nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Adaptive equalizer with a controller of a minimally admissible differential voltage of the output signal and pseudodifferential cascode output buffer for the 10-Gb/s transmitter according to the 65-nm CMOS technology
|
Larionov, A. V. |
|
2015 |
|
6 |
p. 414-420 |
artikel |
2 |
A functionally integrated injection laser-modulator with the radiation frequency modulation
|
Ryndin, E. A. |
|
2013 |
|
6 |
p. 360-362 |
artikel |
3 |
A Helicon Plasma Source
|
O. V. Braginskii |
|
2000 |
|
6 |
p. 380-390 11 p. |
artikel |
4 |
A Helicon Plasma Source
|
Braginskii, O. V. |
|
2000 |
|
6 |
p. 380-390 |
artikel |
5 |
Amorphization of Vanadium Oxides during the Reversible Insertion of Lithium
|
Skundin, A. M. |
|
|
|
6 |
p. 416-422 |
artikel |
6 |
Analyzing conductance-frequency curves of metal-insulator-semiconductor structures subject to surface-potential fluctuations and electrically active states inside the insulator
|
Avdeev, N. A. |
|
2007 |
|
6 |
p. 402-408 |
artikel |
7 |
Anodic-Oxidation Growth of Microscopic Pillar Arrays: Kinetic Aspects
|
A. I. Vorob'eva |
|
2001 |
|
6 |
p. 381-393 13 p. |
artikel |
8 |
Anodic-Oxidation Growth of Microscopic Pillar Arrays: Kinetic Aspects
|
Vorob'eva, A. I. |
|
2001 |
|
6 |
p. 381-393 |
artikel |
9 |
Anomalous Kossel effect in semiconductor structures
|
Medvedev, P. G. |
|
2006 |
|
6 |
p. 359-371 |
artikel |
10 |
Anomalous photoconductivity decay observed in microwave measurements of carrier lifetime in silicon ingots
|
Borodovskii, P. A. |
|
2006 |
|
6 |
p. 345-349 |
artikel |
11 |
Application of Graphene in The Cooling System of a Personal Electronic Computer
|
Zuev, S. M. |
|
|
|
6 |
p. 404-411 |
artikel |
12 |
Artificial Intelligence Will Never Completely Replace Humans
|
Abramov, I. I. |
|
|
|
6 |
p. 376-386 |
artikel |
13 |
A semianalytical model of a thin-channel field-effect transistor
|
Khomyakov, A. N. |
|
2009 |
|
6 |
p. 393-405 |
artikel |
14 |
Atomic mechanisms of strain relaxation in heteroepitaxial Cu/Ni(001) system
|
Trushin, O. S. |
|
2015 |
|
6 |
p. 410-413 |
artikel |
15 |
A virtual scanning electron microscope. 4. Simulator-based implementation
|
Novikov, Yu. A. |
|
2014 |
|
6 |
p. 427-437 |
artikel |
16 |
Axially symmetric composite electromagnetic mirror for perfect axial-aberration correction
|
Shukov, V. A. |
|
2006 |
|
6 |
p. 372-381 |
artikel |
17 |
Basic memory elements using DICE cells for fault-tolerant 28 nm CMOS RAM
|
Stenin, V. Ya. |
|
2015 |
|
6 |
p. 368-379 |
artikel |
18 |
Calculation of the Schottky barrier height at the contact between a metal and (SiC)1–x(AlN)x semiconductor solid solution
|
Safaraliev, G. K. |
|
2015 |
|
6 |
p. 404-409 |
artikel |
19 |
Chaotic Negative-Resistance Oscillators with a Multibranch Piecewise-Linear CurrentVoltage Characteristic
|
V. G. Prokopenko |
|
2004 |
|
6 |
p. 381-389 9 p. |
artikel |
20 |
Chaotic Negative-Resistance Oscillators with a Multibranch Piecewise-Linear Current—Voltage Characteristic
|
Prokopenko, V. G. |
|
2004 |
|
6 |
p. 381-389 |
artikel |
21 |
Characterization of the structure and optical properties of micron porous layers on antimony-doped silicon substrates
|
Lomov, A. A. |
|
2012 |
|
6 |
p. 336-346 |
artikel |
22 |
CMOS Majority Element Based on NAND Logic with Reduced Sensitivity to Single Ionizing Particles
|
Stenin, V. Ya. |
|
|
|
6 |
p. 394-403 |
artikel |
23 |
CMOS Switched-Capacitor Integrator
|
Yu. B. Rogatkin |
|
2003 |
|
6 |
p. 333-338 6 p. |
artikel |
24 |
CMOS Switched-Capacitor Integrator
|
Rogatkin, Yu. B. |
|
2003 |
