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Journal description
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Details for article 10 of 12 found articles
| Title: |
Reliability and lifetime estimations of GaN-on-GaN vertical pn diodes |
| Author: |
Rackauskas, B. Uren, M.J. Kachi, T. Kuball, M. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 95 (2019) nr. C pages 48-51 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
The Authors |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 12 found articles
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