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Journal description
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Details for article 10 of 22 found articles
| Title: |
Experimental and modeling studies of automotive-qualified OLEDs under electrical stress |
| Author: |
Güney, Arda Yelten, Mustafa Berke Ferhanoğlu, Onur Kahraman, Nihan |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 111 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 22 found articles
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