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                             259 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Adaptive equalizer with a controller of a minimally admissible differential voltage of the output signal and pseudodifferential cascode output buffer for the 10-Gb/s transmitter according to the 65-nm CMOS technology Larionov, A. V.
2015
6 p. 414-420
artikel
2 A functionally integrated injection laser-modulator with the radiation frequency modulation Ryndin, E. A.
2013
6 p. 360-362
artikel
3 A Helicon Plasma Source O. V. Braginskii
2000
6 p. 380-390
11 p.
artikel
4 A Helicon Plasma Source Braginskii, O. V.
2000
6 p. 380-390
artikel
5 Amorphization of Vanadium Oxides during the Reversible Insertion of Lithium Skundin, A. M.

6 p. 416-422
artikel
6 Analyzing conductance-frequency curves of metal-insulator-semiconductor structures subject to surface-potential fluctuations and electrically active states inside the insulator Avdeev, N. A.
2007
6 p. 402-408
artikel
7 Anodic-Oxidation Growth of Microscopic Pillar Arrays: Kinetic Aspects A. I. Vorob'eva
2001
6 p. 381-393
13 p.
artikel
8 Anodic-Oxidation Growth of Microscopic Pillar Arrays: Kinetic Aspects Vorob'eva, A. I.
2001
6 p. 381-393
artikel
9 Anomalous Kossel effect in semiconductor structures Medvedev, P. G.
2006
6 p. 359-371
artikel
10 Anomalous photoconductivity decay observed in microwave measurements of carrier lifetime in silicon ingots Borodovskii, P. A.
2006
6 p. 345-349
artikel
11 Application of Graphene in The Cooling System of a Personal Electronic Computer Zuev, S. M.

6 p. 404-411
artikel
12 Artificial Intelligence Will Never Completely Replace Humans Abramov, I. I.

6 p. 376-386
artikel
13 A semianalytical model of a thin-channel field-effect transistor Khomyakov, A. N.
2009
6 p. 393-405
artikel
14 Atomic mechanisms of strain relaxation in heteroepitaxial Cu/Ni(001) system Trushin, O. S.
2015
6 p. 410-413
artikel
15 A virtual scanning electron microscope. 4. Simulator-based implementation Novikov, Yu. A.
2014
6 p. 427-437
artikel
16 Axially symmetric composite electromagnetic mirror for perfect axial-aberration correction Shukov, V. A.
2006
6 p. 372-381
artikel
17 Basic memory elements using DICE cells for fault-tolerant 28 nm CMOS RAM Stenin, V. Ya.
2015
6 p. 368-379
artikel
18 Calculation of the Schottky barrier height at the contact between a metal and (SiC)1–x(AlN)x semiconductor solid solution Safaraliev, G. K.
2015
6 p. 404-409
artikel
19 Chaotic Negative-Resistance Oscillators with a Multibranch Piecewise-Linear CurrentVoltage Characteristic V. G. Prokopenko
2004
6 p. 381-389
9 p.
artikel
20 Chaotic Negative-Resistance Oscillators with a Multibranch Piecewise-Linear Current—Voltage Characteristic Prokopenko, V. G.
2004
6 p. 381-389
artikel
21 Characterization of the structure and optical properties of micron porous layers on antimony-doped silicon substrates Lomov, A. A.
2012
6 p. 336-346
artikel
22 CMOS Majority Element Based on NAND Logic with Reduced Sensitivity to Single Ionizing Particles Stenin, V. Ya.

6 p. 394-403
artikel
23 CMOS Switched-Capacitor Integrator Yu. B. Rogatkin
2003
6 p. 333-338
6 p.
artikel
24 CMOS Switched-Capacitor Integrator Rogatkin, Yu. B.
2003
6 p. 333-338
artikel
25 Computer Analysis of Resistive Switching in a Bismuth Selenide Microcrystal-Based Structure Sirotkin, V. V.

6 p. 445-453
artikel
26 Concentration Dependences of Charge Transfer and the Kinetics of Monte Carlo Modeling of the Growth of 2D Mono- and Nanocrystals of Gallium Chalcogenides Asadov, S. M.

6 p. 452-462
artikel
27 Constructivist treatment of Bell’s inequality violations and the no-hidden-variable theorems Ozhigov, Y. I.
2009
6 p. 409-417
artikel
28 Contact Transport and Field Emission Properties of Low-Dimensional 2D Carbon Heterostructures Yafarov, R. K.

6 p. 439-444
artikel
29 Controlling the Si(001) Surface Morphology upon Thermal Annealing in a Vacuum Chamber Rodyakina, E. E.
2018
6 p. 365-370
artikel
30 Control of the formation of ultrathin CoSi2 layers during the rapid thermal annealing of Ti/Co/Ti/Si(100) structures Rudakov, V. I.
2011
6 p. 389-394
artikel
31 Creation of lithographic masks using a scanning probe microscope Bizyaev, D. A.
2015
6 p. 389-398
artikel
32 Critical Velocities of Domain Walls in Magnetic Thin Films with Planar Anisotropy B. N. Filippov
2001
6 p. 406-410
5 p.
artikel
33 Critical Velocities of Domain Walls in Magnetic Thin Films with Planar Anisotropy Filippov, B. N.
2001
6 p. 406-410
artikel
34 CVC Simulation of Ultrathin Soi-Cmos Nanotransistors with a Fully Enclosed Gate Masalsky, N. V.