|
6 |
p. 333-338 |
artikel |
25 |
Computer Analysis of Resistive Switching in a Bismuth Selenide Microcrystal-Based Structure
|
Sirotkin, V. V. |
|
|
|
6 |
p. 445-453 |
artikel |
26 |
Concentration Dependences of Charge Transfer and the Kinetics of Monte Carlo Modeling of the Growth of 2D Mono- and Nanocrystals of Gallium Chalcogenides
|
Asadov, S. M. |
|
|
|
6 |
p. 452-462 |
artikel |
27 |
Constructivist treatment of Bell’s inequality violations and the no-hidden-variable theorems
|
Ozhigov, Y. I. |
|
2009 |
|
6 |
p. 409-417 |
artikel |
28 |
Contact Transport and Field Emission Properties of Low-Dimensional 2D Carbon Heterostructures
|
Yafarov, R. K. |
|
|
|
6 |
p. 439-444 |
artikel |
29 |
Controlling the Si(001) Surface Morphology upon Thermal Annealing in a Vacuum Chamber
|
Rodyakina, E. E. |
|
2018 |
|
6 |
p. 365-370 |
artikel |
30 |
Control of the formation of ultrathin CoSi2 layers during the rapid thermal annealing of Ti/Co/Ti/Si(100) structures
|
Rudakov, V. I. |
|
2011 |
|
6 |
p. 389-394 |
artikel |
31 |
Creation of lithographic masks using a scanning probe microscope
|
Bizyaev, D. A. |
|
2015 |
|
6 |
p. 389-398 |
artikel |
32 |
Critical Velocities of Domain Walls in Magnetic Thin Films with Planar Anisotropy
|
B. N. Filippov |
|
2001 |
|
6 |
p. 406-410 5 p. |
artikel |
33 |
Critical Velocities of Domain Walls in Magnetic Thin Films with Planar Anisotropy
|
Filippov, B. N. |
|
2001 |
|
6 |
p. 406-410 |
artikel |
34 |
CVC Simulation of Ultrathin Soi-Cmos Nanotransistors with a Fully Enclosed Gate
|
Masalsky, N. V. |
|
|
|
6 |
p. 387-393 |
artikel |
35 |
DC/DC Buck-Boost Converter with Single Inductance
|
Babenko, V. P. |
|
|
|
6 |
p. 471-480 |
artikel |
36 |
Delta-Doping of Monocrystalline Semiconductors by Al and Sb Implantation Using FIB Resistless Lithography
|
V. A. Zhukov |
|
2004 |
|
6 |
p. 362-372 11 p. |
artikel |
37 |
Delta-Doping of Monocrystalline Semiconductors by Al and Sb Implantation Using FIB Resistless Lithography
|
Zhukov, V. A. |
|
2004 |
|
6 |
p. 362-372 |
artikel |
38 |
Density of states at a gamma-irradiated Si/SiO2 interface: The effect of ultrasonic treatment
|
Parchinskii, P. B. |
|
2005 |
|
6 |
p. 356-358 |
artikel |
39 |
Design and Evaluation of Low Power CMOS Based Schmitt Trigger Circuits
|
Nagella Maniteja, |
|
|
|
6 |
p. 556-564 |
artikel |
40 |
Designing FPGAs and Reconfigurable SoCs Using Methods of Program Analysis and Prototyping
|
Enns, V. I. |
|
|
|
6 |
p. 426-438 |
artikel |
41 |
Design of Cu-MWCNT Based Heterogeneous Coaxial through Silicon Vias for High-Speed VLSI Applications
|
Rajkumar, Katepogu |
|
|
|
6 |
p. 512-520 |
artikel |
42 |
Design of Integrated Voltage Multipliers Using Standard CMOS Technologies
|
Sinyukin, A. S. |
|
|
|
6 |
p. 527-534 |
artikel |
43 |
Design-processing features of microwave GaAs monolithic integrated circuits of a low-noise amplifier with a copper metallized frontside
|
Ishutkin, S. V. |
|
2015 |
|
6 |
p. 380-388 |
artikel |
44 |
Determination of the size of vacancy-type defects in angstrom ranges by positron annihilation spectroscopy
|
Grafutin, V. I. |
|
2011 |
|
6 |
p. 428-435 |
artikel |
45 |
Development of a Method for Constructing a Nonlinear Model of a Metamorphic 0.15-μm МHEMT InAlAs/InGaAs Transistor
|
Lokotko, V. V. |
|
|
|
6 |
p. 404-412 |
artikel |
46 |
Development of crystal matrix of tensoresistive pressure tactile transducers for robotics
|
Gusev, D. V. |
|
2015 |
|
6 |
p. 421-424 |
artikel |
47 |
Development of the Technology of Magnetron Sputtering Deposition of LiPON Films and Investigation of Their Characteristics
