nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A data-acquisition system for area detectors
|
Schoenborn, B. P. |
|
1993 |
26 |
1 |
p. 9-14 |
artikel |
2 |
A 109 high-pressure cell for X-ray and optical measurements
|
Leszczynski, M. |
|
1993 |
26 |
1 |
p. 1-4 |
artikel |
3 |
A new neutron diffractometer with multiple detectors combining the advantages of time-of-flight and double-axis diffractometers
|
Turba, W. |
|
1993 |
26 |
1 |
p. 61-67 |
artikel |
4 |
Computer processing and analysis of X-ray fibre diffraction data
|
Lorenz, M. |
|
1993 |
26 |
1 |
p. 82-91 |
artikel |
5 |
Cryostat for synchrotron powder diffraction with sample rotation and controlled gas atmosphere in the sample chamber
|
Ihringer, J. |
|
1993 |
26 |
1 |
p. 135-137 |
artikel |
6 |
Crystallographers
|
|
|
1993 |
26 |
1 |
p. 144 |
artikel |
7 |
DIFK91: a program for the modelling of powder diffraction patterns on a PC
|
Smrčok, Ľ. |
|
1993 |
26 |
1 |
p. 140-141 |
artikel |
8 |
Effect of variation in PbI2 doping on the polytypism of dendritic CdI2 single crystals
|
Kumar, B. |
|
1993 |
26 |
1 |
p. 41-46 |
artikel |
9 |
Grazing-incidence X-ray diffraction on ion-implanted silicon
|
Rugel, S. |
|
1993 |
26 |
1 |
p. 34-40 |
artikel |
10 |
Hazards of oblique coordinate systems: a reminder
|
Muir, K. W. |
|
1993 |
26 |
1 |
p. 142-143 |
artikel |
11 |
High-temperature X-ray diffraction: solutions to uncertainties in temperature and sample position
|
Brown, N. E. |
|
1993 |
26 |
1 |
p. 77-81 |
artikel |
12 |
Journal of Applied Crystallography. Notes for Authors
|
|
|
1993 |
26 |
1 |
p. 146-150 |
artikel |
13 |
Microabsorption of scattered X-rays and its dependence on incidence angle in the nonsymmetric reflection case
|
Pitschke, W. |
|
1993 |
26 |
1 |
p. 132-134 |
artikel |
14 |
Modeling of line-shape asymmetry in powder diffraction
|
Bérar, J.-F. |
|
1993 |
26 |
1 |
p. 128-129 |
artikel |
15 |
New Commercial Products
|
|
|
1993 |
26 |
1 |
p. 144-145 |
artikel |
16 |
One-dimensional contrast modulations in [001] high-resolution reverse images of Bi2Sr2(Ca1−xNdx)Cu2O8+δ ceramics
|
Onozuka, T. |
|
1993 |
26 |
1 |
p. 104-111 |
artikel |
17 |
On the least-squares determination of lattice dimensions: a modified singular value decomposition approach to ill-conditioned cases
|
Anselmi-Tamburini, U. |
|
1993 |
26 |
1 |
p. 5-8 |
artikel |
18 |
Patterson-map interpretation with noncrystallographic symmetry
|
Tong, L. |
|
1993 |
26 |
1 |
p. 15-21 |
artikel |
19 |
POLISH: computer program for improving the accuracy of structure-factor magnitudes obtained from powder data
|
Byrom, P. G. |
|
1993 |
26 |
1 |
p. 137-139 |
artikel |
20 |
Preparation of protein crystallization buffers with a computer-controlled motorized pipette: PIPEX
|
Eiselé, J.-L. |
|
1993 |
26 |
1 |
p. 92-96 |
artikel |
21 |
Protein symmetry: metric and crystal (a precautionary note)
|
Mighell, A. D. |
|
1993 |
26 |
1 |
p. 68-70 |
artikel |
22 |
Quality control of protein models: directional atomic contact analysis
|
Vriend, G. |
|
1993 |
26 |
1 |
p. 47-60 |
artikel |
23 |
Stuctural and chemical analysis of materials. X-ray, electron, and neutron diffraction; X-ray, electron, and ion spectrometry; electron microscopy by J. P. Eberhart
|
Thomas, N. W. |
|
1993 |
26 |
1 |
p. 145-146 |
artikel |
24 |
Study of Brazil twin boundaries in synthetic quartz by means of simulations of X-ray topographs
|
González-Mañas, M. |
|
1993 |
26 |
1 |
p. 122-127 |
artikel |
25 |
The use of pattern decomposition to study the combined X-ray diffraction effects of crystallite size and stacking faults in ex-oxalate zinc oxide
|
Langford, J. I. |
|
1993 |
26 |
1 |
p. 22-33 |
artikel |
26 |
The use of soft X-rays of very long wavelengths for small-angle scattering at the Aladdin storage ring
|
Tse, J. S. |
|
1993 |
26 |
1 |
p. 130-132 |
artikel |
27 |
Towards statistics of crystal orientations in quantitative texture anaylsis
|
Schaeben, H. |
|
1993 |
26 |
1 |
p. 112-121 |
artikel |
28 |
Twinning of LaGaO3 single crystals
|
Bdikin, I. K. |
|
1993 |
26 |
1 |
p. 71-76 |
artikel |
29 |
Voigt-function modeling in Fourier analysis of size- and strain-broadened X-ray diffraction peaks
|
Balzar, D. |
|
1993 |
26 |
1 |
p. 97-103 |
artikel |
30 |
XTALLAB and POWDER – computer assisted instruction in elementary crystallographic methods
|
Day, C. L. |
|
1993 |
26 |
1 |
p. 144 |
artikel |