6 p. 387-393
artikel
35 DC/DC Buck-Boost Converter with Single Inductance Babenko, V. P.

6 p. 471-480
artikel
36 Delta-Doping of Monocrystalline Semiconductors by Al and Sb Implantation Using FIB Resistless Lithography V. A. Zhukov
2004
6 p. 362-372
11 p.
artikel
37 Delta-Doping of Monocrystalline Semiconductors by Al and Sb Implantation Using FIB Resistless Lithography Zhukov, V. A.
2004
6 p. 362-372
artikel
38 Density of states at a gamma-irradiated Si/SiO2 interface: The effect of ultrasonic treatment Parchinskii, P. B.
2005
6 p. 356-358
artikel
39 Design and Evaluation of Low Power CMOS Based Schmitt Trigger Circuits Nagella Maniteja,

6 p. 556-564
artikel
40 Designing FPGAs and Reconfigurable SoCs Using Methods of Program Analysis and Prototyping Enns, V. I.

6 p. 426-438
artikel
41 Design of Cu-MWCNT Based Heterogeneous Coaxial through Silicon Vias for High-Speed VLSI Applications Rajkumar, Katepogu

6 p. 512-520
artikel
42 Design of Integrated Voltage Multipliers Using Standard CMOS Technologies Sinyukin, A. S.

6 p. 527-534
artikel
43 Design-processing features of microwave GaAs monolithic integrated circuits of a low-noise amplifier with a copper metallized frontside Ishutkin, S. V.
2015
6 p. 380-388
artikel
44 Determination of the size of vacancy-type defects in angstrom ranges by positron annihilation spectroscopy Grafutin, V. I.
2011
6 p. 428-435
artikel
45 Development of a Method for Constructing a Nonlinear Model of a Metamorphic 0.15-μm МHEMT InAlAs/InGaAs Transistor Lokotko, V. V.

6 p. 404-412
artikel
46 Development of crystal matrix of tensoresistive pressure tactile transducers for robotics Gusev, D. V.
2015
6 p. 421-424
artikel
47 Development of the Technology of Magnetron Sputtering Deposition of LiPON Films and Investigation of Their Characteristics Vasilev, S. V.
2017
6 p. 424-432
artikel
48 Device and process simulation of SOS and SOI MOSFETs Kroupkina, T. Yu.
2005
6 p. 386-396
artikel
49 1D GaAs Detector Arrays for Digital X-ray Imaging V. F. Dvoryankin
2004
6 p. 373-376
4 p.
artikel
50 1D GaAs Detector Arrays for Digital X-ray Imaging Dvoryankin, V. F.
2004
6 p. 373-376
artikel
51 Dielectric Barrier in the Subtractive Process of Formation of a Copper Metallization System Orlov, A. A.

6 p. 470-479
artikel
52 Digital-Reflectometry Characterization of the Surface Structure and Protective Property of Thin Films V. A. Kotenev
2002
6 p. 396-406
11 p.
artikel
53 Digital-Reflectometry Characterization of the Surface Structure and Protective Property of Thin Films Kotenev, V. A.
2002
6 p. 396-406
artikel
54 Dual-Collector Lateral Bipolar Magnetotransistor: Carrier Transport and Relative Sensitivity A. V. Kozlov
2003
6 p. 385-390
6 p.
artikel
55 Dual-Collector Lateral Bipolar Magnetotransistor: Carrier Transport and Relative Sensitivity Kozlov, A. V.
2003
6 p. 385-390
artikel
56 Dynamics of Stress in Films of Metals on Silicon During Vacuum Heat Treatment Dzhuplin, V. N.

6 p. 412-419
artikel
57 Effect of a transverse applied electric field on electron drift velocity in a GaAs quantum wire: A Monte Carlo simulation Borzdov, A. V.
2010
6 p. 411-417
artikel
58 Effect of Ion-Plasma Treatment on the Phase Composition and Electrical Resistivity of Nanometer-Thick Tungsten Films Selyukov, R. V.

6 p. 488-496
artikel
59 Effect of Lattice Defects on the Electromigration-Induced Instability of the Interface between Joined Conductive Materials Makhviladze, T. M.

6 p. 426-434
artikel
60 Effect of Point Defects on the Electromigration Rate at the Interface of Joined Materials Makhviladze, T. M.