|
Vasilev, S. V. |
|
2017 |
|
6 |
p. 424-432 |
artikel |
48 |
Device and process simulation of SOS and SOI MOSFETs
|
Kroupkina, T. Yu. |
|
2005 |
|
6 |
p. 386-396 |
artikel |
49 |
1D GaAs Detector Arrays for Digital X-ray Imaging
|
V. F. Dvoryankin |
|
2004 |
|
6 |
p. 373-376 4 p. |
artikel |
50 |
1D GaAs Detector Arrays for Digital X-ray Imaging
|
Dvoryankin, V. F. |
|
2004 |
|
6 |
p. 373-376 |
artikel |
51 |
Dielectric Barrier in the Subtractive Process of Formation of a Copper Metallization System
|
Orlov, A. A. |
|
|
|
6 |
p. 470-479 |
artikel |
52 |
Digital-Reflectometry Characterization of the Surface Structure and Protective Property of Thin Films
|
V. A. Kotenev |
|
2002 |
|
6 |
p. 396-406 11 p. |
artikel |
53 |
Digital-Reflectometry Characterization of the Surface Structure and Protective Property of Thin Films
|
Kotenev, V. A. |
|
2002 |
|
6 |
p. 396-406 |
artikel |
54 |
Dual-Collector Lateral Bipolar Magnetotransistor: Carrier Transport and Relative Sensitivity
|
A. V. Kozlov |
|
2003 |
|
6 |
p. 385-390 6 p. |
artikel |
55 |
Dual-Collector Lateral Bipolar Magnetotransistor: Carrier Transport and Relative Sensitivity
|
Kozlov, A. V. |
|
2003 |
|
6 |
p. 385-390 |
artikel |
56 |
Dynamics of Stress in Films of Metals on Silicon During Vacuum Heat Treatment
|
Dzhuplin, V. N. |
|
|
|
6 |
p. 412-419 |
artikel |
57 |
Effect of a transverse applied electric field on electron drift velocity in a GaAs quantum wire: A Monte Carlo simulation
|
Borzdov, A. V. |
|
2010 |
|
6 |
p. 411-417 |
artikel |
58 |
Effect of Ion-Plasma Treatment on the Phase Composition and Electrical Resistivity of Nanometer-Thick Tungsten Films
|
Selyukov, R. V. |
|
|
|
6 |
p. 488-496 |
artikel |
59 |
Effect of Lattice Defects on the Electromigration-Induced Instability of the Interface between Joined Conductive Materials
|
Makhviladze, T. M. |
|
|
|
6 |
p. 426-434 |
artikel |
60 |
Effect of Point Defects on the Electromigration Rate at the Interface of Joined Materials
|
Makhviladze, T. M. |
|
|
|
6 |
p. 423-430 |
artikel |
61 |
Effect of polymer matrix and photoacid generator on the lithographic properties of chemically amplified photoresist
|
Bulgakova, S. A. |
|
2014 |
|
6 |
p. 392-400 |
artikel |
62 |
Effect of the Measuring Signal Parameters on the Error in Capacitance Measurements of a p-n Transition and Determining Its Resistance to Radiation
|
Zabavichev, I. Yu. |
|
2017 |
|
6 |
p. 433-441 |
artikel |
63 |
Elastically Strained Porous Silicon Layers Formed on Single-Crystal Substrates
|
V. D. Skupov |
|
2003 |
|
6 |
p. 382-384 3 p. |
artikel |
64 |
Elastically Strained Porous Silicon Layers Formed on Single-Crystal Substrates
|
Skupov, V. D. |
|
2003 |
|
6 |
p. 382-384 |
artikel |
65 |
Elastic-stress relaxation in heteroepitaxial structures investigated by computer simulation
|
Trushin, O. S. |
|
2008 |
|
6 |
p. 363-372 |
artikel |
66 |
Electrical parameters and the plasma composition in HCl-H2 mixtures
|
Efremov, A. M. |
|
2011 |
|
6 |
p. 371-378 |
artikel |
67 |
Electrical properties of a TiN/TixAl1 – xOy/TiN memristor device manufactured by magnetron sputtering
|
Bobylev, A. N. |
|
2016 |
|
6 |
p. 396-401 |
artikel |
68 |
Electroactive Centers at the Outer Interface of an Ultrathin Oxide Layer and Their Effect on the Electrical Performance of Single-Crystal Silicon/Noncrystalline Oxide/Polysilicon Structures
|
V. Ya. Uritskii |
|
2000 |
|
6 |
p. 417-422 6 p. |
artikel |
69 |
Electroactive Centers at the Outer Interface of an Ultrathin Oxide Layer and Their Effect on the Electrical Performance of Single-Crystal Silicon/Noncrystalline Oxide/Polysilicon Structures
