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                             27 results found
no title author magazine year volume issue page(s) type
1 A lathe-like crystal grinder for grinding pre-aligned crystals into cylindrical cross section Wood, R. A.
1985
18 5 p. 371-372
article
2 Alignment of double-crystal diffractometers Fewster, P. F.
1985
18 5 p. 334-338
article
3 A method for precision lattice-parameter measurement of single crystals. Erratum Berger, H.
1985
18 5 p. 365
article
4 Analysis of anisotrophy of small-angle neutron scattering of polyethylene single crystals. Erratum Sadler, D. M.
1985
18 5 p. 365
article
5 Analysis of diffuse scattering in neutron powder diagrams. Application to glassy carbon Boysen, H.
1985
18 5 p. 320-325
article
6 Calculation of diffraction line profiles in the case of a major size effect: application to boehmite AlOOH Grebille, D.
1985
18 5 p. 301-307
article
7 Crystallographers 1985
18 5 p. 373-374
article
8 Données crystallographiques sur les composés Ni(C15H11N3) X2.nH2O,X=Cl−,NO2−,NCO− Cortes, R.
1985
18 5 p. 366
article
9 Error analysis of a smeared SAXS curve of polystyrene in benzene Kube, O.
1985
18 5 p. 308-315
article
10 Growth defects in quartz druses, >a< pseudo-basal dislocations Scandale, E.
1985
18 5 p. 275-278
article
11 Moiré patterns in electron diffraction from lanthanum oxide iodide (LaOI) Welberry, T. R.
1985
18 5 p. 362-364
article
12 Neutron interferometry: antiphasing effects caused by geometrical aberrations Kischko, U.
1985
18 5 p. 326-333
article
13 New Commercial Products 1985
18 5 p. 374-376
article
14 NEWMAN, program for calculating and plotting Newman projections from atomic coordinates and cell constants Schenk, H.
1985
18 5 p. 370
article
15 New X-ray powder diffraction data for beryllium gallate, BeGa2O4 Machida, M.
1985
18 5 p. 366
article
16 Odd-order O.D.F. expansion coefficient determination. Case of diffraction strain measurements on cubic materials under macrostress loading Brakman, C. M.
1985
18 5 p. 279-295
article
17 Parallel-beam geometry for single-crystal diffraction Suortti, P.
1985
18 5 p. 272-274
article
18 Precise orientation of semiconductor surfaces by the back-reflection Laue technique Schiller, C.
1985
18 5 p. 373
article
19 Programmed crystal growth on a diffractometer with focused heat radiation Brodalla, D.
1985
18 5 p. 316-319
article
20 Strategy for data collection from protein crystals using a multiwire counter area detector diffractometer Xuong, N. H.
1985
18 5 p. 342-350
article
21 Synchrotron X-radiation protein crystallography: CEA film absorption factor as a function of wavelength 0.3≤λ≤2Å Clifton, I. J.
1985
18 5 p. 296-300
article
22 The crystal structure and the equation of state of thorium nitride for pressures up to 47 GPa Gerward, L.
1985
18 5 p. 339-341
article
23 The effects of profile-function truncation in X-ray powder-pattern fitting Toraya, H.
1985
18 5 p. 351-358
article
24 The observation of resonant neutron diffraction Carlile, C. J.
1985
18 5 p. 359-361
article
25 TREOR, a semi-exhaustive trial-and-error powder indexing program for all symmetries Werner, P.-E.
1985
18 5 p. 367-370
article
26 TYPIST – a program for the tabulation of crystallographic results Tomassini, M.
1985
18 5 p. 370-371
article
27 X-ray diffraction by cathodically charged austenitic stainless steel Zevin, L. S.
1985
18 5 p. 267-271
article
                             27 results found
 
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