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Journal description
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Details for article 20 of 35 found articles
| Title: |
Impact of drain bias stress on forward/reverse mode operation of amorphous ZIO TFTs |
| Author: |
Dey, Aritra Allee, David R. Clark, Lawrence T. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 62 (2011) nr. 1 pages 6 p. |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 20 of 35 found articles
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