6 p. 423-430
artikel
61 Effect of polymer matrix and photoacid generator on the lithographic properties of chemically amplified photoresist Bulgakova, S. A.
2014
6 p. 392-400
artikel
62 Effect of the Measuring Signal Parameters on the Error in Capacitance Measurements of a p-n Transition and Determining Its Resistance to Radiation Zabavichev, I. Yu.
2017
6 p. 433-441
artikel
63 Elastically Strained Porous Silicon Layers Formed on Single-Crystal Substrates V. D. Skupov
2003
6 p. 382-384
3 p.
artikel
64 Elastically Strained Porous Silicon Layers Formed on Single-Crystal Substrates Skupov, V. D.
2003
6 p. 382-384
artikel
65 Elastic-stress relaxation in heteroepitaxial structures investigated by computer simulation Trushin, O. S.
2008
6 p. 363-372
artikel
66 Electrical parameters and the plasma composition in HCl-H2 mixtures Efremov, A. M.
2011
6 p. 371-378
artikel
67 Electrical properties of a TiN/TixAl1 – xOy/TiN memristor device manufactured by magnetron sputtering Bobylev, A. N.
2016
6 p. 396-401
artikel
68 Electroactive Centers at the Outer Interface of an Ultrathin Oxide Layer and Their Effect on the Electrical Performance of Single-Crystal Silicon/Noncrystalline Oxide/Polysilicon Structures V. Ya. Uritskii
2000
6 p. 417-422
6 p.
artikel
69 Electroactive Centers at the Outer Interface of an Ultrathin Oxide Layer and Their Effect on the Electrical Performance of Single-Crystal Silicon/Noncrystalline Oxide/Polysilicon Structures Uritskii, V. Ya.
2000
6 p. 417-422
artikel
70 Electroluminescence in p-GaP/por-GaP/SnO2 Structures in the Red Region of the Spectrum Dikhanbaev, K. K.

6 p. 465-469
artikel
71 Electromagnetic Modeling, Technology, and Production of Microwave C3MOSHFET Switches on AlGaN/GaN Heterostructures Adonin, A. S.
2017
6 p. 390-395
artikel
72 Electron Detection Circuit Based on a Tunnel Structure of Four Quantum Dots with Asymmetric Parameters Tsukanov, A. V.

6 p. 387-397
artikel
73 Electronic Structure of Molecular Switches on Splitters Based on trans-Polyacetylene Gorbatsevich, A. A.
2017
6 p. 414-423
artikel
74 Electrophysical Characteristics and Emission Spectra of Carbon Tetrafluoride Plasma Murin, D. B.

6 p. 368-375
artikel
75 Electrophysical Parameters of PIN Photodiodes Irradiated with 60Co γ-Quanta Kovalchuk, N. S.

6 p. 504-509
artikel
76 Electrophysical properties of lead zirconate titanate films doped with lanthanum Podgornyi, Yu. V.
2014
6 p. 438-444
artikel
77 Equivalent electrical network of the DNA molecule Grib, N. V.
2006
6 p. 398-404
artikel
78 Erratum to: Design of a Nonlinear Model of a Pseudomorphic 0.15 µm рHEMT AlGaAs/InGaAs/GaAs Transistor Tsunvaza, D.

6 p. 566
artikel
79 Erratum to: Simulation of a System of Nanoantennas Located in a TSV Channel as a System for Receiving and Transmitting Data Serov, D. A.

6 p. 565
artikel
80 ESR spectra of the triplet and singlet states of a Zn-P two-spin system in Si: Mathematical modeling and computer simulation Dobryakov, S. N.
2005
6 p. 373-382
artikel
81 Etching of GaAs in the Plasma of a Freon R-12–Argon (CCl2F2/Ar) Mixture Murin, D. B.
2019
6 p. 434-442
artikel
82 Etching of SiC in Low Power Inductively-Coupled Plasma Osipov, A. A.
2019
6 p. 427-433
artikel
83 Evaluating the reading sensitivity of a new thermomechanical data-storage technique Petrin, A. B.
2005
6 p. 365-372
artikel
84 Evaluation of Si-Wafer Chemical Cleaning Procedures in Terms of Their Effect on Wafer Topography S. P. Timoshenkov
2003
6 p. 371-376
6 p.
artikel
85 Evaluation of Si-Wafer Chemical Cleaning Procedures in Terms of Their Effect on Wafer Topography Timoshenkov, S. P.
2003
6 p. 371-376
artikel
86 Experimental diamond photonics: Current state and prospects. Part II Tsukanov, A. V.
2016
6 p. 367-382
artikel
87 Fault Tolerant Reversible T Latch with Enhanced Testability at Nano-Scale for Application of Ripple Counters Singh, Pankaj

