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Journal description
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Details for article 22 of 24 found articles
| Title: |
Single Event Upsets characterization of 65 nm CMOS 6T and 8T SRAM cells for ground level environment |
| Author: |
Malagón, Daniel Torrens, Gabriel Segura, Jaume Bota, Sebastià A. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 110 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 22 of 24 found articles
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