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Details for article 13 of 38 found articles
| Title: |
Failure Analysis of FeCAPs. Electrical Behaviour Under Synchrotron X-Ray Irradiation |
| Author: |
Menou, N. Castagnos, A. -M. Muller, Ch. Johnson, J. Wouters, D. J. Baturin, I. Shur, V. Ya. |
| Appeared in: |
Integrated ferroelectrics |
| Paging: | Volume 61 (2004) nr. 1 pages 89-95 |
| Year: |
2004 |
| Contents: |
This paper presents a preliminary study of the degradation and restoration of ferroelectric properties under X-ray irradiation of Pt/SBT/Pt ferroelectric capacitors (FeCAP) and the degradation in Pt/PZT/Pt FeCAPs. The results seem to point out that aging of irradiated capacitors originates from the pinning of domain walls due to trapping of photo-generated carriers at domain boundaries. For SBT FeCAPs, the recovery of a significant switchable polarisation after electrical cycling under X-ray irradiation indicates that the domain walls are probably weakly pinned. In PZT FeCAPs, the fatigue behaviour during X-ray exposure can be explained as a result of X-ray induced acceleration of the bulk screening process due to increasing of the concentration of bulk carriers, which leads to both static and kinetic imprint effects. |
| Publisher: |
Taylor & Francis |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 13 of 38 found articles
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