6 p. 439-451
artikel
88 Formation and some properties of chromium oxide nanolayers on semiconductors Ezhovskii, Yu. K.
2008
6 p. 356-362
artikel
89 Formation of thin-film HfO2/Si(100) structures by high-frequency magnetron sputtering Rudakov, V. I.
2011
6 p. 383-388
artikel
90 Fractal Analysis of Anisotropic Surfaces P. A. Arutyunov
2001
6 p. 411-413
3 p.
artikel
91 Fractal Analysis of Anisotropic Surfaces Arutyunov, P. A.
2001
6 p. 411-413
artikel
92 Fully depleted SOI CMOS logic gates for low-voltage applications Masal’skii, N. V.
2008
6 p. 410-417
artikel
93 Geometric aspects of AFM imaging Novikov, Yu. A.
2008
6 p. 390-409
artikel
94 Happy 85th Anniversary! 2009
6 p. 363
artikel
95 Helicon Plasma Source O. V. Braginskii
2002
6 p. 341-345
5 p.
artikel
96 Helicon Plasma Source Braginskii, O. V.
2002
6 p. 341-345
artikel
97 High-frequency admittance of a thin circular metal wire Zavitaev, E. V.
2008
6 p. 373-381
artikel
98 Highly doped Si/SiO2/W sandwich structures with an exposed insulator edge: Electrical transport and electroforming Mordvintsev, V. M.
2007
6 p. 371-383
artikel
99 High-Rate Deposition of Amorphous Silicon B. G. Budagyan
2000
6 p. 391-396
6 p.
artikel
100 High-Rate Deposition of Amorphous Silicon Budagyan, B. G.
2000
6 p. 391-396
artikel
101 Identification of Trapping Effects and Ion Neutralization at the Insulator/Semiconductor Interface of MIS Structures from Dynamic CurrentVoltage Characteristics of Ion Depolarization E. I. Gol'dman
2000
6 p. 406-412
7 p.
artikel
102 Identification of Trapping Effects and Ion Neutralization at the Insulator/Semiconductor Interface of MIS Structures from Dynamic Current–Voltage Characteristics of Ion Depolarization Gol'dman, E. I.
2000
6 p. 406-412
artikel
103 Implementation of an LNA Using a Microstrip Coupler as a DC-Block for Sub-6 5G Communication Systems Mohamed Boumalkha,

6 p. 547-555
artikel
104 Influence of external conditions on physical processes and plasma parameters in a model of a high-frequency hybrid plasma system Aleksandrov, A. F.
2016
6 p. 433-441
artikel
105 Initial stage of semiinsulating polycrystalline silicon film growth Turtsevich, A. S.
2008
6 p. 349-355
artikel
106 Injection Diffusion-Drift Pulse Former Gaev, D. S.

6 p. 411-415
artikel
107 In Memoriam: Academician Kamil A. Valiev January 15, 1931–July 28, 2010 2010
6 p. 377
artikel
108 In situDiagnostics of Plasma Processes in Microelectronics: The Current Status and Immediate Prospects, Part IV A. A. Orlikovskii
2001
6 p. 343-370
28 p.
artikel
109 In situDiagnostics of Plasma Processes in Microelectronics: The Current Status and Immediate Prospects, Part IV Orlikovskii, A. A.
2001
6 p. 343-370
artikel
110 Institute for design problems in microelectronics, Russian Academy of Sciences (IPPM RAS), Moscow, Russia 2011
6 p. 369-370
artikel
111 Integrated Laser Measuring System for the Ellipsometric and Photovoltage Characterization of Thin Surface Layers V. A. Kotenev
2003
6 p. 355-360
6 p.
artikel
112 Integrated Laser Measuring System for the Ellipsometric and Photovoltage Characterization of Thin Surface Layers Kotenev, V. A.
2003
6 p. 355-360
artikel
113 Integration of functional elements of resistive nonvolative memory with 1T-1R topology Negrov, D. V.
2016
6 p. 383-395
artikel
114 Investigation into the selectivity of etching various materials by fast neutral particle beams Maishev, Yu. P.
2014
6 p. 388-391
artikel
115 Investigation of Alloyed Ohmic Contacts in Epitaxial Tellurium-Doped Gallium Arsenide Layers Egorkin, V. I.
2018
6 p. 388-392
artikel
116 Investigation of the BF3 plasma particle’s lateral distribution using two-view emission tomography Fadeev, A. V.
2014
6 p. 407-412
artikel
117 Ion-Bombardment-Induced Decomposition of Nonequilibrium Solid Solution and the Formation of Periodic Structures S. A. Krivelevich
2000
6 p. 376-379
4 p.
artikel
118 Ion-Bombardment-Induced Decomposition of Nonequilibrium Solid Solution and the Formation of Periodic Structures Krivelevich, S. A.
2000
6 p. 376-379
artikel
119 IR photodetectors in the range of λ = 1.5–8 μm, based on silicon with multicharged nanoclusters of manganese atoms Bakhadyrkhanov, M. K.
2012
6 p. 354-356
artikel
120 Kinetics and mechanisms of Cl2 or HCl plasma etching of copper Efremov, A. M.
2007
6 p. 358-365
artikel
121 Kinetics and Mechanisms of Reactive-Ion Etching of Si and SiO2 in a Plasma of a Mixture of HBr + O2 Efremov, A. M.

6 p. 379-384
artikel
122 Kinetics and modes of plasmachemical etching of GaAs under conditions of induction HF discharge in CF2Cl2 Efremov, A. M.
2014
6 p. 401-406
artikel
123 Laser Plasma-Chemical Etching of Polycrystalline Diamond and Single-Crystal Sapphire Red’kin, S. V.

