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The effect of nitrous oxide plasma treatment on the bias temperature stress of metal oxide thin film transistors with high mobility |
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Titel: |
The effect of nitrous oxide plasma treatment on the bias temperature stress of metal oxide thin film transistors with high mobility |
Auteur: |
Tseng, Wei-Hao Fang, Shao-Wei Lu, Chia-Yang Chuang, Hung-Yang Chang, Fan-Wei Lin, Guan-Yu Chen, Tsu-Wei Ma, Kang-Hung Chen, Hong-Syu Chen, Teng-Ke Chen, Yu-Hung Lee, Jen-Yu Shih, Tsung-Hsiang Ting, Hung-Che Chen, Chia-Yu Lin, Yu-Hsin Hong, Hong-Jye |
Verschenen in: |
Solid-state electronics |
Paginering: |
Jaargang 103 (2015) nr. C pagina's 5 p. |
Jaar: |
2015 |
Inhoud: |
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Uitgever: |
Elsevier Ltd |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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