|
Uritskii, V. Ya. |
|
2000 |
|
6 |
p. 417-422 |
artikel |
70 |
Electroluminescence in p-GaP/por-GaP/SnO2 Structures in the Red Region of the Spectrum
|
Dikhanbaev, K. K. |
|
|
|
6 |
p. 465-469 |
artikel |
71 |
Electromagnetic Modeling, Technology, and Production of Microwave C3MOSHFET Switches on AlGaN/GaN Heterostructures
|
Adonin, A. S. |
|
2017 |
|
6 |
p. 390-395 |
artikel |
72 |
Electron Detection Circuit Based on a Tunnel Structure of Four Quantum Dots with Asymmetric Parameters
|
Tsukanov, A. V. |
|
|
|
6 |
p. 387-397 |
artikel |
73 |
Electronic Structure of Molecular Switches on Splitters Based on trans-Polyacetylene
|
Gorbatsevich, A. A. |
|
2017 |
|
6 |
p. 414-423 |
artikel |
74 |
Electrophysical Characteristics and Emission Spectra of Carbon Tetrafluoride Plasma
|
Murin, D. B. |
|
|
|
6 |
p. 368-375 |
artikel |
75 |
Electrophysical Parameters of PIN Photodiodes Irradiated with 60Co γ-Quanta
|
Kovalchuk, N. S. |
|
|
|
6 |
p. 504-509 |
artikel |
76 |
Electrophysical properties of lead zirconate titanate films doped with lanthanum
|
Podgornyi, Yu. V. |
|
2014 |
|
6 |
p. 438-444 |
artikel |
77 |
Equivalent electrical network of the DNA molecule
|
Grib, N. V. |
|
2006 |
|
6 |
p. 398-404 |
artikel |
78 |
Erratum to: Design of a Nonlinear Model of a Pseudomorphic 0.15 µm рHEMT AlGaAs/InGaAs/GaAs Transistor
|
Tsunvaza, D. |
|
|
|
6 |
p. 566 |
artikel |
79 |
Erratum to: Simulation of a System of Nanoantennas Located in a TSV Channel as a System for Receiving and Transmitting Data
|
Serov, D. A. |
|
|
|
6 |
p. 565 |
artikel |
80 |
ESR spectra of the triplet and singlet states of a Zn-P two-spin system in Si: Mathematical modeling and computer simulation
|
Dobryakov, S. N. |
|
2005 |
|
6 |
p. 373-382 |
artikel |
81 |
Etching of GaAs in the Plasma of a Freon R-12–Argon (CCl2F2/Ar) Mixture
|
Murin, D. B. |
|
2019 |
|
6 |
p. 434-442 |
artikel |
82 |
Etching of SiC in Low Power Inductively-Coupled Plasma
|
Osipov, A. A. |
|
2019 |
|
6 |
p. 427-433 |
artikel |
83 |
Evaluating the reading sensitivity of a new thermomechanical data-storage technique
|
Petrin, A. B. |
|
2005 |
|
6 |
p. 365-372 |
artikel |
84 |
Evaluation of Si-Wafer Chemical Cleaning Procedures in Terms of Their Effect on Wafer Topography
|
S. P. Timoshenkov |
|
2003 |
|
6 |
p. 371-376 6 p. |
artikel |
85 |
Evaluation of Si-Wafer Chemical Cleaning Procedures in Terms of Their Effect on Wafer Topography
|
Timoshenkov, S. P. |
|
2003 |
|
6 |
p. 371-376 |
artikel |
86 |
Experimental diamond photonics: Current state and prospects. Part II
|
Tsukanov, A. V. |
|
2016 |
|
6 |
p. 367-382 |
artikel |
87 |
Fault Tolerant Reversible T Latch with Enhanced Testability at Nano-Scale for Application of Ripple Counters
|
Singh, Pankaj |
|
|
|
6 |
p. 439-451 |
artikel |
88 |
Formation and some properties of chromium oxide nanolayers on semiconductors
|
Ezhovskii, Yu. K. |
|
2008 |
|
6 |
p. 356-362 |
artikel |
89 |
Formation of thin-film HfO2/Si(100) structures by high-frequency magnetron sputtering
|
Rudakov, V. I. |
|
2011 |
|
6 |
p. 383-388 |
artikel |
90 |
Fractal Analysis of Anisotropic Surfaces
|
P. A. Arutyunov |
|
2001 |
|
6 |
p. 411-413 3 p. |
artikel |
91 |
Fractal Analysis of Anisotropic Surfaces
|
Arutyunov, P. A. |
|
2001 |
|
6 |
p. 411-413 |
artikel |
92 |
Fully depleted SOI CMOS logic gates for low-voltage applications
|
Masal’skii, N. V. |
|
2008 |
|
6 |
p. 410-417 |
artikel |
93 |
Geometric aspects of AFM imaging
|
Novikov, Yu. A. |
|
2008 |
|
6 |
p. 390-409 |
artikel |
94 |
Happy 85th Anniversary!