6 p. 435-438
artikel
124 Laser simulation of ionizing-radiation effects on silicon ICs: The temperature and doping-level dependence of simulation parameters Gadoev, S. M.
2005
6 p. 383-385
artikel
125 Liquid-crystal thermography of hot spots on electronic components Popov, V. M.
2007
6 p. 392-401
artikel
126 Logic synthesis from VHDL descriptions using LeonardoSpectrum: Theoretical basis Bibilo, P. N.
2005
6 p. 397-406
artikel
127 Low-power CMOS switched-capacitor lowpass filter using current conveyors Korotkov, A. S.
2006
6 p. 405-413
artikel
128 Low-temperature pulsed vapor-phase deposition of thin layers of metal ruthenium for micro- and nanoelectronics. Part 5. Interrelation of growth regularities, structure, and properties of ruthenium layers Vasilyev, V. Yu.
2011
6 p. 403-413
artikel
129 Magneto-Optical Properties of Multilayer Structures Based on Cobalt and Chromium-Group Metals for Magnetic Memory Elements Prokaznikov, A. V.

6 p. 454-464
artikel
130 Mathematical simulation of the influence of a focusing channel surface on the angle characteristics of a bundle of rapid neutral particles Degtyarev, A. V.
2010
6 p. 405-410
artikel
131 Measurements of linear dimensions of silicon nanorelief elements with a near-rectangular profile by defocusing the electron probe of a scanning electron microscope Valiev, K. A.
2010
6 p. 394-400
artikel
132 Mechanical Control of the Spectrum of a Chain of Resonators and the Organization of Remote Interaction Between Quantum Dots Tsukanov, A. V.

6 p. 365-378
artikel
133 Mechanisms of Plasma Etching of Titanium, Indium, Tin, and Zinc Oxides in a Mixture of HBr + Ar Efremov, A. M.

6 p. 379-386
artikel
134 MEMS Switch Based on a Cantilever with Increased Contact Force Belozerov, I. A.

6 p. 475-482
artikel
135 Method for the Iterative Refinement of Parameter Values in Analytical Models of Microelectronic Devices Based on Integrated MOS Transistors Sinyukin, A. S.

6 p. 398-403
artikel
136 Methods of Multiplex Spectroscopy in the Characterization of Nanoscale Multilayers V. A. Kotenev
2004
6 p. 353-361
9 p.
artikel
137 Methods of Multiplex Spectroscopy in the Characterization of Nanoscale Multilayers Kotenev, V. A.
2004
6 p. 353-361
artikel
138 Microelectromechanical System for Controlling Flow Past an Airfoil: Pressure Transducers A. A. Taskin
2002
6 p. 359-365
7 p.
artikel
139 Microelectromechanical System for Controlling Flow Past an Airfoil: Pressure Transducers Taskin, A. A.
2002
6 p. 359-365
artikel
140 Microwave Characteristics of Amplifiers on Nanoheterostructures of Gallium Nitride in the 80–100 GHz Frequency Range Gnatyuk, D. L.

6 p. 404-410
artikel
141 Microwave characterization of undoped polycrystalline silicon Borodovskii, P. A.
2006
6 p. 350-353
artikel
142 Mid- and Long-Wave IR Detectors Using an Hg1 xCdxTe Heteroepitaxial Layer V. V. Vasilyev
2002
6 p. 351-358
8 p.
artikel
143 Mid- and Long-Wave IR Detectors Using an Hg1 – xCdxTe Heteroepitaxial Layer Vasilyev, V. V.
2002
6 p. 351-358
artikel
144 Minority-Carrier Generation at the Interface between Silicon and Lead Borosilicate Glass P. B. Parchinskii
2001
6 p. 401-405
5 p.
artikel
145 Minority-Carrier Generation at the Interface between Silicon and Lead Borosilicate Glass Parchinskii, P. B.
2001
6 p. 401-405
artikel
146 Mo/Al/Mo/Au-based ohmic contacts to AlGaN/GaN heterostructures Kondakov, M. N.
2016
6 p. 402-409
artikel
147 Modeling of Gold Adsorption by the Surface of Defect Graphene Asadov, M. M.

6 p. 413-425
artikel
148 Modeling of the Crystallization and Correlation of the Properties with the Composition and Particle Size in Two-Dimensional GaSxSe1 –x (0 ≤ х ≤ 1) Asadov, S. M.

