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Journal description
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Details for article 69 of 74 found articles
| Title: |
Technology and characterization of MIS structures with co-doped silicon nanocrystals (Si-NCs) embedded in hafnium oxide (HfOx) ultra-thin layers |
| Author: |
Mazurak, A. Mroczyński, R. Jasiński, J. Tanous, D. Majkusiak, B. Kano, S. Sugimoto, H. Fujii, M. Valenta, J. |
| Appeared in: |
Microelectronic engineering |
| Paging: | Volume 178 (2017) nr. C pages 298-303 |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 69 of 74 found articles
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