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                             34 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Ab initio structure determination of sulfathiazole polymorph V from synchrotron X-ray powder diffraction data Chan, Fung Choy
1999
32 3 p. 436-441
artikel
2 Adaptation of the Rietveld method to the characterization of the lamellar microstructure of polymers. 2. Influence of a tilt of chain axes versus the normal to basal planes of crystalline lamellae Dupont, O.
1999
32 3 p. 497-504
artikel
3 A hinge goniometer head Katrusiak, Andrzej
1999
32 3 p. 576-578
artikel
4 A method to stabilize reduced and/or gas-treated protein crystals by flash-cooling under a controlled atmosphere Vernède, Xavier
1999
32 3 p. 505-509
artikel
5 An elastically bent silicon monochromator for a neutron diffractometer Tanaka, Ichiro
1999
32 3 p. 525-529
artikel
6 An improved low-power-consumption heating stage for X-ray powder diffraction Valdrè, Giovanni
1999
32 3 p. 543-545
artikel
7 An improved small-angle X-ray scattering analysis of δ′ precipitation in an Al–Li alloy for growth kinetic studies Tsao, Cheng-Si
1999
32 3 p. 426-435
artikel
8 Application of silver behenate powder for wavelength calibration of a SANS instrument – a comprehensive study of experimental setup variations and data processing techniques Keiderling, U.
1999
32 3 p. 456-463
artikel
9 Application of the molecular replacement method to a heavy-atom problem Arnez, John G.
1999
32 3 p. 472-474
artikel
10 A real-space approach to the solution of a disordered structure of the three-dimensional coordination polymer Fe(CN)6[Sn(C4H9)3]3 Wang, Xin
1999
32 3 p. 409-412
artikel
11 A standardless method of quantitative ceramic analysis using X-ray powder diffraction Mazumdar, Sujata
1999
32 3 p. 381-386
artikel
12 Contrast in X-ray section topographs of perfect silicon crystals using the Laue–Laue three-beam case of diffraction Heyroth, F.
1999
32 3 p. 489-496
artikel
13 CPRL: a program to plot the cylindrically projected reciprocal lattice for fiber diffraction patterns Finkenstadt, V. L.
1999
32 3 p. 551-553
artikel
14 Determination of symmetries and idealized cell parameters for simulated structures Hundt, R.
1999
32 3 p. 413-416
artikel
15 Diffractometric crystal centering Dera, Przemyslaw
1999
32 3 p. 510-515
artikel
16 Diffuse scattering and Monte Carlo simulations of cyclohexane–perhydrotriphenylene (PHTP) inclusion compounds, C6H12/C18H30 Mayo, S. C.
1999
32 3 p. 464-471
artikel
17 Exploring reciprocal space of a quasicrystal by means of an imaging plate Kopecky, Milos
1999
32 3 p. 442-451
artikel
18 Extension of three-dimensional space-group generators to the (3+1) case Stróż, Kazimierz
1999
32 3 p. 452-455
artikel
19 Isomorphism and mixed crystals in 2-R-naphthalenes: evidence of structural subfamilies and prediction of metastable forms Haget, Y.
1999
32 3 p. 481-488
artikel
20 K2(NbO)2Si4O12: a new ferroelectric Foster, M. C.
1999
32 3 p. 421-425
artikel
21 LSCALE – the new normalization, scaling and absorption correction program in the Daresbury Laue software suite Arzt, Steffi
1999
32 3 p. 554-562
artikel
22 Modeling hydroxyl and water H atoms Nardelli, Mario
1999
32 3 p. 563-571
artikel
23 Nanoscopic unequivocal analysis of twinned crystal structures with tetragonal or orthogonal unit cells by electron microdiffraction Leicht, M.
1999
32 3 p. 397-403
artikel
24 Natural partitioning of orientation elements and determination of the ODF from individual orientations according to the maximum-entropy principle Wang, Y. D.
1999
32 3 p. 404-408
artikel
25 PDFFIT, a program for full profile structural refinement of the atomic pair distribution function Proffen, Th.
1999
32 3 p. 572-575
artikel
26 Positioning a protein molecule in the asymmetric unit using very low order reflections and packing restraints Andersson, Klas M.
1999
32 3 p. 530-535
artikel
27 Size distribution of single-crystal nanoparticles by Monte Carlo fitting of wide-angle X-ray scattering peak shape Di Nunzio, P. E.
1999
32 3 p. 546-548
artikel
28 Stabilization of cubic Na-modified ZrO2: a neutron diffraction study Canton, P.
1999
32 3 p. 475-480
artikel
29 Superscrew dislocation contrast on synchrotron white-beam topographs: an accurate description of the direct dislocation image Huang, X. R.
1999
32 3 p. 516-524
artikel
30 Texture and residual-stress analysis using a kappa goniometer Guillén, R.
1999
32 3 p. 393-396
artikel
31 The structure of approximant μ-Al4Mn interpreted as a modulated crystal Uchida, Masaya
1999
32 3 p. 417-420
artikel
32 X-ray diffraction in disordered paraelectric crystal structures with polar clusters and the g parameter Łukaszewicz, K.
1999
32 3 p. 549-550
artikel
33 X-ray diffraction texture analysis of cylindrical samples Cossu, C.
1999
32 3 p. 387-392
artikel
34 Zeolite structure determination from powder diffraction data: applications of the FOCUS method Baerlocher, Ch.
1999
32 3 p. 536-542
artikel
                             34 gevonden resultaten
 
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