|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 6 of 15 found articles
| Title: |
Electromigration-Induced Plasticity: Texture Correlation and Implications for Reliability Assessment |
| Author: |
Budiman, A.S. Besser, P.R. Hau-Riege, C.S. Marathe, A. Joo, Y.-C. Tamura, N. Patel, J.R. Nix, W.D. |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 38 (2008) nr. 3 pages 379-391 |
| Year: |
2008 |
| Contents: | |
| Publisher: |
Springer US, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 15 found articles
| << previous | next >> |