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Journal description
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Details for article 8 of 12 found articles
| Title: |
Numerical study on the self-heating effects for vacuum/high-k gate dielectric tri-gate FinFETs |
| Author: |
Zhang, Guohe Lai, Junhua Zhu, Shengli Wei, Sufen Liang, Feng Yang, Cheng-Fu |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 95 (2019) nr. C pages 52-57 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 12 found articles
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