| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A conical-type X-ray guide tube for diffraction experiments with small crystals
|
Nozaki, H.
|
|
1986
|
19 |
6 |
p. 453-455
|
artikel
|
| 2 |
A new method for determination of the crystal setting matrix for interpreting oscillation photographs
|
Sarma, R.
|
|
1986
|
19 |
6 |
p. 482-484
|
artikel
|
| 3 |
An X-ray determination of the thermal expansion of α-phase Ag–Al alloys at high temperatures
|
De, M.
|
|
1986
|
19 |
6 |
p. 484-485
|
artikel
|
| 4 |
A simple adjustable mount for a two-stage cryorefrigerator on an Eulerian cradle
|
Archer, J. M.
|
|
1986
|
19 |
6 |
p. 456-458
|
artikel
|
| 5 |
Crystal data for uranium phosphorus pentoxide, UPO5, and uranium arsenic pentoxide, UAsO5
|
Barten, H.
|
|
1986
|
19 |
6 |
p. 486
|
artikel
|
| 6 |
Crystal structure analysis of cytochrome c' by the multiwavelength anomalous diffraction method using synchrotron radiation
|
Harada, S.
|
|
1986
|
19 |
6 |
p. 448-452
|
artikel
|
| 7 |
Diffraction pattern near the Bragg angle for an asymmetrically cut crystal
|
Kotsis, K. T.
|
|
1986
|
19 |
6 |
p. 473-476
|
artikel
|
| 8 |
Errors in a recent critique of the Borie–Sparks method in diffuse scattering
|
Cohen, J. B.
|
|
1986
|
19 |
6 |
p. 491
|
artikel
|
| 9 |
Observation of defects and the incommensurate phase in berlinite crystals by high-temperature X-ray topography
|
Zarka, A.
|
|
1986
|
19 |
6 |
p. 477-481
|
artikel
|
| 10 |
Prices of Acta Crystallographica and Journal of Applied Crystallography
|
|
|
1986
|
19 |
6 |
p. 491-492
|
artikel
|
| 11 |
Rapid collection of X-ray powder data for pattern analysis by a cylindrical position-sensitive detector
|
Shishiguchi, S.
|
|
1986
|
19 |
6 |
p. 420-426
|
artikel
|
| 12 |
Simultaneous measurement of several X-ray pole figures
|
Heizmann, J. J.
|
|
1986
|
19 |
6 |
p. 467-472
|
artikel
|
| 13 |
The small-angle neutron scattering spectrometer at the National Bureau of Standards
|
Glinka, C. J.
|
|
1986
|
19 |
6 |
p. 427-439
|
artikel
|
| 14 |
Truncation in diffraction pattern analysis. I. Concept of a diffraction line profile and its range
|
Delhez, R.
|
|
1986
|
19 |
6 |
p. 459-466
|
artikel
|
| 15 |
Use of a new array processor in the restrained least-squares procedure of Hendrickson and Konnert
|
Cohen, G. H.
|
|
1986
|
19 |
6 |
p. 486-488
|
artikel
|
| 16 |
Whole-powder-pattern fitting without reference to a structural model: application to X-ray powder diffraction data
|
Toraya, H.
|
|
1986
|
19 |
6 |
p. 440-447
|
artikel
|
| 17 |
XFPS, a program for automatic Fourier, Patterson and superposition methods
|
Pavelčík, F.
|
|
1986
|
19 |
6 |
p. 488-491
|
artikel
|
| 18 |
X-ray determination of the atomic displacements in NbC0.72
|
Morinaga, M.
|
|
1986
|
19 |
6 |
p. 417-419
|
artikel
|
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