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Analysis of r.f.-sputtered TiB2 hard coatings by means of X-ray diffractometry and Auger electron spectroscopy |
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Titel: |
Analysis of r.f.-sputtered TiB2 hard coatings by means of X-ray diffractometry and Auger electron spectroscopy |
Auteur: |
Lohmann, R. Österschulze, E. Thoma, K. Gärtner, H. Herr, W. Matthes, B. Broszeit, E. Kloos, K.-H. |
Verschenen in: |
Materials science and engineering. A, Structural materials: properties, microstructure and processing |
Paginering: |
Jaargang 139 (1991) nr. C pagina's 5 p. |
Jaar: |
1991 |
Inhoud: |
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Uitgever: |
Published by Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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