nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Ab initio solution of misfit layer structures by automatic Patterson and direct methods
|
Beurskens, P. T. |
|
1994 |
27 |
3 |
p. 411-417 |
artikel |
2 |
Ab initio structure determination of Zr(OH)2SO4.3H2O using the conventional monochromatic X-ray powder diffraction
|
Gascoigne, D. |
|
1994 |
27 |
3 |
p. 399-405 |
artikel |
3 |
Apparatus function of a five-crystal X-ray diffractometer with a four-reflection monochromator
|
Möller, M. O. |
|
1994 |
27 |
3 |
p. 369-378 |
artikel |
4 |
Applicabilities of the Warren–Averbach analysis and an alternative analysis for separation of size and strain broadening
|
van Berkum, J. G. M. |
|
1994 |
27 |
3 |
p. 345-357 |
artikel |
5 |
ASIR: an automatic procedure for determining solvent structure in protein crystallography
|
Tong, H. |
|
1994 |
27 |
3 |
p. 421-426 |
artikel |
6 |
A study of high-resolution X-ray scattering data evaluation by the maximum-entropy method
|
Müller, J. J. |
|
1994 |
27 |
3 |
p. 257-270 |
artikel |
7 |
Background correction of the SAXS intensities scattered by aged metallic glass
|
Meng, C. |
|
1994 |
27 |
3 |
p. 419-421 |
artikel |
8 |
Coated silicas and small-angle X-ray intensity behaviour
|
Benedetti, A. |
|
1994 |
27 |
3 |
p. 249-256 |
artikel |
9 |
Collection and analysis of powder diffraction data with near-constant counting statistics
|
Madsen, I. C. |
|
1994 |
27 |
3 |
p. 385-392 |
artikel |
10 |
Crystallographers
|
|
|
1994 |
27 |
3 |
p. 439 |
artikel |
11 |
Diffuse neutron scattering from an in situ grown α-AgI single crystal
|
Keen, D. A. |
|
1994 |
27 |
3 |
p. 393-398 |
artikel |
12 |
EDIM93: a program for electron diffraction intensity measurement from photographic data
|
Cheng, T. Z. |
|
1994 |
27 |
3 |
p. 430-432 |
artikel |
13 |
Energy-dispersive phase plate for magnetic circular dichroism experiments in the X-ray range
|
Giles, C. |
|
1994 |
27 |
3 |
p. 232-240 |
artikel |
14 |
Evalution of volume fractions of fiber-type texture components
|
Zuo, L. |
|
1994 |
27 |
3 |
p. 358-361 |
artikel |
15 |
Geometrical aspects of real-time powder diffraction using a normal generator and a linear diode-array detector
|
van Malssen, K. |
|
1994 |
27 |
3 |
p. 302-315 |
artikel |
16 |
Geometrical optimization of neutron small-angle scattering instruments
|
May, R. P. |
|
1994 |
27 |
3 |
p. 298-301 |
artikel |
17 |
Interpretation of diffuse X-ray scattering via models of disorder
|
Welberry, T. R. |
|
1994 |
27 |
3 |
p. 205-231 |
artikel |
18 |
Investigation on helium bubbles in FeNiCr by small-angle neutron scattering: Guinier analysis using a size-dependent contrast factor
|
Carsughi, F. |
|
1994 |
27 |
3 |
p. 326-329 |
artikel |
19 |
Mapping of two-dimensional lattice distortions in silicon crystals at submicrometer resolution from X-ray rocking-curve data
|
Nikulin, A. Yu. |
|
1994 |
27 |
3 |
p. 338-344 |
artikel |
20 |
Neutron diffraction investigations of thermal atomic displacements in Ta and Ag
|
Bashir, J. |
|
1994 |
27 |
3 |
p. 418-419 |
artikel |
21 |
New Commercial Products
|
|
|
1994 |
27 |
3 |
p. 440 |
artikel |
22 |