|
|
|
2009 |
|
6 |
p. 363 |
artikel |
95 |
Helicon Plasma Source
|
O. V. Braginskii |
|
2002 |
|
6 |
p. 341-345 5 p. |
artikel |
96 |
Helicon Plasma Source
|
Braginskii, O. V. |
|
2002 |
|
6 |
p. 341-345 |
artikel |
97 |
High-frequency admittance of a thin circular metal wire
|
Zavitaev, E. V. |
|
2008 |
|
6 |
p. 373-381 |
artikel |
98 |
Highly doped Si/SiO2/W sandwich structures with an exposed insulator edge: Electrical transport and electroforming
|
Mordvintsev, V. M. |
|
2007 |
|
6 |
p. 371-383 |
artikel |
99 |
High-Rate Deposition of Amorphous Silicon
|
B. G. Budagyan |
|
2000 |
|
6 |
p. 391-396 6 p. |
artikel |
100 |
High-Rate Deposition of Amorphous Silicon
|
Budagyan, B. G. |
|
2000 |
|
6 |
p. 391-396 |
artikel |
101 |
Identification of Trapping Effects and Ion Neutralization at the Insulator/Semiconductor Interface of MIS Structures from Dynamic CurrentVoltage Characteristics of Ion Depolarization
|
E. I. Gol'dman |
|
2000 |
|
6 |
p. 406-412 7 p. |
artikel |
102 |
Identification of Trapping Effects and Ion Neutralization at the Insulator/Semiconductor Interface of MIS Structures from Dynamic Current–Voltage Characteristics of Ion Depolarization
|
Gol'dman, E. I. |
|
2000 |
|
6 |
p. 406-412 |
artikel |
103 |
Implementation of an LNA Using a Microstrip Coupler as a DC-Block for Sub-6 5G Communication Systems
|
Mohamed Boumalkha, |
|
|
|
6 |
p. 547-555 |
artikel |
104 |
Influence of external conditions on physical processes and plasma parameters in a model of a high-frequency hybrid plasma system
|
Aleksandrov, A. F. |
|
2016 |
|
6 |
p. 433-441 |
artikel |
105 |
Initial stage of semiinsulating polycrystalline silicon film growth
|
Turtsevich, A. S. |
|
2008 |
|
6 |
p. 349-355 |
artikel |
106 |
Injection Diffusion-Drift Pulse Former
|
Gaev, D. S. |
|
|
|
6 |
p. 411-415 |
artikel |
107 |
In Memoriam: Academician Kamil A. Valiev January 15, 1931–July 28, 2010
|
|
|
2010 |
|
6 |
p. 377 |
artikel |
108 |
In situDiagnostics of Plasma Processes in Microelectronics: The Current Status and Immediate Prospects, Part IV
|
A. A. Orlikovskii |
|
2001 |
|
6 |
p. 343-370 28 p. |
artikel |
109 |
In situDiagnostics of Plasma Processes in Microelectronics: The Current Status and Immediate Prospects, Part IV
|
Orlikovskii, A. A. |
|
2001 |
|
6 |
p. 343-370 |
artikel |
110 |
Institute for design problems in microelectronics, Russian Academy of Sciences (IPPM RAS), Moscow, Russia
|
|
|
2011 |
|
6 |
p. 369-370 |
artikel |
111 |
Integrated Laser Measuring System for the Ellipsometric and Photovoltage Characterization of Thin Surface Layers
|
V. A. Kotenev |
|
2003 |
|
6 |
p. 355-360 6 p. |
artikel |
112 |
Integrated Laser Measuring System for the Ellipsometric and Photovoltage Characterization of Thin Surface Layers
|
Kotenev, V. A. |
|
2003 |
|
6 |
p. 355-360 |
artikel |
113 |
Integration of functional elements of resistive nonvolative memory with 1T-1R topology
|
Negrov, D. V. |
|
2016 |
|
6 |
p. 383-395 |
artikel |
114 |
Investigation into the selectivity of etching various materials by fast neutral particle beams
|
Maishev, Yu. P. |
|
2014 |
|
6 |
p. 388-391 |
artikel |
115 |
Investigation of Alloyed Ohmic Contacts in Epitaxial Tellurium-Doped Gallium Arsenide Layers
|
Egorkin, V. I. |
|
2018 |
|
6 |
p. 388-392 |
artikel |
116 |
Investigation of the BF3 plasma particle’s lateral distribution using two-view emission tomography
|
Fadeev, A. V. |
|
2014 |
|
6 |
p. 407-412 |
artikel |
117 |
Ion-Bombardment-Induced Decomposition of Nonequilibrium Solid Solution and the Formation of Periodic Structures
|
S. A. Krivelevich |
|
2000 |
|
6 |
p. 376-379 4 p. |
artikel |
118 |
Ion-Bombardment-Induced Decomposition of Nonequilibrium Solid Solution and the Formation of Periodic Structures
|
Krivelevich, S. A. |
|
2000 |
|
6 |
p. 376-379 |
artikel |
119 |
IR photodetectors in the range of λ = 1.5–8 μm, based on silicon with multicharged nanoclusters of manganese atoms
|
Bakhadyrkhanov, M. K. |
|
2012 |
|
6 |
p. 354-356 |
artikel |
120 |
Kinetics and mechanisms of Cl2 or HCl plasma etching of copper
|
Efremov, A. M. |
|
2007 |
|
6 |
p. 358-365 |
artikel |
121 |
Kinetics and Mechanisms of Reactive-Ion Etching of Si and SiO2 in a Plasma of a Mixture of HBr + O2
|
Efremov, A. M. |
|
|
|
6 |
p. 379-384 |
artikel |
122 |
Kinetics and modes of plasmachemical etching of GaAs under conditions of induction HF discharge in CF2Cl2
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Laser Plasma-Chemical Etching of Polycrystalline Diamond and Single-Crystal Sapphire
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Laser simulation of ionizing-radiation effects on silicon ICs: The temperature and doping-level dependence of simulation parameters
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Liquid-crystal thermography of hot spots on electronic components
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Logic synthesis from VHDL descriptions using LeonardoSpectrum: Theoretical basis
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Low-power CMOS switched-capacitor lowpass filter using current conveyors
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Low-temperature pulsed vapor-phase deposition of thin layers of metal ruthenium for micro- and nanoelectronics. Part 5. Interrelation of growth regularities, structure, and properties of ruthenium layers
