nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A non-uniform reference model for maximum-entropy density reconstructions from diffraction data
|
Zheludev, A. |
|
1995 |
51 |
4 |
p. 450-455 |
artikel |
2 |
A study of the structure factors in rutile-type SnO2 by high-energy electron diffraction. Erratum
|
Matsuhata, H. |
|
1995 |
51 |
4 |
p. 589 |
artikel |
3 |
Bloch-wave degeneracies and nonsystematic critical voltage: a method for structure-factor determination. Erratum
|
Matsuhata, H. |
|
1995 |
51 |
4 |
p. 589 |
artikel |
4 |
Cation ordering waves in trirutiles. When X-ray crystallography fails?
|
Hansen, S. |
|
1995 |
51 |
4 |
p. 514-519 |
artikel |
5 |
Contrast of HOLZ lines in energy-filtered convergent-beam electron diffraction patterns from silicon
|
Lempfuhl, G. |
|
1995 |
51 |
4 |
p. 504-514 |
artikel |
6 |
Defective vertices in perfect icosahedral quasicrystals
|
Baake, M. |
|
1995 |
51 |
4 |
p. 587-588 |
artikel |
7 |
Dynamical theories of dark-field imaging using diffusely scattered electrons in STEM and TEM
|
Wang, Z. L. |
|
1995 |
51 |
4 |
p. 569-585 |
artikel |
8 |
Efficient methods for the linearization and solution of phase-invariant equations
|
Langs, D. A. |
|
1995 |
51 |
4 |
p. 542-547 |
artikel |
9 |
Estimation of the one-phase structure seminvariants in the single isomorphous replacement case: an application of Hauptman's distribution
|
Hu, N.-H. |
|
1995 |
51 |
4 |
p. 520-524 |
artikel |
10 |
Hexamethylenetetramine: extinction and thermal vibrations from neutron diffraction at six temperatures
|
Kampermann, S. P. |
|
1995 |
51 |
4 |
p. 489-497 |
artikel |
11 |
International Tables for Crystallography. Volume A. Corrigenda and Addenda to the Third, Revised Edition
|
|
|
1995 |
51 |
4 |
p. 592-595 |
artikel |
12 |
Lattice complexes with at most one comprehensive complex
|
Fischer, W. |
|
1995 |
51 |
4 |
p. 586-587 |
artikel |
13 |
Magnetic completely transposable twin laws and tensor distinction
|
Litvin, D. B. |
|
1995 |
51 |
4 |
p. 524-529 |
artikel |
14 |
Mathematical techniques in crystallography and materials science by E. Prince
|
Gałdecka, E. |
|
1995 |
51 |
4 |
p. 590 |
artikel |
15 |
Microdiffraction and CBED crystal structure determination of the Si-rich phase in laser-clad Ni alloy FP-5
|
Liu, Y. |
|
1995 |
51 |
4 |
p. 481-489 |
artikel |
16 |
On the fast translation functions for molecular replacement
|
Navaza, J. |
|
1995 |
51 |
4 |
p. 445-449 |
artikel |
17 |
On the use of crenel functions for occupationally modulated structures
|
Petříček, V. |
|
1995 |
51 |
4 |
p. 529-535 |
artikel |
18 |
Resonant anomalous X-ray scattering - theory and applications edited by G. Matelik, C. J. Sparks and K. Fischer
|
Kvick, Å. |
|
1995 |
51 |
4 |
p. 590-591 |
artikel |
19 |
Right and left in chiral crystals
|
Dunitz, J. D. |
|
1995 |
51 |
4 |
p. 588 |
artikel |
20 |
Sixteenth International Congress of Crystallography, 21-29 August 1993, Beijing, China
|
|
|
1995 |
51 |
4 |
p. 596-648 |
artikel |
21 |
Statisical descriptions in crystallography. II. Report of a Working Group on Expression of Uncertainty in Measurement
|
Schwarzenbach, D. |
|
1995 |
51 |
4 |
p. 565-569 |
artikel |
22 |
Structural classes and space groups of organic homomolecular crystals: new statistical data
|
Belsky, V. K. |
|
1995 |
51 |
4 |
p. 473-481 |
artikel |
23 |
TDSIR phasing: direct use of phase-invariant distributions in macromolecular crystallography
|
Langs, D. A. |
|
1995 |
51 |
4 |
p. 535-542 |
artikel |
24 |
The diffraction of X-rays by close-packed polytypic crystals containing single stacking faults. III. Measurements of diffraction effects caused by stacking faults in plate or film form samples
|
Michalski, E. |
|
1995 |
51 |
4 |
p. 548-558 |
artikel |
25 |
The Lorentz factor for the Laue technique
|
Lange, J. |
|
1995 |
51 |
4 |
p. 559-565 |
artikel |
26 |
The symmetry of interatomic lattice potentials in general crystal structures. 1. Basic theory
|
Bugaev, V. N. |
|
1995 |
51 |
4 |
p. 456-462 |
artikel |
27 |
The symmetry of interatomic lattice potentials in general crystal structures. 2. The cases of f.c.c., b.c.c. and h.c.p. disordered structures
|
Bugaev, V. N. |
|
1995 |
51 |
4 |
p. 463-473 |
artikel |
28 |
X-ray determination of the dislocation densities in semiconductor crystals using a Bartels five-crystal diffractometer
|
Healey, P. D. |
|
1995 |
51 |
4 |
p. 498-503 |
artikel |