| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Accuracy and resolution in small-angle crystallographic analyses. A comparison with solution scattering studies
|
Luzzati, V.
|
|
1986
|
19 |
1 |
p. 51-60
|
artikel
|
| 2 |
A new radiative single-crystal diffractometer microfurnace incorporating MgO as a high-temperature cement and internal temperature calibrant
|
Swanson, D. K.
|
|
1986
|
19 |
1 |
p. 1-6
|
artikel
|
| 3 |
Anomalous small-angle scattering in metallurgy: a feasibility experiment with an Al–Zn alloy
|
Goudeau, P.
|
|
1986
|
19 |
1 |
p. 19-24
|
artikel
|
| 4 |
A real-time interactive graphics program to determine crystal orientation for the analysis of oscillation diffraction photographs
|
Dumas, P.
|
|
1986
|
19 |
1 |
p. 28-33
|
artikel
|
| 5 |
Crystal data for p-bromochlorobenzene and p-dichlorobenzene/p-bromochlorobenzene mixed crystals at 293 K. Erratum
|
Labrador, M.
|
|
1986
|
19 |
1 |
p. 65
|
artikel
|
| 6 |
Crystallographers
|
|
|
1986
|
19 |
1 |
p. 67
|
artikel
|
| 7 |
Information content and retrieval in solution scattering studies. II. Evaluation of accuracy and resolution
|
Luzzati, V.
|
|
1986
|
19 |
1 |
p. 39-50
|
artikel
|
| 8 |
Metamorphic reactions: kinetics, textures and deformation edited by A. B. Thompson and D. C. Rubie
|
|
|
1986
|
19 |
1 |
p. 68
|
artikel
|
| 9 |
New Commercial Products
|
|
|
1986
|
19 |
1 |
p. 67-68
|
artikel
|
| 10 |
Notes and News
|
|
|
1986
|
19 |
1 |
p. 67
|
artikel
|
| 11 |
PITMOS – a system of interactive computer programs for visualization of crystal packing
|
Pérez, S.
|
|
1986
|
19 |
1 |
p. 65-66
|
artikel
|
| 12 |
Powder diffraction peak shapes. Parameterization of the pseudo-Voigt as a Voigt function
|
David, W. I. F.
|
|
1986
|
19 |
1 |
p. 63-64
|
artikel
|
| 13 |
Scattering exponents for polydisperse surface and mass fractals
|
Martin, J. E.
|
|
1986
|
19 |
1 |
p. 25-27
|
artikel
|
| 14 |
Semiconductor physics: an introduction by K. Seeger
|
|
|
1986
|
19 |
1 |
p. 68
|
artikel
|
| 15 |
Strategies for collecting screen-less oscillation data
|
Munshi, S. K.
|
|
1986
|
19 |
1 |
p. 61-62
|
artikel
|
| 16 |
Systematic errors in precision lattice-parameter determination of single crystals caused by asymmetric line profiles
|
Berger, H.
|
|
1986
|
19 |
1 |
p. 34-38
|
artikel
|
| 17 |
The effect of profile step width on the determination of crystal structure parameters and estimated standard deviations by X-ray Rietveld analysis
|
Hill, R. J.
|
|
1986
|
19 |
1 |
p. 10-18
|
artikel
|
| 18 |
The influence of high hydrostatic pressure on lattice parameters of a single crystal of BaTiO3
|
Malinowski, M.
|
|
1986
|
19 |
1 |
p. 7-9
|
artikel
|
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