nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A lathe-like crystal grinder for grinding pre-aligned crystals into cylindrical cross section
|
Wood, R. A. |
|
1985 |
18 |
5 |
p. 371-372 |
artikel |
2 |
Alignment of double-crystal diffractometers
|
Fewster, P. F. |
|
1985 |
18 |
5 |
p. 334-338 |
artikel |
3 |
A method for precision lattice-parameter measurement of single crystals. Erratum
|
Berger, H. |
|
1985 |
18 |
5 |
p. 365 |
artikel |
4 |
Analysis of anisotrophy of small-angle neutron scattering of polyethylene single crystals. Erratum
|
Sadler, D. M. |
|
1985 |
18 |
5 |
p. 365 |
artikel |
5 |
Analysis of diffuse scattering in neutron powder diagrams. Application to glassy carbon
|
Boysen, H. |
|
1985 |
18 |
5 |
p. 320-325 |
artikel |
6 |
Calculation of diffraction line profiles in the case of a major size effect: application to boehmite AlOOH
|
Grebille, D. |
|
1985 |
18 |
5 |
p. 301-307 |
artikel |
7 |
Crystallographers
|
|
|
1985 |
18 |
5 |
p. 373-374 |
artikel |
8 |
Données crystallographiques sur les composés Ni(C15H11N3) X2.nH2O,X=Cl−,NO2−,NCO−
|
Cortes, R. |
|
1985 |
18 |
5 |
p. 366 |
artikel |
9 |
Error analysis of a smeared SAXS curve of polystyrene in benzene
|
Kube, O. |
|
1985 |
18 |
5 |
p. 308-315 |
artikel |
10 |
Growth defects in quartz druses, >a< pseudo-basal dislocations
|
Scandale, E. |
|
1985 |
18 |
5 |
p. 275-278 |
artikel |
11 |
Moiré patterns in electron diffraction from lanthanum oxide iodide (LaOI)
|
Welberry, T. R. |
|
1985 |
18 |
5 |
p. 362-364 |
artikel |
12 |
Neutron interferometry: antiphasing effects caused by geometrical aberrations
|
Kischko, U. |
|
1985 |
18 |
5 |
p. 326-333 |
artikel |
13 |
New Commercial Products
|
|
|
1985 |
18 |
5 |
p. 374-376 |
artikel |
14 |
NEWMAN, program for calculating and plotting Newman projections from atomic coordinates and cell constants
|
Schenk, H. |
|
1985 |
18 |
5 |
p. 370 |
artikel |
15 |
New X-ray powder diffraction data for beryllium gallate, BeGa2O4
|
Machida, M. |
|
1985 |
18 |
5 |
p. 366 |
artikel |
16 |
Odd-order O.D.F. expansion coefficient determination. Case of diffraction strain measurements on cubic materials under macrostress loading
|
Brakman, C. M. |
|
1985 |
18 |
5 |
p. 279-295 |
artikel |
17 |
Parallel-beam geometry for single-crystal diffraction
|
Suortti, P. |
|
1985 |
18 |
5 |
p. 272-274 |
artikel |
18 |
Precise orientation of semiconductor surfaces by the back-reflection Laue technique
|
Schiller, C. |
|
1985 |
18 |
5 |
p. 373 |
artikel |
19 |
Programmed crystal growth on a diffractometer with focused heat radiation
|
Brodalla, D. |
|
1985 |
18 |
5 |
p. 316-319 |
artikel |
20 |
Strategy for data collection from protein crystals using a multiwire counter area detector diffractometer
|
Xuong, N. H. |
|
1985 |
18 |
5 |
p. 342-350 |
artikel |
21 |
Synchrotron X-radiation protein crystallography: CEA film absorption factor as a function of wavelength 0.3≤λ≤2Å
|
Clifton, I. J. |
|
1985 |
18 |
5 |
p. 296-300 |
artikel |
22 |
The crystal structure and the equation of state of thorium nitride for pressures up to 47 GPa
|
Gerward, L. |
|
1985 |
18 |
5 |
p. 339-341 |
artikel |
23 |
The effects of profile-function truncation in X-ray powder-pattern fitting
|
Toraya, H. |
|
1985 |
18 |
5 |
p. 351-358 |
artikel |
24 |
The observation of resonant neutron diffraction
|
Carlile, C. J. |
|
1985 |
18 |
5 |
p. 359-361 |
artikel |
25 |
TREOR, a semi-exhaustive trial-and-error powder indexing program for all symmetries
|
Werner, P.-E. |
|
1985 |
18 |
5 |
p. 367-370 |
artikel |
26 |
TYPIST – a program for the tabulation of crystallographic results
|
Tomassini, M. |
|
1985 |
18 |
5 |
p. 370-371 |
artikel |
27 |
X-ray diffraction by cathodically charged austenitic stainless steel
|
Zevin, L. S. |
|
1985 |
18 |
5 |
p. 267-271 |
artikel |