Notes and News
|
|
|
1994 |
27 |
3 |
p. 439-440 |
artikel |
23 |
Optimum intensity in small-angle neutron scattering. An experimental comparison between symmetric and asymmetric geometries
|
Falcão, A. N. |
|
1994 |
27 |
3 |
p. 330-337 |
artikel |
24 |
ORTEP92 – an improved PC version
|
Vicković, I. |
|
1994 |
27 |
3 |
p. 437 |
artikel |
25 |
ORTEX2.1 – a 1677-atom version of ORTEP with automatic cell outline and cell packing for use on a PC
|
McArdle, P. |
|
1994 |
27 |
3 |
p. 438-439 |
artikel |
26 |
Phase transitions in the Pb5(Cr1−xAlx)F19 system
|
Ravez, J. |
|
1994 |
27 |
3 |
p. 362-368 |
artikel |
27 |
P-RISCON: a real-space scavenger for crystal structure determination from powder diffraction data
|
Masciocchi, N. |
|
1994 |
27 |
3 |
p. 426-429 |
artikel |
28 |
Propagating errors in small-angle scattering data treatment
|
Svergun, D. I. |
|
1994 |
27 |
3 |
p. 241-248 |
artikel |
29 |
PROSZKI – a system of programs for powder diffraction data analysis
|
Łasocha, W. |
|
1994 |
27 |
3 |
p. 437-438 |
artikel |
30 |
Simulation of electron diffraction patterns of alloys with oriented precipitates
|
Akbay, T. |
|
1994 |
27 |
3 |
p. 379-384 |
artikel |
31 |
SIR92 – a program for automatic solution of crystal structures by direct methods
|
Altomare, A. |
|
1994 |
27 |
3 |
p. 435 |
artikel |
32 |
SIRPOW.92 – a program for automatic solution of crystal structures by direct methods optimized for powder data
|
Altomare, A. |
|
1994 |
27 |
3 |
p. 435-436 |
artikel |
33 |
SUPERIMPOSE – a program for the unambiguous structural superposition of spatially related molecules, including macromolecules
|
Diederichs, K. |
|
1994 |
27 |
3 |
p. 436-437 |
artikel |
34 |
The neutron transmission through a cylindrical guide tube
|
Mildner, D. F. R. |
|
1994 |
27 |
3 |
p. 316-325 |
artikel |
35 |
The Rietveld method. (IUCr Monograph on Crystallography, No. 5) edited by R. A. Young
|
Cox, D. E. |
|
1994 |
27 |
3 |
p. 440-441 |
artikel |
36 |
The structure of pumice by neutron diffraction
|
Floriano, M. A. |
|
1994 |
27 |
3 |
p. 271-277 |
artikel |
37 |
The study of defects and growth in organic crystals of thallium hydrogen phthalate (TAP)
|
Zhao, Q. L. |
|
1994 |
27 |
3 |
p. 283-287 |
artikel |
38 |
The use of the serial-correlations concept in the figure-of-merit function for powder diffraction profile fitting
|
Andreev, Yu. G. |
|
1994 |
27 |
3 |
p. 288-297 |
artikel |
39 |
X-ray Berg–Barrett topography of the deformation substructure of stabilized zirconium oxide single crystals deformed at 1673 K
|
Guiberteau, F. |
|
1994 |
27 |
3 |
p. 406-410 |
artikel |
40 |
X-ray diffraction at elevated temperatures: a method for in situ processing analysis by D. D. L. Chung, P. W. DeHaven, H. Arnold and D. Ghosh
|
Finger, L. W. |
|
1994 |
27 |
3 |
p. 441-442 |
artikel |
41 |
X-ray texture analysis of thin films by the reflection method: intermediate regime in defocusing corrections
|
Chateigner, D. |
|
1994 |
27 |
3 |
p. 278-282 |
artikel |
42 |
XRDA: a program for energy-dispersive X-ray diffraction analysis on a PC
|
Desgreniers, S. |
|
1994 |
27 |
3 |
p. 432-434 |
artikel |