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                             16 results found
no title author magazine year volume issue page(s) type
1 A new high-pressure phase of uranium nitride studied by X-ray diffraction and synchrotron radiation Staun Olsen, J.
1985
18 1 p. 37-41
article
2 A new method for surface analysis of crystals using X-ray diffraction under the specular reflection conditions Aleksandrov, P. A.
1985
18 1 p. 27-32
article
3 Angle and index calculations for `z-axis' X-ray diffractometer Bloch, J. M.
1985
18 1 p. 33-36
article
4 A treatment of instrumental smearing effects in circularly symmetric small-angle scattering Ramakrishnan, V.
1985
18 1 p. 42-46
article
5 Checklist for Authors of Papers Submitted to Journal of Applied Crystallography 1985
18 1 p. 1-2
article
6 Crystallographers 1985
18 1 p. 53
article
7 Differential X-ray diffraction: a theoretical basis for a technique based on wavelength variation Nichols, M. C.
1985
18 1 p. 8-15
article
8 Dry etching for microelectronics edited by R. A. Powell 1985
18 1 p. 54
article
9 Focusing monochromators for pulsed neutron sources Carlile, C. J.
1985
18 1 p. 16-19
article
10 Molecular beam epitaxy of III-V compounds: a comprehensive bibliography, 1958-1983 edited by K. Ploog 1985
18 1 p. 54
article
11 On the structure of the M' phase in Al–Zn–Mg alloys Auld, J. H.
1985
18 1 p. 47-48
article
12 Rietveld analysis of powder neutron diffraction data displaying anisotropic crystallite size broadening Greaves, C.
1985
18 1 p. 48-50
article
13 Single-crystal diffractometry: strategy for rapidly decaying poorly diffracting crystals Fischer, J.
1985
18 1 p. 20-26
article
14 Structure of crystalline polymers edited by I. H. Hall Kong, E. S.-W.
1985
18 1 p. 53-54
article
15 The GX crystallographic program system Mallinson, P. R.
1985
18 1 p. 51-53
article
16 Two new X-ray films: conditions for optimum development and calibration of response Phillips, W. C.
1985
18 1 p. 3-7
article
                             16 results found
 
 Koninklijke Bibliotheek - National Library of the Netherlands