| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A new high-pressure phase of uranium nitride studied by X-ray diffraction and synchrotron radiation
|
Staun Olsen, J.
|
|
1985
|
18 |
1 |
p. 37-41
|
artikel
|
| 2 |
A new method for surface analysis of crystals using X-ray diffraction under the specular reflection conditions
|
Aleksandrov, P. A.
|
|
1985
|
18 |
1 |
p. 27-32
|
artikel
|
| 3 |
Angle and index calculations for `z-axis' X-ray diffractometer
|
Bloch, J. M.
|
|
1985
|
18 |
1 |
p. 33-36
|
artikel
|
| 4 |
A treatment of instrumental smearing effects in circularly symmetric small-angle scattering
|
Ramakrishnan, V.
|
|
1985
|
18 |
1 |
p. 42-46
|
artikel
|
| 5 |
Checklist for Authors of Papers Submitted to Journal of Applied Crystallography
|
|
|
1985
|
18 |
1 |
p. 1-2
|
artikel
|
| 6 |
Crystallographers
|
|
|
1985
|
18 |
1 |
p. 53
|
artikel
|
| 7 |
Differential X-ray diffraction: a theoretical basis for a technique based on wavelength variation
|
Nichols, M. C.
|
|
1985
|
18 |
1 |
p. 8-15
|
artikel
|
| 8 |
Dry etching for microelectronics edited by R. A. Powell
|
|
|
1985
|
18 |
1 |
p. 54
|
artikel
|
| 9 |
Focusing monochromators for pulsed neutron sources
|
Carlile, C. J.
|
|
1985
|
18 |
1 |
p. 16-19
|
artikel
|
| 10 |
Molecular beam epitaxy of III-V compounds: a comprehensive bibliography, 1958-1983 edited by K. Ploog
|
|
|
1985
|
18 |
1 |
p. 54
|
artikel
|
| 11 |
On the structure of the M' phase in Al–Zn–Mg alloys
|
Auld, J. H.
|
|
1985
|
18 |
1 |
p. 47-48
|
artikel
|
| 12 |
Rietveld analysis of powder neutron diffraction data displaying anisotropic crystallite size broadening
|
Greaves, C.
|
|
1985
|
18 |
1 |
p. 48-50
|
artikel
|
| 13 |
Single-crystal diffractometry: strategy for rapidly decaying poorly diffracting crystals
|
Fischer, J.
|
|
1985
|
18 |
1 |
p. 20-26
|
artikel
|
| 14 |
Structure of crystalline polymers edited by I. H. Hall
|
Kong, E. S.-W.
|
|
1985
|
18 |
1 |
p. 53-54
|
artikel
|
| 15 |
The GX crystallographic program system
|
Mallinson, P. R.
|
|
1985
|
18 |
1 |
p. 51-53
|
artikel
|
| 16 |
Two new X-ray films: conditions for optimum development and calibration of response
|
Phillips, W. C.
|
|
1985
|
18 |
1 |
p. 3-7
|
artikel
|
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