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                             24 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A convenient translation-function parameterization Wilson, C. C.
1990
23 4 p. 341-343
artikel
2 Analytical treatment of the resolution function for small-angle scattering Pedersen, J. S.
1990
23 4 p. 321-333
artikel
3 An automated system for micro-batch protein crystallization and screening Chayen, N. E.
1990
23 4 p. 297-302
artikel
4 An automatic diffraction data collection system with an imaging plate Tanaka, I.
1990
23 4 p. 334-339
artikel
5 A new crystal growth form of vaterite, CaCO3 Shaikh, A. M.
1990
23 4 p. 263-265
artikel
6 Anomalous small-angle X-ray scattering study of the early stages of decomposition in Cu–15wt%Ni–8wt%Sn Goudeau, Ph.
1990
23 4 p. 266-276
artikel
7 A procedure for the generation of the symmetry of the multiple implication function from the crystal symmetry Pavelčík, F.
1990
23 4 p. 225-227
artikel
8 A two-circle powder diffractometer for synchrotron radiation with a closed loop encoder feedback system Cernik, R. J.
1990
23 4 p. 292-296
artikel
9 Auto-indexing of oscillation images Higashi, T.
1990
23 4 p. 253-257
artikel
10 Calculation of small-angle scattering profiles using Monte Carlo simulation Hansen, S.
1990
23 4 p. 344-346
artikel
11 Crystallographers 1990
23 4 p. 349-350
artikel
12 Extreme asymmetric X-ray Bragg reflection of semiconductor heterostructures near the edge of total external reflection Brühl, H.-G.
1990
23 4 p. 228-233
artikel
13 Factors affecting data reproducibility on an area detector Rose, J. P.
1990
23 4 p. 234-240
artikel
14 Lattice-parameter determination for powders using synchrotron radiation Hart, M.
1990
23 4 p. 286-291
artikel
15 Low-temperature X-ray diffraction examination of In2Se3 Gržeta, B.
1990
23 4 p. 340-341
artikel
16 New Commercial Products 1990
23 4 p. 350
artikel
17 Optical transforms of disordered systems containing symmetry-related scattering sites Welberry, T. R.
1990
23 4 p. 303-314
artikel
18 Quantitative X-ray powder diffraction analysis applied to transmission diffraction Davis, B. L.
1990
23 4 p. 315-320
artikel
19 Reduction of parasitic scattering in small-angle X-ray scattering by a three-pinhole collimating system Wignall, G. D.
1990
23 4 p. 241-245
artikel
20 Simultaneous peak-shift correction in the least-squares determination of unit-cell parameters of a sample with standard reference material Toraya, H.
1990
23 4 p. 282-285
artikel
21 Simultaneous structure and size–strain refinement by the Rietveld method Lutterotti, L.
1990
23 4 p. 246-252
artikel
22 Study of ferroelastic domains in HTMA crystals at the ferroelectric–ferroelastic transition Ribet, M.
1990
23 4 p. 277-281
artikel
23 TEXCAM – an interpretation aid for cylindrical texture camera X-ray diffraction patterns Rogers, K. D.
1990
23 4 p. 347-348
artikel
24 Time-resolved neutron diffraction analyses of hydrothermal syntheses using a novel autoclave cell Polak, E.
1990
23 4 p. 258-262
artikel
                             24 gevonden resultaten
 
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