| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A direct method of beam-height correction in small-angle X-ray scattering
|
Singh, M. A.
|
|
1993
|
26 |
6 |
p. 787-794
|
artikel
|
| 2 |
A fast and portable microspectrophotometer for protein crystallography
|
Hadfield, A.
|
|
1993
|
26 |
6 |
p. 839-842
|
artikel
|
| 3 |
An improved deviation parameter for the simulation of dynamical X-ray diffraction on epitaxic heterostructures
|
Zaus, R.
|
|
1993
|
26 |
6 |
p. 801-811
|
artikel
|
| 4 |
Automatic processing of rotation diffraction data from crystals of initially unknown symmetry and cell constants
|
Kabsch, W.
|
|
1993
|
26 |
6 |
p. 795-800
|
artikel
|
| 5 |
Characterization of an image-plate detector used for quantitative small-angle-scattering studies
|
Né, F.
|
|
1993
|
26 |
6 |
p. 763-773
|
artikel
|
| 6 |
Crystallographers
|
|
|
1993
|
26 |
6 |
p. 846
|
artikel
|
| 7 |
Education and Teaching in Crystallography. Call for papers
|
|
|
1993
|
26 |
6 |
p. 846
|
artikel
|
| 8 |
Electron diffraction from phospholipids – an approximate correction for dynamical scattering and tests for a correct phase determination
|
Dorset, D. L.
|
|
1993
|
26 |
6 |
p. 778-786
|
artikel
|
| 9 |
Evaluation of 3D small-angle scattering from non-spherical particles in single crystals
|
Fratzl, P.
|
|
1993
|
26 |
6 |
p. 820-826
|
artikel
|
| 10 |
Improved calibtration curve for the Sm2+:BaFCl pressure sensor
|
Comodi, P.
|
|
1993
|
26 |
6 |
p. 843-845
|
artikel
|
| 11 |
Intensity enhancement in asymmetric diffraction with parallel-beam synchrotron radiation
|
Toraya, H.
|
|
1993
|
26 |
6 |
p. 774-777
|
artikel
|
| 12 |
Interpretation of the diffuse scattering close to Bragg peaks by X-ray topography
|
Fewster, P. F.
|
|
1993
|
26 |
6 |
p. 812-819
|
artikel
|
| 13 |
New Commercial Products
|
|
|
1993
|
26 |
6 |
p. 847-848
|
artikel
|
| 14 |
Prices of Acta Crystallographica and Journal of Applied Crystallography
|
|
|
1993
|
26 |
6 |
p. 846-847
|
artikel
|
| 15 |
Remeasurement of the profile of the characteristic Cu Kα emission line with high precision and accuracy. Erratum
|
Härtwig, J.
|
|
1993
|
26 |
6 |
p. 845
|
artikel
|
| 16 |
Structure-refinement program for disordered carbons
|
Shi, H.
|
|
1993
|
26 |
6 |
p. 827-836
|
artikel
|
| 17 |
The half-widths of Bragg intensity profiles measured with a triple-crystal diffractometer at a synchrotron-radiation source. I. Derivation of a simple expression for the full width at half-maximum
|
Rossmanith, E.
|
|
1993
|
26 |
6 |
p. 753-755
|
artikel
|
| 18 |
The half-widths of Bragg intensity profiles measured with a triple-crystal diffractometer at a synchrotron-radiation source. II. The half-widths of YIG and Si single crystals
|
Rossmanith, E.
|
|
1993
|
26 |
6 |
p. 756-762
|
artikel
|
| 19 |
The importance of, and a method for, optimizing the calculation of rotation functions
|
Wilson, C. C.
|
|
1993
|
26 |
6 |
p. 837-839
|
artikel
|
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