| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
A convenient translation-function parameterization
|
Wilson, C. C.
|
|
1990
|
23 |
4 |
p. 341-343
|
article
|
| 2 |
Analytical treatment of the resolution function for small-angle scattering
|
Pedersen, J. S.
|
|
1990
|
23 |
4 |
p. 321-333
|
article
|
| 3 |
An automated system for micro-batch protein crystallization and screening
|
Chayen, N. E.
|
|
1990
|
23 |
4 |
p. 297-302
|
article
|
| 4 |
An automatic diffraction data collection system with an imaging plate
|
Tanaka, I.
|
|
1990
|
23 |
4 |
p. 334-339
|
article
|
| 5 |
A new crystal growth form of vaterite, CaCO3
|
Shaikh, A. M.
|
|
1990
|
23 |
4 |
p. 263-265
|
article
|
| 6 |
Anomalous small-angle X-ray scattering study of the early stages of decomposition in Cu–15wt%Ni–8wt%Sn
|
Goudeau, Ph.
|
|
1990
|
23 |
4 |
p. 266-276
|
article
|
| 7 |
A procedure for the generation of the symmetry of the multiple implication function from the crystal symmetry
|
Pavelčík, F.
|
|
1990
|
23 |
4 |
p. 225-227
|
article
|
| 8 |
A two-circle powder diffractometer for synchrotron radiation with a closed loop encoder feedback system
|
Cernik, R. J.
|
|
1990
|
23 |
4 |
p. 292-296
|
article
|
| 9 |
Auto-indexing of oscillation images
|
Higashi, T.
|
|
1990
|
23 |
4 |
p. 253-257
|
article
|
| 10 |
Calculation of small-angle scattering profiles using Monte Carlo simulation
|
Hansen, S.
|
|
1990
|
23 |
4 |
p. 344-346
|
article
|
| 11 |
Crystallographers
|
|
|
1990
|
23 |
4 |
p. 349-350
|
article
|
| 12 |
Extreme asymmetric X-ray Bragg reflection of semiconductor heterostructures near the edge of total external reflection
|
Brühl, H.-G.
|
|
1990
|
23 |
4 |
p. 228-233
|
article
|
| 13 |
Factors affecting data reproducibility on an area detector
|
Rose, J. P.
|
|
1990
|
23 |
4 |
p. 234-240
|
article
|
| 14 |
Lattice-parameter determination for powders using synchrotron radiation
|
Hart, M.
|
|
1990
|
23 |
4 |
p. 286-291
|
article
|
| 15 |
Low-temperature X-ray diffraction examination of In2Se3
|
Gržeta, B.
|
|
1990
|
23 |
4 |
p. 340-341
|
article
|
| 16 |
New Commercial Products
|
|
|
1990
|
23 |
4 |
p. 350
|
article
|
| 17 |
Optical transforms of disordered systems containing symmetry-related scattering sites
|
Welberry, T. R.
|
|
1990
|
23 |
4 |
p. 303-314
|
article
|
| 18 |
Quantitative X-ray powder diffraction analysis applied to transmission diffraction
|
Davis, B. L.
|
|
1990
|
23 |
4 |
p. 315-320
|
article
|
| 19 |
Reduction of parasitic scattering in small-angle X-ray scattering by a three-pinhole collimating system
|
Wignall, G. D.
|
|
1990
|
23 |
4 |
p. 241-245
|
article
|
| 20 |
Simultaneous peak-shift correction in the least-squares determination of unit-cell parameters of a sample with standard reference material
|
Toraya, H.
|
|
1990
|
23 |
4 |
p. 282-285
|
article
|
| 21 |
Simultaneous structure and size–strain refinement by the Rietveld method
|
Lutterotti, L.
|
|
1990
|
23 |
4 |
p. 246-252
|
article
|
| 22 |
Study of ferroelastic domains in HTMA crystals at the ferroelectric–ferroelastic transition
|
Ribet, M.
|
|
1990
|
23 |
4 |
p. 277-281
|
article
|
| 23 |
TEXCAM – an interpretation aid for cylindrical texture camera X-ray diffraction patterns
|
Rogers, K. D.
|
|
1990
|
23 |
4 |
p. 347-348
|
article
|
| 24 |
Time-resolved neutron diffraction analyses of hydrothermal syntheses using a novel autoclave cell
|
Polak, E.
|
|
1990
|
23 |
4 |
p. 258-262
|
article
|
Journal description