| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Application of synchrotron X-ray imaging to phase objects in orthopedics
|
Mori, K.
|
|
2002
|
9 |
3 |
p. 143-147
|
artikel
|
| 2 |
Characterization of a Fresnel zone plate using higher-order diffraction
|
Takeuchi, Akihisa
|
|
2002
|
9 |
3 |
p. 115-118
|
artikel
|
| 3 |
Development of a multilayer Fresnel zone plate for high-energy synchrotron radiation X-rays by DC sputtering deposition
|
Tamura, S.
|
|
2002
|
9 |
3 |
p. 154-159
|
artikel
|
| 4 |
DIAMOND company is launched
|
|
|
2002
|
9 |
3 |
p. 187
|
artikel
|
| 5 |
Elemental analysis with a full-field X-ray fluorescence microscope and a CCD photon-counting system
|
Ohigashi, Takuji
|
|
2002
|
9 |
3 |
p. 128-131
|
artikel
|
| 6 |
Hard X-ray microbeam experiments with a sputtered-sliced Fresnel zone plate and its applications
|
Kamijo, N.
|
|
2002
|
9 |
3 |
p. 182-186
|
artikel
|
| 7 |
High-resolution hard X-ray phase-contrast microscopy with a large-diameter and high-numerical-aperture zone plate
|
Kagoshima, Yasushi
|
|
2002
|
9 |
3 |
p. 132-135
|
artikel
|
| 8 |
LCLS makes the FY2003 budget for project engineering and design
|
|
|
2002
|
9 |
3 |
p. 187
|
artikel
|
| 9 |
Parabolic refractive X-ray lenses
|
Lengeler, Bruno
|
|
2002
|
9 |
3 |
p. 119-124
|
artikel
|
| 10 |
Phase-contrast X-ray imaging based on interferometry
|
Momose, Atsushi
|
|
2002
|
9 |
3 |
p. 136-142
|
artikel
|
| 11 |
Plane-wave X-ray topography and its application at SPring-8
|
Iida, Satoshi
|
|
2002
|
9 |
3 |
p. 169-173
|
artikel
|
| 12 |
Present state and perspectives of synchrotron radiation diffraction imaging
|
Baruchel, J.
|
|
2002
|
9 |
3 |
p. 107-114
|
artikel
|
| 13 |
Progress on the Australian Light Source
|
|
|
2002
|
9 |
3 |
p. 187
|
artikel
|
| 14 |
Quantitative analysis of two-component samples using in-line hard X-ray images
|
Gureyev, T. E.
|
|
2002
|
9 |
3 |
p. 148-153
|
artikel
|
| 15 |
Spain joins the SR world
|
|
|
2002
|
9 |
3 |
p. 187
|
artikel
|
| 16 |
Synchrotron-radiation X-ray topography of surface strain in large-diameter silicon wafers
|
Kawado, S.
|
|
2002
|
9 |
3 |
p. 166-168
|
artikel
|
| 17 |
Synchrotron X-ray topography of electronic materials
|
Tuomi, T.
|
|
2002
|
9 |
3 |
p. 174-178
|
artikel
|
| 18 |
X-ray refraction-enhanced imaging and a method for phase retrieval for a simple object
|
Suzuki, Yoshio
|
|
2002
|
9 |
3 |
p. 160-165
|
artikel
|
| 19 |
Zernike-type phase-contrast hard X-ray microscope with a zone plate at the Photon Factory
|
Yokosuka, Hiroki
|
|
2002
|
9 |
3 |
p. 179-181
|
artikel
|
| 20 |
Zernike-type X-ray imaging microscopy at 25 keV with Fresnel zone plate optics
|
Awaji, M.
|
|
2002
|
9 |
3 |
p. 125-127
|
artikel
|
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