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Magneto-Optical Properties of Multilayer Structures Based on Cobalt and Chromium-Group Metals for Magnetic Memory Elements
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Mathematical simulation of the influence of a focusing channel surface on the angle characteristics of a bundle of rapid neutral particles
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Degtyarev, A. V. |
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Measurements of linear dimensions of silicon nanorelief elements with a near-rectangular profile by defocusing the electron probe of a scanning electron microscope
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Mechanical Control of the Spectrum of a Chain of Resonators and the Organization of Remote Interaction Between Quantum Dots
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Mechanisms of Plasma Etching of Titanium, Indium, Tin, and Zinc Oxides in a Mixture of HBr + Ar
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MEMS Switch Based on a Cantilever with Increased Contact Force
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Method for the Iterative Refinement of Parameter Values in Analytical Models of Microelectronic Devices Based on Integrated MOS Transistors
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Methods of Multiplex Spectroscopy in the Characterization of Nanoscale Multilayers
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Methods of Multiplex Spectroscopy in the Characterization of Nanoscale Multilayers
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Microelectromechanical System for Controlling Flow Past an Airfoil: Pressure Transducers
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A. A. Taskin |
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Microelectromechanical System for Controlling Flow Past an Airfoil: Pressure Transducers
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Microwave Characteristics of Amplifiers on Nanoheterostructures of Gallium Nitride in the 80–100 GHz Frequency Range
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Microwave characterization of undoped polycrystalline silicon
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Mid- and Long-Wave IR Detectors Using an Hg1 xCdxTe Heteroepitaxial Layer
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V. V. Vasilyev |
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Mid- and Long-Wave IR Detectors Using an Hg1 – xCdxTe Heteroepitaxial Layer
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Minority-Carrier Generation at the Interface between Silicon and Lead Borosilicate Glass
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Minority-Carrier Generation at the Interface between Silicon and Lead Borosilicate Glass
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Mo/Al/Mo/Au-based ohmic contacts to AlGaN/GaN heterostructures
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Modeling of Gold Adsorption by the Surface of Defect Graphene
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Modeling of the Crystallization and Correlation of the Properties with the Composition and Particle Size in Two-Dimensional GaSxSe1 –x (0 ≤ х ≤ 1)
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Modeling of the spectroscopic response of photonic isomers with NV-centers. Part II
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Modeling the Dynamics of the Integral Dielectric Permittivity of a Porous Low-K Organosilicate Film during the Dry Etching of a Photoresist in O2 Plasma
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Modeling the High-Voltage Gas-Discharge-Plasma Etching of SiO2
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Modeling the High-Voltage Gas-Discharge-Plasma Etching of SiO2
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Modification of the positive photoresist surface by ion implantation
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Monolithic Integrated Circuits for Low-Noise Centimeter-Wave Amplifiers on an AlGaN/AlN/GaN/SiC Heterostructure
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Negative Differential Conductance of a Quasi-Ballistic MESFET
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Negative Differential Conductance of a Quasi-Ballistic MESFET
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New approach to the manufacturing of power microwave bipolar transistors: A computer simulation
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New Method for Standard-Cell Routing Subject to Electrical Constraints
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New Method for Standard-Cell Routing Subject to Electrical Constraints
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New Methods for Making the Qubits of a Solid-State Quantum Computer by Implantation of Single Highly Charged 31P Ions
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New Methods for Making the Qubits of a Solid-State Quantum Computer by Implantation of Single Highly Charged 31P Ions
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Non-Archimedean Calculus in the Mathematical Modeling of Digital ICs
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Non-Archimedean Calculus in the Mathematical Modeling of Digital ICs
