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Journal description
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Details for article 46 of 55 found articles
| Title: |
Single Event Upset rate determination for 65nm SRAM bit-cell in LEO radiation environments |
| Author: |
Sajid, Muhammad Chechenin, N.G. Torres, Frank Sill Gulzari, Usman Ali Butt, Muhammad Usman Ming, Zhu Khan, E.U. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 78 (2017) nr. C pages 6 p. |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 46 of 55 found articles
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