nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
ABSCOR: a scaling and absorption correction program for the FAST area detector diffractometer
|
Messerschmidt, A. |
|
1990 |
23 |
5 |
p. 436-439 |
artikel |
2 |
Absolute polarity of α-lithium iodate. Erratum
|
Abrahams, S. C. |
|
1990 |
23 |
5 |
p. 430 |
artikel |
3 |
A fitting method for the determination of crystallinity by means of X-ray diffraction
|
Polizzi, S. |
|
1990 |
23 |
5 |
p. 359-365 |
artikel |
4 |
A high-resolution Weissenberg camera for X-ray synchrotron radiation
|
Hohlwein, D. |
|
1990 |
23 |
5 |
p. 351-354 |
artikel |
5 |
A robust alternative to η refinement for assessing the hand of chiral compounds
|
Le Page, Y. |
|
1990 |
23 |
5 |
p. 406-411 |
artikel |
6 |
BIRCH, a program for fitting PV data to an Eulerian finite-strain equation of state
|
Ross, C. R. |
|
1990 |
23 |
5 |
p. 439-440 |
artikel |
7 |
Bragg and diffuse components of X-ray reflection measured using acoustic excitation of an Si crystal with oxide precipitates
|
Entin, I. R. |
|
1990 |
23 |
5 |
p. 355-358 |
artikel |
8 |
Characteristic X-ray flux from sealed Cr, Cu, Mo, Ag and W tubes
|
Honkimäki, V. |
|
1990 |
23 |
5 |
p. 412-417 |
artikel |
9 |
Characterization of a chromia–alumina catalyst using small-angle neutron scattering
|
Acharya, D. R. |
|
1990 |
23 |
5 |
p. 424-429 |
artikel |
10 |
Crystallographers
|
|
|
1990 |
23 |
5 |
p. 445 |
artikel |
11 |
High-pressure single-crystal study on AlPO4 with synchrotron radiation
|
Sowa, H. |
|
1990 |
23 |
5 |
p. 397-400 |
artikel |
12 |
Improvements to the Chebyshev expansion of attenuation correction factors for cylindrical samples
|
Mildner, D. F. R. |
|
1990 |
23 |
5 |
p. 378-386 |
artikel |
13 |
Modernization of the Philips PW1100 single-crystal diffractometer computer control system
|
Grigg, M. W. |
|
1990 |
23 |
5 |
p. 432-433 |
artikel |
14 |
Mounting of crystals for macromolecular crystallography in a free-standing thin film
|
Teng, T.-Y. |
|
1990 |
23 |
5 |
p. 387-391 |
artikel |
15 |
New Commercial Products
|
|
|
1990 |
23 |
5 |
p. 446 |
artikel |
16 |
PAP: a protein analysis package
|
Callahan, T. |
|
1990 |
23 |
5 |
p. 434-436 |
artikel |
17 |
PROFAN-PC: a PC program for powder peak profile analysis
|
Merz, P. |
|
1990 |
23 |
5 |
p. 444-445 |
artikel |
18 |
Silicon photodiode detector for small-angle X-ray scattering
|
Jemian, P. R. |
|
1990 |
23 |
5 |
p. 430-432 |
artikel |
19 |
Small-angle X-ray scattering at high energies
|
Siddons, D. P. |
|
1990 |
23 |
5 |
p. 401-405 |
artikel |
20 |
Structural study of Cd(S,Se) doped glasses. High-resolution transmission electron microscopy (HRTEM) assisted by image processing
|
Allais, M. |
|
1990 |
23 |
5 |
p. 418-423 |
artikel |
21 |
Sub-nanosecond X-ray powder diffraction
|
Woolsey, N. C. |
|
1990 |
23 |
5 |
p. 441-443 |
artikel |
22 |
The Dorothy Hodgkin Prize of the British Crystallographic Association
|
|
|
1990 |
23 |
5 |
p. 445-446 |
artikel |
23 |
The effect of diffraction by the diamonds of a diamond-anvil cell on single-crystal sample intensities
|
Loveday, J. S. |
|
1990 |
23 |
5 |
p. 392-396 |
artikel |
24 |
The internal structure of layered colloidal particles determined with SANS
|
Duits, M. H. G. |
|
1990 |
23 |
5 |
p. 366-373 |
artikel |
25 |
The rotation rate field and geometry of orientation space
|
Morawiec, A. |
|
1990 |
23 |
5 |
p. 374-377 |
artikel |