6 p. 452-465
artikel
149 Modeling of the spectroscopic response of photonic isomers with NV-centers. Part II Tsukanov, A. V.
2015
6 p. 355-367
artikel
150 Modeling the Dynamics of the Integral Dielectric Permittivity of a Porous Low-K Organosilicate Film during the Dry Etching of a Photoresist in O2 Plasma Rezvanov, A. A.
2018
6 p. 415-426
artikel
151 Modeling the High-Voltage Gas-Discharge-Plasma Etching of SiO2 V. A. Kolpakov
2002
6 p. 366-374
9 p.
artikel
152 Modeling the High-Voltage Gas-Discharge-Plasma Etching of SiO2 Kolpakov, V. A.
2002
6 p. 366-374
artikel
153 Modification of the positive photoresist surface by ion implantation Brinkevich, D. I.
2015
6 p. 399-403
artikel
154 Monolithic Integrated Circuits for Low-Noise Centimeter-Wave Amplifiers on an AlGaN/AlN/GaN/SiC Heterostructure Fedorov, Yu. V.
2017
6 p. 404-407
artikel
155 Nano- and micrometer-scale thin-film-interconnection failure theory and simulation and metallization lifetime prediction, Part 1: A general theory of vacancy transport, mechanical-stress generation, and void nucleation under electromigration in relation to multilevel-metallization degeneration and failure Valiev, K. A.
2009
6 p. 364-384
artikel
156 Negative Differential Conductance of a Quasi-Ballistic MESFET S. V. Obolenskii
2001
6 p. 394-400
7 p.
artikel
157 Negative Differential Conductance of a Quasi-Ballistic MESFET Obolenskii, S. V.
2001
6 p. 394-400
artikel
158 New approach to the manufacturing of power microwave bipolar transistors: A computer simulation Snitovsky, Yu. P.
2007
6 p. 409-414
artikel
159 New Method for Standard-Cell Routing Subject to Electrical Constraints A. S. Plekhanov
2003
6 p. 339-346
8 p.
artikel
160 New Method for Standard-Cell Routing Subject to Electrical Constraints Plekhanov, A. S.
2003
6 p. 339-346
artikel
161 New Methods for Making the Qubits of a Solid-State Quantum Computer by Implantation of Single Highly Charged 31P Ions V. A. Zhukov
2003
6 p. 347-354
8 p.
artikel
162 New Methods for Making the Qubits of a Solid-State Quantum Computer by Implantation of Single Highly Charged 31P Ions Zhukov, V. A.
2003
6 p. 347-354
artikel
163 Non-Archimedean Calculus in the Mathematical Modeling of Digital ICs E. G. Shcheglov
2002
6 p. 384-395
12 p.
artikel
164 Non-Archimedean Calculus in the Mathematical Modeling of Digital ICs Shcheglov, E. G.
2002
6 p. 384-395
artikel
165 Noncontact Temperature Measurement on Dielectrics and Semiconductors, Part 1 V. K. Bitukov
2004
6 p. 329-341
13 p.
artikel
166 Noncontact Temperature Measurement on Dielectrics and Semiconductors, Part 1 Bitukov, V. K.
2004
6 p. 329-341
artikel
167 Nonequivalence of biparticle and multiparticle quantum entanglements Chernyavskii, A. Yu.
2009
6 p. 406-408
artikel
168 Nonlinearity estimation of scanning on a scanning electron microscope Alzoba, V. V.
2012
6 p. 351-353
artikel
169 Nonresonant Parametric Amplification of Signals in Neural Networks Through the Rhythms of a Central Processor Yu. I. Balkarei
2000
6 p. 355-361
7 p.
artikel
170 Nonresonant Parametric Amplification of Signals in Neural Networks Through the Rhythms of a Central Processor Balkarei, Yu. I.
2000
6 p. 355-361
artikel
171 Numerical simulation of two-particle resonant scattering with the formation of a molecular ion Arakelov, K. S.
2008
6 p. 382-389
artikel
172 On the Effect of the Cl2 + O2 + Ar Mixture Composition on the Concentrations of Chlorine and Oxygen Atoms in a Plasma Amirov, I. I.

6 p. 497-504
artikel
173 On the possibility of controlling thermal conditions of a typical element of electronic equipment with a local heat source via Natural Convection Kuznetsov, G. V.
2010
6 p. 427-442
artikel
174 Operational Features of MEMS with an Even Number of Electrodes Dragunov, V. P.
2018
6 p. 393-406
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175 Operation of an electronic lithograph in the mode of a scanning electron microscope Kal’nov, V. A.
2012
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176 Optically Pumped Bipolar Transistor Al’tudov, Yu. K.

6 p. 510-516
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177 Optical maskless lithography Belokopytov, G. V.
2011
6 p. 414-427
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178 Optical Second-Harmonic Microscopy Applied to the Local Probing of the State of Polarization in Thin Films of Lead Zirconate Titanate E. D. Mishina
2001
6 p. 371-380
10 p.
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179 Optical Second-Harmonic Microscopy Applied to the Local Probing of the State of Polarization in Thin Films of Lead Zirconate Titanate Mishina, E. D.
2001
6 p. 371-380
artikel
180 Paramagnetic-center detection by SQUID measurement of static magnetic susceptibility Golovashkin, A. I.
2006
6 p. 354-358
artikel
181 Parameters and composition of HBr plasma under the conditions of glow DC discharge Smirnov, A. A.
2010
6 p. 418-426
artikel
182 Parameters of Gaseous Phase and Kinetics of Reactive Ion Etching of SiO2 in CF4/C4F8/Ar/He Plasma Efremov, A. M.

6 p. 480-487
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183 Parameters of Plasma and Kinetics of Active Particles in CF4 (CHF3) + Ar Mixtures of a Variable Initial Composition Efremov, A. M.
2018
6 p. 371-380
artikel
184 Peculiarities of the Kinetics of Heterogeneous Processes during the Etching of Silicon in CF4 and C2Br2F4 Plasma Miakonkikh, A. V.

6 p. 505-511
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185 Performance Calculation for a MEMS Switch with a Floating Electrode Morozov, M. O.

6 p. 493-503
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186 Performance Estimation and Application of Analog Device using 32 nm CNFET Tripathi, S. K.

