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Analysis of r.f.-sputtered TiB2 hard coatings by means of X-ray diffractometry and Auger electron spectroscopy |
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Title: |
Analysis of r.f.-sputtered TiB2 hard coatings by means of X-ray diffractometry and Auger electron spectroscopy |
Author: |
Lohmann, R. Österschulze, E. Thoma, K. Gärtner, H. Herr, W. Matthes, B. Broszeit, E. Kloos, K.-H. |
Appeared in: |
Materials science and engineering. A, Structural materials: properties, microstructure and processing |
Paging: |
Volume 139 (1991) nr. C pages 5 p. |
Year: |
1991 |
Contents: |
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Publisher: |
Published by Elsevier B.V. |
Source file: |
Elektronische Wetenschappelijke Tijdschriften |
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