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                             25 results found
no title author magazine year volume issue page(s) type
1 ABSCOR: a scaling and absorption correction program for the FAST area detector diffractometer Messerschmidt, A.
1990
23 5 p. 436-439
article
2 Absolute polarity of α-lithium iodate. Erratum Abrahams, S. C.
1990
23 5 p. 430
article
3 A fitting method for the determination of crystallinity by means of X-ray diffraction Polizzi, S.
1990
23 5 p. 359-365
article
4 A high-resolution Weissenberg camera for X-ray synchrotron radiation Hohlwein, D.
1990
23 5 p. 351-354
article
5 A robust alternative to η refinement for assessing the hand of chiral compounds Le Page, Y.
1990
23 5 p. 406-411
article
6 BIRCH, a program for fitting PV data to an Eulerian finite-strain equation of state Ross, C. R.
1990
23 5 p. 439-440
article
7 Bragg and diffuse components of X-ray reflection measured using acoustic excitation of an Si crystal with oxide precipitates Entin, I. R.
1990
23 5 p. 355-358
article
8 Characteristic X-ray flux from sealed Cr, Cu, Mo, Ag and W tubes Honkimäki, V.
1990
23 5 p. 412-417
article
9 Characterization of a chromia–alumina catalyst using small-angle neutron scattering Acharya, D. R.
1990
23 5 p. 424-429
article
10 Crystallographers 1990
23 5 p. 445
article
11 High-pressure single-crystal study on AlPO4 with synchrotron radiation Sowa, H.
1990
23 5 p. 397-400
article
12 Improvements to the Chebyshev expansion of attenuation correction factors for cylindrical samples Mildner, D. F. R.
1990
23 5 p. 378-386
article
13 Modernization of the Philips PW1100 single-crystal diffractometer computer control system Grigg, M. W.
1990
23 5 p. 432-433
article
14 Mounting of crystals for macromolecular crystallography in a free-standing thin film Teng, T.-Y.
1990
23 5 p. 387-391
article
15 New Commercial Products 1990
23 5 p. 446
article
16 PAP: a protein analysis package Callahan, T.
1990
23 5 p. 434-436
article
17 PROFAN-PC: a PC program for powder peak profile analysis Merz, P.
1990
23 5 p. 444-445
article
18 Silicon photodiode detector for small-angle X-ray scattering Jemian, P. R.
1990
23 5 p. 430-432
article
19 Small-angle X-ray scattering at high energies Siddons, D. P.
1990
23 5 p. 401-405
article
20 Structural study of Cd(S,Se) doped glasses. High-resolution transmission electron microscopy (HRTEM) assisted by image processing Allais, M.
1990
23 5 p. 418-423
article
21 Sub-nanosecond X-ray powder diffraction Woolsey, N. C.
1990
23 5 p. 441-443
article
22 The Dorothy Hodgkin Prize of the British Crystallographic Association 1990
23 5 p. 445-446
article
23 The effect of diffraction by the diamonds of a diamond-anvil cell on single-crystal sample intensities Loveday, J. S.
1990
23 5 p. 392-396
article
24 The internal structure of layered colloidal particles determined with SANS Duits, M. H. G.
1990
23 5 p. 366-373
article
25 The rotation rate field and geometry of orientation space Morawiec, A.
1990
23 5 p. 374-377
article
                             25 results found
 
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