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Details for article 37 of 41 found articles
| Title: |
Strain depth profiles in thin films extracted from in-plane X-ray diffraction |
| Author: |
Cancellieri, Claudia Ariosa, Daniel Druzhinin, Aleksandr V. Unutulmazsoy, Yeliz Neels, Antonia Jeurgens, Lars P.H. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 54 () nr. 1 pages 87-98 |
| Year: |
2021-02-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 37 of 41 found articles
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