
|
Augusto, Carlos J.R.P. |
|
2015 |
110 |
C |
p. 1-9 9 p. |
artikel |
13 |
Optimization of ISBD embedded SiGe layers to prevent delamination process for MOSFET applications
|
Wasyluk, Joanna |
|
2015 |
110 |
C |
p. 23-28 6 p. |
artikel |
14 |
Revealing high room and low temperatures mobilities of 2D holes in a strained Ge quantum well heterostructures grown on a standard Si(001) substrate
|
Myronov, Maksym |
|
2015 |
110 |
C |
p. 35-39 5 p. |
artikel |
15 |
SiGe channel deposition by batch epitaxy
|
Reichel, Carsten |
|
2015 |
110 |
C |
p. 14-18 5 p. |
artikel |
16 |
Threshold voltage and transconductance shifting reliance on strained-SiGe channel dimension
|
Chang, Wen-Teng |
|
2015 |
110 |
C |
p. 10-13 4 p. |
artikel |
17 |
Vertical Ge and GeSn heterojunction gate-all-around tunneling field effect transistors
|
Schulze, Jörg |
|
2015 |
110 |
C |
p. 59-64 6 p. |
artikel |