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Noncontact Temperature Measurement on Dielectrics and Semiconductors, Part 1
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Noncontact Temperature Measurement on Dielectrics and Semiconductors, Part 1
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Nonequivalence of biparticle and multiparticle quantum entanglements
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Chernyavskii, A. Yu. |
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Nonlinearity estimation of scanning on a scanning electron microscope
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Nonresonant Parametric Amplification of Signals in Neural Networks Through the Rhythms of a Central Processor
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Nonresonant Parametric Amplification of Signals in Neural Networks Through the Rhythms of a Central Processor
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Numerical simulation of two-particle resonant scattering with the formation of a molecular ion
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On the Effect of the Cl2 + O2 + Ar Mixture Composition on the Concentrations of Chlorine and Oxygen Atoms in a Plasma
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Operational Features of MEMS with an Even Number of Electrodes
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Operation of an electronic lithograph in the mode of a scanning electron microscope
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Optically Pumped Bipolar Transistor
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Optical maskless lithography
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Optical Second-Harmonic Microscopy Applied to the Local Probing of the State of Polarization in Thin Films of Lead Zirconate Titanate
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Optical Second-Harmonic Microscopy Applied to the Local Probing of the State of Polarization in Thin Films of Lead Zirconate Titanate
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Paramagnetic-center detection by SQUID measurement of static magnetic susceptibility
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Parameters and composition of HBr plasma under the conditions of glow DC discharge
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Parameters of Gaseous Phase and Kinetics of Reactive Ion Etching of SiO2 in CF4/C4F8/Ar/He Plasma
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Parameters of Plasma and Kinetics of Active Particles in CF4 (CHF3) + Ar Mixtures of a Variable Initial Composition
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Performance Calculation for a MEMS Switch with a Floating Electrode
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Performance Estimation and Application of Analog Device using 32 nm CNFET
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Photoassisted scanning-probe nanolithography on Ti films
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Photoconductivity of silicon with nanoclusters of manganese atoms
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Positronics and nanotechnologies: Possibilities of studying nanoobjects in critical engineering materials using positron annihilation spectrometry
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Power Consumption of Quasi-adiabatic Logic Gates
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Power Consumption of Quasi-adiabatic Logic Gates
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Predicting the Effect of Pulsed Ionizing Radiation on Operational Amplifiers
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Predicting the Effect of Pulsed Ionizing Radiation on Operational Amplifiers
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Probe and Spectral Diagnostics of the Plasma of the BCl3–Cl2 Gas Medium
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Prototypes of Devices for Heterogeneous Hybrid Semiconductor Electronics with an Embedded Biomolecular Domain
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Quality Control of a Multilayer Spin-Tunnel Structure with the Use of a Combination of Analytical Methods
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Quantum-aperture formation in a quasi-ballistic MESFET by neutron irradiation
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Quantum calculations on quantum dots in semiconductor microcavities. Part II
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Quantum dots in photonic molecules and quantum informatics. Part I
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Quantum noise and the quality control of hardware components of quantum computers based on superconducting phase qubits
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Quantum Size Effect Due to the Electron Transport over Bismuth Nanobridges with 2D Electron Gas
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Quantum Size Effect Due to the Electron Transport over Bismuth Nanobridges with 2D Electron Gas
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Quantum state depressions in thin metal films with an indented surface
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Radical Modification of Gate Oxide by Lateral Gettering of Electroactive Centers
