| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
Ab initio solution of misfit layer structures by automatic Patterson and direct methods
|
Beurskens, P. T.
|
|
1994
|
27 |
3 |
p. 411-417
|
article
|
| 2 |
Ab initio structure determination of Zr(OH)2SO4.3H2O using the conventional monochromatic X-ray powder diffraction
|
Gascoigne, D.
|
|
1994
|
27 |
3 |
p. 399-405
|
article
|
| 3 |
Apparatus function of a five-crystal X-ray diffractometer with a four-reflection monochromator
|
Möller, M. O.
|
|
1994
|
27 |
3 |
p. 369-378
|
article
|
| 4 |
Applicabilities of the Warren–Averbach analysis and an alternative analysis for separation of size and strain broadening
|
van Berkum, J. G. M.
|
|
1994
|
27 |
3 |
p. 345-357
|
article
|
| 5 |
ASIR: an automatic procedure for determining solvent structure in protein crystallography
|
Tong, H.
|
|
1994
|
27 |
3 |
p. 421-426
|
article
|
| 6 |
A study of high-resolution X-ray scattering data evaluation by the maximum-entropy method
|
Müller, J. J.
|
|
1994
|
27 |
3 |
p. 257-270
|
article
|
| 7 |
Background correction of the SAXS intensities scattered by aged metallic glass
|
Meng, C.
|
|
1994
|
27 |
3 |
p. 419-421
|
article
|
| 8 |
Coated silicas and small-angle X-ray intensity behaviour
|
Benedetti, A.
|
|
1994
|
27 |
3 |
p. 249-256
|
article
|
| 9 |
Collection and analysis of powder diffraction data with near-constant counting statistics
|
Madsen, I. C.
|
|
1994
|
27 |
3 |
p. 385-392
|
article
|
| 10 |
Crystallographers
|
|
|
1994
|
27 |
3 |
p. 439
|
article
|
| 11 |
Diffuse neutron scattering from an in situ grown α-AgI single crystal
|
Keen, D. A.
|
|
1994
|
27 |
3 |
p. 393-398
|
article
|
| 12 |
EDIM93: a program for electron diffraction intensity measurement from photographic data
|
Cheng, T. Z.
|
|
1994
|
27 |
3 |
p. 430-432
|
article
|
| 13 |
Energy-dispersive phase plate for magnetic circular dichroism experiments in the X-ray range
|
Giles, C.
|
|
1994
|
27 |
3 |
p. 232-240
|
article
|
| 14 |
Evalution of volume fractions of fiber-type texture components
|
Zuo, L.
|
|
1994
|
27 |
3 |
p. 358-361
|
article
|
| 15 |
Geometrical aspects of real-time powder diffraction using a normal generator and a linear diode-array detector
|
van Malssen, K.
|
|
1994
|
27 |
3 |
p. 302-315
|
article
|
| 16 |
Geometrical optimization of neutron small-angle scattering instruments
|
May, R. P.
|
|
1994
|
27 |
3 |
p. 298-301
|
article
|
| 17 |
Interpretation of diffuse X-ray scattering via models of disorder
|
Welberry, T. R.
|
|
1994
|
27 |
3 |
p. 205-231
|
article
|
| 18 |
Investigation on helium bubbles in FeNiCr by small-angle neutron scattering: Guinier analysis using a size-dependent contrast factor
|
Carsughi, F.
|
|
1994
|
27 |
3 |
p. 326-329
|
article
|
| 19 |
Mapping of two-dimensional lattice distortions in silicon crystals at submicrometer resolution from X-ray rocking-curve data
|
Nikulin, A. Yu.
|
|
1994
|
27 |
3 |
p. 338-344
|
article
|
| 20 |
Neutron diffraction investigations of thermal atomic displacements in Ta and Ag
|
Bashir, J.
|
|
1994
|
27 |
3 |
p. 418-419
|
article
|
| 21 |
New Commercial Products
|
|
|
1994
|
27 |
3 |
p. 440
|
article
|
| 22 |
Notes and News
|
|
|
1994
|
27 |
3 |
p. 439-440
|
article
|
| 23 |
Optimum intensity in small-angle neutron scattering. An experimental comparison between symmetric and asymmetric geometries
|
Falcão, A. N.
