| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
A data-acquisition system for area detectors
|
Schoenborn, B. P.
|
|
1993
|
26 |
1 |
p. 9-14
|
article
|
| 2 |
A 109 high-pressure cell for X-ray and optical measurements
|
Leszczynski, M.
|
|
1993
|
26 |
1 |
p. 1-4
|
article
|
| 3 |
A new neutron diffractometer with multiple detectors combining the advantages of time-of-flight and double-axis diffractometers
|
Turba, W.
|
|
1993
|
26 |
1 |
p. 61-67
|
article
|
| 4 |
Computer processing and analysis of X-ray fibre diffraction data
|
Lorenz, M.
|
|
1993
|
26 |
1 |
p. 82-91
|
article
|
| 5 |
Cryostat for synchrotron powder diffraction with sample rotation and controlled gas atmosphere in the sample chamber
|
Ihringer, J.
|
|
1993
|
26 |
1 |
p. 135-137
|
article
|
| 6 |
Crystallographers
|
|
|
1993
|
26 |
1 |
p. 144
|
article
|
| 7 |
DIFK91: a program for the modelling of powder diffraction patterns on a PC
|
Smrčok, Ľ.
|
|
1993
|
26 |
1 |
p. 140-141
|
article
|
| 8 |
Effect of variation in PbI2 doping on the polytypism of dendritic CdI2 single crystals
|
Kumar, B.
|
|
1993
|
26 |
1 |
p. 41-46
|
article
|
| 9 |
Grazing-incidence X-ray diffraction on ion-implanted silicon
|
Rugel, S.
|
|
1993
|
26 |
1 |
p. 34-40
|
article
|
| 10 |
Hazards of oblique coordinate systems: a reminder
|
Muir, K. W.
|
|
1993
|
26 |
1 |
p. 142-143
|
article
|
| 11 |
High-temperature X-ray diffraction: solutions to uncertainties in temperature and sample position
|
Brown, N. E.
|
|
1993
|
26 |
1 |
p. 77-81
|
article
|
| 12 |
Journal of Applied Crystallography. Notes for Authors
|
|
|
1993
|
26 |
1 |
p. 146-150
|
article
|
| 13 |
Microabsorption of scattered X-rays and its dependence on incidence angle in the nonsymmetric reflection case
|
Pitschke, W.
|
|
1993
|
26 |
1 |
p. 132-134
|
article
|
| 14 |
Modeling of line-shape asymmetry in powder diffraction
|
Bérar, J.-F.
|
|
1993
|
26 |
1 |
p. 128-129
|
article
|
| 15 |
New Commercial Products
|
|
|
1993
|
26 |
1 |
p. 144-145
|
article
|
| 16 |
One-dimensional contrast modulations in [001] high-resolution reverse images of Bi2Sr2(Ca1−xNdx)Cu2O8+δ ceramics
|
Onozuka, T.
|
|
1993
|
26 |
1 |
p. 104-111
|
article
|
| 17 |
On the least-squares determination of lattice dimensions: a modified singular value decomposition approach to ill-conditioned cases
|
Anselmi-Tamburini, U.
|
|
1993
|
26 |
1 |
p. 5-8
|
article
|
| 18 |
Patterson-map interpretation with noncrystallographic symmetry
|
Tong, L.
|
|
1993
|
26 |
1 |
p. 15-21
|
article
|
| 19 |
POLISH: computer program for improving the accuracy of structure-factor magnitudes obtained from powder data
|
Byrom, P. G.
|
|
1993
|
26 |
1 |
p. 137-139
|
article
|
| 20 |
Preparation of protein crystallization buffers with a computer-controlled motorized pipette: PIPEX
|
Eiselé, J.-L.
|
|
1993
|
26 |
1 |
p. 92-96
|
article
|
| 21 |
Protein symmetry: metric and crystal (a precautionary note)
|
Mighell, A. D.
|
|
1993
|
26 |
1 |
p. 68-70
|
article
|
| 22 |
Quality control of protein models: directional atomic contact analysis
|
Vriend, G.
|
|
1993
|
26 |
1 |
p. 47-60
|
article
|
| 23 |
Stuctural and chemical analysis of materials. X-ray, electron, and neutron diffraction; X-ray, electron, and ion spectrometry; electron microscopy by J. P. Eberhart
|
Thomas, N. W.
|
|
1993
|
26 |
1 |
p. 145-146
|
article
|
| 24 |
Study of Brazil twin boundaries in synthetic quartz by means of simulations of X-ray topographs
|
González-Mañas, M.
|
|
1993
|
26 |
1 |
p. 122-127
|
article
|
| 25 |
The use of pattern decomposition to study the combined X-ray diffraction effects of crystallite size and stacking faults in ex-oxalate zinc oxide
|
Langford, J. I.
|
|
1993
|
26 |
1 |
p. 22-33
|
article
|
| 26 |
The use of soft X-rays of very long wavelengths for small-angle scattering at the Aladdin storage ring
|
Tse, J. S.
|
|
1993
|
26 |
1 |
p. 130-132
|
article
|
| 27 |
Towards statistics of crystal orientations in quantitative texture anaylsis
|
Schaeben, H.
|
|
1993
|
26 |
1 |
p. 112-121
|
article
|
| 28 |
Twinning of LaGaO3 single crystals
|
Bdikin, I. K.
|
|
1993
|
26 |
1 |
p. 71-76
|
article
|
| 29 |
Voigt-function modeling in Fourier analysis of size- and strain-broadened X-ray diffraction peaks
|
Balzar, D.
|
|
1993
|
26 |
1 |
p. 97-103
|
article
|
| 30 |
XTALLAB and POWDER – computer assisted instruction in elementary crystallographic methods
|
Day, C. L.
|
|
1993
|
26 |
1 |
p. 144
|
article
|
Journal description