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Strain depth profiles in thin films extracted from in-plane X-ray diffraction |
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Titel: |
Strain depth profiles in thin films extracted from in-plane X-ray diffraction |
Auteur: |
Cancellieri, Claudia Ariosa, Daniel Druzhinin, Aleksandr V. Unutulmazsoy, Yeliz Neels, Antonia Jeurgens, Lars P.H. |
Verschenen in: |
Journal of applied crystallography |
Paginering: |
Jaargang 54 () nr. 1 pagina's 87-98 |
Jaar: |
2021-02-01 |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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