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Journal description
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Details for article 9 of 12 found articles
| Title: |
Phase formation and microstructure evolution in Cu/In/Cu joints |
| Author: |
Chiu, Y.S. Yu, H.Y. Hung, H.T. Wang, Y.W. Kao, C.R. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 95 (2019) nr. C pages 18-27 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 12 found articles
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