6 p. 540-546
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187 Photoassisted scanning-probe nanolithography on Ti films Ageev, A. O.
2007
6 p. 353-357
artikel
188 Photoconductivity of silicon with nanoclusters of manganese atoms Bakhadyrkhanov, M. K.
2010
6 p. 401-404
artikel
189 Positronics and nanotechnologies: Possibilities of studying nanoobjects in critical engineering materials using positron annihilation spectrometry Grafutin, V. I.
2009
6 p. 418-428
artikel
190 Power Consumption of Quasi-adiabatic Logic Gates V. V. Losev
2003
6 p. 323-332
10 p.
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191 Power Consumption of Quasi-adiabatic Logic Gates Losev, V. V.
2003
6 p. 323-332
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192 Predicting the Effect of Pulsed Ionizing Radiation on Operational Amplifiers T. M. Agakhanyan
2002
6 p. 375-383
9 p.
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193 Predicting the Effect of Pulsed Ionizing Radiation on Operational Amplifiers Agakhanyan, T. M.
2002
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194 Probe and Spectral Diagnostics of the Plasma of the BCl3–Cl2 Gas Medium Murin, D. B.

6 p. 469-474
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195 Prototypes of Devices for Heterogeneous Hybrid Semiconductor Electronics with an Embedded Biomolecular Domain Baranov, M. A.

6 p. 517-526
artikel
196 Quality Control of a Multilayer Spin-Tunnel Structure with the Use of a Combination of Analytical Methods Trushin, O. S.
2018
6 p. 381-387
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197 Quantum-aperture formation in a quasi-ballistic MESFET by neutron irradiation Gromov, V. T.
2005
6 p. 359-364
artikel
198 Quantum calculations on quantum dots in semiconductor microcavities. Part II Tsukanov, A. V.
2014
6 p. 377-387
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199 Quantum dots in photonic molecules and quantum informatics. Part I Tsukanov, A. V.
2013
6 p. 325-346
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200 Quantum noise and the quality control of hardware components of quantum computers based on superconducting phase qubits Bogdanov, Yu. I.
2012
6 p. 325-335
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201 Quantum Size Effect Due to the Electron Transport over Bismuth Nanobridges with 2D Electron Gas A. I. Il'in
2003
6 p. 377-381
5 p.
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202 Quantum Size Effect Due to the Electron Transport over Bismuth Nanobridges with 2D Electron Gas Il'in, A. I.
2003
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artikel
203 Quantum state depressions in thin metal films with an indented surface Tavkhelidze, A. N.
2009
6 p. 429-433
artikel
204 Radical Modification of Gate Oxide by Lateral Gettering of Electroactive Centers V. Ya. Uritskii
2000
6 p. 413-416
4 p.
artikel
205 Radical Modification of Gate Oxide by Lateral Gettering of Electroactive Centers Uritskii, V. Ya.
2000
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artikel
206 Resistors Integrated into MCM-D Modules: Fabrication and Performance A. I. Vorob'eva
2000
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artikel
207 Resistors Integrated into MCM-D Modules: Fabrication and Performance Vorob'eva, A. I.
2000
6 p. 368-375
artikel
208 Resonator-based superconducting qubit Zhilyaev, I. N.
2005
6 p. 407-409
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209 Reverse I-V characteristics of a diode-connected heterostructure MESFET Burzin, S. B.
2007
6 p. 415-421
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210 Scanning electron microscopy used to measure the feature dimensions of a nanoscale test pattern on a silicon surface Gavrilenko, V. P.
2011
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artikel
211 Self-organization process under electrolytic formation of nanostructures in silicon-based semi-conducting systems Arzhanova, N. A.
2014
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artikel
212 Self-organized growth mechanism for porous aluminum anodic oxide Vorobyova, A. I.
2007
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213 SEM Linear Measurement in a Wide Magnification Range Ch. P. Volk
2004
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214 SEM Linear Measurement in a Wide Magnification Range Volk, Ch. P.
2004
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215 Set Based Theoretical Approach to the Representation of Routing Stage in the Design Flow for the Heterogeneous FPGAs and Reconfigurable SoCs Enns, V. I.

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artikel
216 Silicon-Ingot Inspection by Active IR Imaging V. A. Yuryev
2004
6 p. 350-352
3 p.
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217 Silicon-Ingot Inspection by Active IR Imaging Yuryev, V. A.
2004
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artikel
218 Simulation of a Normally-off HEMT Transistor Based on a GaN/AlGaN with a p-Gate Egorkin, V. I.

6 p. 445-451
artikel
219 Simulation of a Vertical Ballistic Quantum-Barrier Field-Effect Transistor Based on an Undoped AlxGa1–xAs Quantum Nanowire Pozdnyakov, D. V.

