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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 21 of 24 found articles
| Title: |
Research of single-event burnout and hardened GaN MISFET with embedded PN junction |
| Author: |
Fei, Xin-Xing Wang, Ying Luo, Xin Bao, Meng-Tian Yu, Cheng-Hao Li, Xing-Ji |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 110 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 21 of 24 found articles
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