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Radical Modification of Gate Oxide by Lateral Gettering of Electroactive Centers
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Resistors Integrated into MCM-D Modules: Fabrication and Performance
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Resistors Integrated into MCM-D Modules: Fabrication and Performance
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Resonator-based superconducting qubit
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Reverse I-V characteristics of a diode-connected heterostructure MESFET
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Scanning electron microscopy used to measure the feature dimensions of a nanoscale test pattern on a silicon surface
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Self-organization process under electrolytic formation of nanostructures in silicon-based semi-conducting systems
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Self-organized growth mechanism for porous aluminum anodic oxide
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SEM Linear Measurement in a Wide Magnification Range
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SEM Linear Measurement in a Wide Magnification Range
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Set Based Theoretical Approach to the Representation of Routing Stage in the Design Flow for the Heterogeneous FPGAs and Reconfigurable SoCs
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Silicon-Ingot Inspection by Active IR Imaging
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Simulation of a Normally-off HEMT Transistor Based on a GaN/AlGaN with a p-Gate
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Simulation of a Vertical Ballistic Quantum-Barrier Field-Effect Transistor Based on an Undoped AlxGa1–xAs Quantum Nanowire
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Simulation of mass transfer of liquids through microchannels under the influence of surface acoustic waves
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Simulation of the effects of deep grooving in silicon in the plasmochemical cyclic process
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Simulation the Effects of Single Nuclear Particles on STG RS Triggers with Transistors Spacing into Two Groups
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Single-Photon Response and Spectroscopy of a Photonic Molecule Based on Diamond Microrings
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Size effect relating to the extraordinary and the ordinary Hall effect in ultrathin Fe-Pt films
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Smart fiber-optical sensor of acoustic pressure with a possibility of distant correction of sensitivity
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Space Surface Parameters Determined from Fourier Transforms in Atomic Force Microscopy
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Space Surface Parameters Determined from Fourier Transforms in Atomic Force Microscopy
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Spectral Control of the Process of Copper Etching in Radio Frequency Dichlorodifluoromethane Plasma
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Spectral study of HCl plasma etching of gallium arsenide
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Spots Concept for Problems of Artificial Intelligence and Algorithms of Neuromorphic Systems
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Stabilization of StructureImpurity and Electrophysical Parameters in the Si/SiO2 System
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Stabilization of Structure–Impurity and Electrophysical Parameters in the Si/SiO2 System
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Stacked Gate FinFET with Gate Extension for Improved Gate Control
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Statistical Models and Adequacy Validation for Optical Quantum State Tomography with Quadrature Measurements
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Strong influence of surface scattering on the electron transport through magnetic multilayers
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Study of Spin-Tunnel Junction Magnetization Using Coherent Rotation of the Free Layer Magnetization Model
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Study of the methods of calibration of the process OPC VT-5 models with a variable threshold
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Superconducting resonators and charge qubits: Spectroscopy and quantum operations. Part I
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Surface-Defect Imaging in Optical Topography
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Surface-Defect Imaging in Optical Topography
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Tapered Silicon Oxide Etching for Creation of Capacitor Structures for Measurement of Dielectric Characteristics
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Technology of Nanosized Metal Layers for Forming a Reliable Contact to the Drain Area of Silicon Transistors
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The Bulk-Recombination Mechanism of Negative Relative Sensitivity Observed in Bipolar Magnetotransistors
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