|
|
1994
|
27 |
3 |
p. 330-337
|
article
|
| 24 |
ORTEP92 – an improved PC version
|
Vicković, I.
|
|
1994
|
27 |
3 |
p. 437
|
article
|
| 25 |
ORTEX2.1 – a 1677-atom version of ORTEP with automatic cell outline and cell packing for use on a PC
|
McArdle, P.
|
|
1994
|
27 |
3 |
p. 438-439
|
article
|
| 26 |
Phase transitions in the Pb5(Cr1−xAlx)F19 system
|
Ravez, J.
|
|
1994
|
27 |
3 |
p. 362-368
|
article
|
| 27 |
P-RISCON: a real-space scavenger for crystal structure determination from powder diffraction data
|
Masciocchi, N.
|
|
1994
|
27 |
3 |
p. 426-429
|
article
|
| 28 |
Propagating errors in small-angle scattering data treatment
|
Svergun, D. I.
|
|
1994
|
27 |
3 |
p. 241-248
|
article
|
| 29 |
PROSZKI – a system of programs for powder diffraction data analysis
|
Łasocha, W.
|
|
1994
|
27 |
3 |
p. 437-438
|
article
|
| 30 |
Simulation of electron diffraction patterns of alloys with oriented precipitates
|
Akbay, T.
|
|
1994
|
27 |
3 |
p. 379-384
|
article
|
| 31 |
SIR92 – a program for automatic solution of crystal structures by direct methods
|
Altomare, A.
|
|
1994
|
27 |
3 |
p. 435
|
article
|
| 32 |
SIRPOW.92 – a program for automatic solution of crystal structures by direct methods optimized for powder data
|
Altomare, A.
|
|
1994
|
27 |
3 |
p. 435-436
|
article
|
| 33 |
SUPERIMPOSE – a program for the unambiguous structural superposition of spatially related molecules, including macromolecules
|
Diederichs, K.
|
|
1994
|
27 |
3 |
p. 436-437
|
article
|
| 34 |
The neutron transmission through a cylindrical guide tube
|
Mildner, D. F. R.
|
|
1994
|
27 |
3 |
p. 316-325
|
article
|
| 35 |
The Rietveld method. (IUCr Monograph on Crystallography, No. 5) edited by R. A. Young
|
Cox, D. E.
|
|
1994
|
27 |
3 |
p. 440-441
|
article
|
| 36 |
The structure of pumice by neutron diffraction
|
Floriano, M. A.
|
|
1994
|
27 |
3 |
p. 271-277
|
article
|
| 37 |
The study of defects and growth in organic crystals of thallium hydrogen phthalate (TAP)
|
Zhao, Q. L.
|
|
1994
|
27 |
3 |
p. 283-287
|
article
|
| 38 |
The use of the serial-correlations concept in the figure-of-merit function for powder diffraction profile fitting
|
Andreev, Yu. G.
|
|
1994
|
27 |
3 |
p. 288-297
|
article
|
| 39 |
X-ray Berg–Barrett topography of the deformation substructure of stabilized zirconium oxide single crystals deformed at 1673 K
|
Guiberteau, F.
|
|
1994
|
27 |
3 |
p. 406-410
|
article
|
| 40 |
X-ray diffraction at elevated temperatures: a method for in situ processing analysis by D. D. L. Chung, P. W. DeHaven, H. Arnold and D. Ghosh
|
Finger, L. W.
|
|
1994
|
27 |
3 |
p. 441-442
|
article
|
| 41 |
X-ray texture analysis of thin films by the reflection method: intermediate regime in defocusing corrections
|
Chateigner, D.
|
|
1994
|
27 |
3 |
p. 278-282
|
article
|
| 42 |
XRDA: a program for energy-dispersive X-ray diffraction analysis on a PC
|
Desgreniers, S.
|
|
1994
|
27 |
3 |
p. 432-434
|
article
|
Journal description