no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
1 |
Accuracy and resolution in small-angle crystallographic analyses. A comparison with solution scattering studies
|
Luzzati, V. |
|
1986 |
19 |
1 |
p. 51-60 |
article |
2 |
A new radiative single-crystal diffractometer microfurnace incorporating MgO as a high-temperature cement and internal temperature calibrant
|
Swanson, D. K. |
|
1986 |
19 |
1 |
p. 1-6 |
article |
3 |
Anomalous small-angle scattering in metallurgy: a feasibility experiment with an Al–Zn alloy
|
Goudeau, P. |
|
1986 |
19 |
1 |
p. 19-24 |
article |
4 |
A real-time interactive graphics program to determine crystal orientation for the analysis of oscillation diffraction photographs
|
Dumas, P. |
|
1986 |
19 |
1 |
p. 28-33 |
article |
5 |
Crystal data for p-bromochlorobenzene and p-dichlorobenzene/p-bromochlorobenzene mixed crystals at 293 K. Erratum
|
Labrador, M. |
|
1986 |
19 |
1 |
p. 65 |
article |
6 |
Crystallographers
|
|
|
1986 |
19 |
1 |
p. 67 |
article |
7 |
Information content and retrieval in solution scattering studies. II. Evaluation of accuracy and resolution
|
Luzzati, V. |
|
1986 |
19 |
1 |
p. 39-50 |
article |
8 |
Metamorphic reactions: kinetics, textures and deformation edited by A. B. Thompson and D. C. Rubie
|
|
|
1986 |
19 |
1 |
p. 68 |
article |
9 |
New Commercial Products
|
|
|
1986 |
19 |
1 |
p. 67-68 |
article |
10 |
Notes and News
|
|
|
1986 |
19 |
1 |
p. 67 |
article |
11 |
PITMOS – a system of interactive computer programs for visualization of crystal packing
|
Pérez, S. |
|
1986 |
19 |
1 |
p. 65-66 |
article |
12 |
Powder diffraction peak shapes. Parameterization of the pseudo-Voigt as a Voigt function
|
David, W. I. F. |
|
1986 |
19 |
1 |
p. 63-64 |
article |
13 |
Scattering exponents for polydisperse surface and mass fractals
|
Martin, J. E. |
|
1986 |
19 |
1 |
p. 25-27 |
article |
14 |
Semiconductor physics: an introduction by K. Seeger
|
|
|
1986 |
19 |
1 |
p. 68 |
article |
15 |
Strategies for collecting screen-less oscillation data
|
Munshi, S. K. |
|
1986 |
19 |
1 |
p. 61-62 |
article |
16 |
Systematic errors in precision lattice-parameter determination of single crystals caused by asymmetric line profiles
|
Berger, H. |
|
1986 |
19 |
1 |
p. 34-38 |
article |
17 |
The effect of profile step width on the determination of crystal structure parameters and estimated standard deviations by X-ray Rietveld analysis
|
Hill, R. J. |
|
1986 |
19 |
1 |
p. 10-18 |
article |
18 |
The influence of high hydrostatic pressure on lattice parameters of a single crystal of BaTiO3
|
Malinowski, M. |
|
1986 |
19 |
1 |
p. 7-9 |
article |