6 p. 483-492
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220 Simulation of mass transfer of liquids through microchannels under the influence of surface acoustic waves Sirotkin, V. V.
2016
6 p. 414-418
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221 Simulation of the effects of deep grooving in silicon in the plasmochemical cyclic process Shumilov, A. S.
2009
6 p. 385-392
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222 Simulation the Effects of Single Nuclear Particles on STG RS Triggers with Transistors Spacing into Two Groups Stenin, V. Ya.
2018
6 p. 407-414
artikel
223 Single-Photon Response and Spectroscopy of a Photonic Molecule Based on Diamond Microrings Tsukanov, A. V.
2017
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224 Size effect relating to the extraordinary and the ordinary Hall effect in ultrathin Fe-Pt films Matveev, V. N.
2006
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artikel
225 Smart fiber-optical sensor of acoustic pressure with a possibility of distant correction of sensitivity Egorov, F. A.
2016
6 p. 442-445
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226 Space Surface Parameters Determined from Fourier Transforms in Atomic Force Microscopy P. A. Arutyunov
2000
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227 Space Surface Parameters Determined from Fourier Transforms in Atomic Force Microscopy Arutyunov, P. A.
2000
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artikel
228 Spectral Control of the Process of Copper Etching in Radio Frequency Dichlorodifluoromethane Plasma Murin, D. B.

6 p. 359-367
artikel
229 Spectral study of HCl plasma etching of gallium arsenide Dunaev, A. V.
2011
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artikel
230 Spots Concept for Problems of Artificial Intelligence and Algorithms of Neuromorphic Systems Simonov, N. A.

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231 Stabilization of StructureImpurity and Electrophysical Parameters in the Si/SiO2 System N. Ya. Zaitsev
2000
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232 Stabilization of Structure–Impurity and Electrophysical Parameters in the Si/SiO2 System Zaitsev, N. Ya.
2000
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233 Stacked Gate FinFET with Gate Extension for Improved Gate Control Sangeeta Mangesh,
2018
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234 Statistical Models and Adequacy Validation for Optical Quantum State Tomography with Quadrature Measurements Bogdanov, Yu. I.
2017
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235 Strong influence of surface scattering on the electron transport through magnetic multilayers V’yurkov, V. V.
2005
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236 Study of Spin-Tunnel Junction Magnetization Using Coherent Rotation of the Free Layer Magnetization Model Amelichev, V. V.

6 p. 420-425
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237 Study of the methods of calibration of the process OPC VT-5 models with a variable threshold Rodionov, I. A.
2010
6 p. 443-455
artikel
238 Superconducting resonators and charge qubits: Spectroscopy and quantum operations. Part I Tsukanov, A. V.
2010
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artikel
239 Surface-Defect Imaging in Optical Topography S. F. Sen'ko
2003
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240 Surface-Defect Imaging in Optical Topography Sen'ko, S. F.
2003
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artikel
241 Tapered Silicon Oxide Etching for Creation of Capacitor Structures for Measurement of Dielectric Characteristics Miakonkikh, A. V.

6 p. 535-539
artikel
242 Technology of Nanosized Metal Layers for Forming a Reliable Contact to the Drain Area of Silicon Transistors Ismailov, T. A.

6 p. 385-388
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243 The Bulk-Recombination Mechanism of Negative Relative Sensitivity Observed in Bipolar Magnetotransistors R. D. Tikhonov
2004
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244 The Bulk-Recombination Mechanism of Negative Relative Sensitivity Observed in Bipolar Magnetotransistors Tikhonov, R. D.
2004
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artikel
245 The Influence of Individual Layer Parameters on the Photoluminescent Properties of InxGa1 xAs/GaAs System A. A. Lomov
2000
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artikel
246 The Influence of Individual Layer Parameters on the Photoluminescent Properties of InxGa1 – xAs/GaAs System Lomov, A. A.
2000
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artikel
247 Thermal Atomic Layer Deposition of TiNx Using TiCl4 and N2H4 Abdulagatov, A. I.

6 p. 389-403
artikel
248 The Use of Finite Element Modeling for Calculating the C-V Curve of Capacitor Mems Microphone Grigor’ev, D. M.
2017
6 p. 396-403
artikel
249 Thin-film capacitor based on the strontium titanate formed by the sol gel technique Anaraki, Kh. Sokhrabi
2015
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250 Topological transformation of submicron VLSIs for the double lithographic mask technology Shakhnov, V. A.
2013
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artikel
251 Total Efficiency of the Optical-to-Terahertz Conversion in Photoconductive Antennas Based on LT-GaAs and In0.38Ga0.62As Glinskiy, I. A.
2017
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artikel
252 Tungstic acid-assisted thermal oxidation of GaAs Lavrushina, S. S.
2007
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artikel
253 Ultimate thermomechanical read rate from AFM data storage Petrin, A. B.
2006
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artikel
254 Upset-resilient RAM on STG DICE memory elements with the spaced transistors into two groups Stenin, V. Ya.
2016
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artikel
255 Wave phenomena in the finishing of diamond crystals Pintus, S. M.
2011
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artikel
256 Ways of increasing the service life of positive photoresists Lebedev, V. I.
2016
6 p. 410-413
artikel
257 X-band monolithic transmit-receive switch based on a stub directional coupler Mokerov, V. G.
2005
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artikel
258 X-ray and UV Adjustment of Threshold Voltage in MOS-Circuit Manufacture M. N. Levin
2002
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artikel
259 X-ray and UV Adjustment of Threshold Voltage in MOS-Circuit Manufacture Levin, M. N.
2002
6 p. 346-350
artikel
                             259 gevonden resultaten
 
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