| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A computer-based method of measuring the integrated intensities of the reflections on the X-ray diffraction photograph of an oriented crystalline polymer
|
Hall, I. H.
|
|
1987
|
20 |
3 |
p. 246-255
|
artikel
|
| 2 |
A high-pressure single-crystal X-ray diffraction study of V3O5 including the phase transition at 6.2 GPa
|
Åsbrink, S.
|
|
1987
|
20 |
3 |
p. 195-199
|
artikel
|
| 3 |
An automated full-symmetry Patterson search method
|
Rius, J.
|
|
1987
|
20 |
3 |
p. 261-264
|
artikel
|
| 4 |
A powder diffractometer for a synchrotron source
|
Sabine, T. M.
|
|
1987
|
20 |
3 |
p. 173-178
|
artikel
|
| 5 |
Application of optimization to powder-pattern indexing
|
Paszkowicz, W.
|
|
1987
|
20 |
3 |
p. 166-172
|
artikel
|
| 6 |
A simple method of absorption and decay correction in intensities measured by area-detector X-ray diffractometer
|
Takusagawa, F.
|
|
1987
|
20 |
3 |
p. 243-245
|
artikel
|
| 7 |
A system for collection and on-line integration of X-ray diffraction data from a multiwire area detector
|
Blum, M.
|
|
1987
|
20 |
3 |
p. 235-242
|
artikel
|
| 8 |
Buerger precession camera and overall characterization of thin films and flat-plate crystals
|
Staudenmann, J.-L.
|
|
1987
|
20 |
3 |
p. 210-221
|
artikel
|
| 9 |
Computer derivation of the symmetry elements implied in a structure description
|
Le Page, Y.
|
|
1987
|
20 |
3 |
p. 264-269
|
artikel
|
| 10 |
Crystallographers
|
|
|
1987
|
20 |
3 |
p. 271
|
artikel
|
| 11 |
Expressions for first and second derivatives in least-squares refinements including extinction
|
Spackman, M. A.
|
|
1987
|
20 |
3 |
p. 256-258
|
artikel
|
| 12 |
IMAGE, an interactive computer program for the visualization of molecular structures
|
Nayl, C.
|
|
1987
|
20 |
3 |
p. 269-270
|
artikel
|
| 13 |
Intensity expression for short-range-order diffuse scattering with ordering energies in a ternary alloy system
|
Hashimoto, S.
|
|
1987
|
20 |
3 |
p. 182-186
|
artikel
|
| 14 |
Layer-disordered wurtzite (ZnS-2H): diffuse X-ray scattering recorded by c-axis precession photography
|
Fleet, M. E.
|
|
1987
|
20 |
3 |
p. 191-194
|
artikel
|
| 15 |
Lorentz–polarization factor for correction of diffraction-line profiles
|
Yinghua, W.
|
|
1987
|
20 |
3 |
p. 258-259
|
artikel
|
| 16 |
Matrix formulation of the iterative method of phase analysis
|
Čerňanský, M.
|
|
1987
|
20 |
3 |
p. 260-261
|
artikel
|
| 17 |
New Commercial Products
|
|
|
1987
|
20 |
3 |
p. 271-272
|
artikel
|
| 18 |
On the estimation of the unit-cell volume from powder diffraction data
|
Paszkowicz, W.
|
|
1987
|
20 |
3 |
p. 161-165
|
artikel
|
| 19 |
Reflection electron microscopy
|
Yagi, K.
|
|
1987
|
20 |
3 |
p. 147-160
|
artikel
|
| 20 |
Resolution corrections in diffuse scattering experiments
|
Boysen, H.
|
|
1987
|
20 |
3 |
p. 200-209
|
artikel
|
| 21 |
Sensitivity of X-ray diffractometry for strain depth profiling in III–V heterostructures
|
Bensoussan, S.
|
|
1987
|
20 |
3 |
p. 222-229
|
artikel
|
| 22 |
The distribution of carbon among interstitial sites of the f.c.c. iron-alloy lattice
|
Mazzone, G.
|
|
1987
|
20 |
3 |
p. 187-190
|
artikel
|
| 23 |
The primitive function for slit-height desmearing in SAXS
|
Deutsch, M.
|
|
1987
|
20 |
3 |
p. 179-181
|
artikel
|
| 24 |
X-ray diffraction evidence for transient composition effects in MOVPE multilayer growth for Ga1−xAlxAs alloys
|
Bensoussan, S.
|
|
1987
|
20 |
3 |
p. 230-234
|
artikel
|
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