| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
A computer program generating parameters useful in X-ray diffraction topography studies
|
Roberts, K. J.
|
|
1983
|
16 |
5 |
p. 577-578
|
article
|
| 2 |
A computer X-ray quantitative phase analysis
|
Weiss, Z.
|
|
1983
|
16 |
5 |
p. 493-497
|
article
|
| 3 |
A focusing Weissenberg camera with multi-layer-line screens for macromolecular crystallography
|
Sakabe, N.
|
|
1983
|
16 |
5 |
p. 542-547
|
article
|
| 4 |
A geometric method incorporated with a computer program for indexing crystal faces of microcrystallites
|
Simov, S.
|
|
1983
|
16 |
5 |
p. 559-562
|
article
|
| 5 |
A medium-resolution double-crystal diffractometer for the study of small-angle neutron scattering
|
Kulda, J.
|
|
1983
|
16 |
5 |
p. 498-504
|
article
|
| 6 |
An absolute intensity standard for small-angle X-ray scattering measured with position-sensitive detectors
|
Russell, T. P.
|
|
1983
|
16 |
5 |
p. 473-478
|
article
|
| 7 |
Analysis of anisotropy of small-angle neutron scattering of polyethylene single crystals
|
Sadler, D. M.
|
|
1983
|
16 |
5 |
p. 519-523
|
article
|
| 8 |
Analytical molecular surface calculation
|
Connolly, M. L.
|
|
1983
|
16 |
5 |
p. 548-558
|
article
|
| 9 |
A remote-control direct-beam exposure device for the Arndt–Wonacott rotation camera
|
Helliwell, J. R.
|
|
1983
|
16 |
5 |
p. 579
|
article
|
| 10 |
A small-angle camera for resonant scattering experiments at the storage ring DORIS
|
Stuhrmann, H. B.
|
|
1983
|
16 |
5 |
p. 563-571
|
article
|
| 11 |
Assessment of parameter accuracies in profile analysis of white-beam neutron powder diffraction experiments
|
Pöyry, H.
|
|
1983
|
16 |
5 |
p. 479-485
|
article
|
| 12 |
A variable-temperature sample container for low-temperature neutron powder diffraction
|
Arzi, E.
|
|
1983
|
16 |
5 |
p. 449-452
|
article
|
| 13 |
Can inherited textures in the B.c.c. phase furnish information about the type of transformation from the F.c.c. phase?
|
Jung, V.
|
|
1983
|
16 |
5 |
p. 535-541
|
article
|
| 14 |
Crystal data for CuGaxIn1−xTe2
|
Gržeta-Plenković, B.
|
|
1983
|
16 |
5 |
p. 576
|
article
|
| 15 |
Crystal data for magnesium decavanadate. Mg3V10O2828.H2O
|
Rigotti, G.
|
|
1983
|
16 |
5 |
p. 575
|
article
|
| 16 |
Crystal data for Rb2CoCl4.2H2O
|
Hybler, J.
|
|
1983
|
16 |
5 |
p. 575
|
article
|
| 17 |
Crystal data for two orthorphosphates α-NaCuPO4 and β-AgCuPO4
|
Quarton, M.
|
|
1983
|
16 |
5 |
p. 576-577
|
article
|
| 18 |
Crystallographers
|
|
|
1983
|
16 |
5 |
p. 580
|
article
|
| 19 |
Detector aperture size in the conventional estimation of integrated intensity in the /20 scan mode
|
McL Mathieson, A.
|
|
1983
|
16 |
5 |
p. 572-573
|
article
|
| 20 |
Diffraction line profiles and Scherrer constants for materials with hexagonal crystallites
|
Vargas, R.
|
|
1983
|
16 |
5 |
p. 512-518
|
article
|
| 21 |
Eccentricity corrections for a modified Debye–Scherrer camera
|
Frevel, L. K.
|
|
1983
|
16 |
5 |
p. 532-534
|
article
|
| 22 |
Error in 2π from single-crystal diffractometers due to sample absorption in a divergent primary beam
|
Svensson, C.
|
|
1983
|
16 |
5 |
p. 573-575
|
article
|
| 23 |
Etude du gonflement des vermiculites–ornithine en solution saline par analyse de la diffusion des rayons X aux petits angles. Méthode d'interprétation et recherche des paramètres d'ordre
|
Saez-Auñon, J.
|
|
1983
|
16 |
5 |
p. 439-448
|
article
|
| 24 |
ICOTOM-6 edited by S. Nagashima
|
|
|
1983
|
16 |
5 |
p. 580
|
article
|
| 25 |
Industrial crystallization 81 edited by S. J. Jancic and E. J. de Jong
|
Mullin, J. W.
|
|
1983
|
16 |
5 |
p. 580
|
article
|
| 26 |
Monolithic double-grooved-crystal monochromators with tunable harmonic suppression for neutrons and X-rays
|
Bonse, U.
|
|
1983
|
16 |
5 |
p. 524-531
|
article
|
| 27 |
Precision interplanar spacing measurements of boron-doped silicon
|
Soares, D. A. W.
|
|
1983
|
16 |
5 |
p. 486-492
|
article
|
| 28 |
Studies on rare-earth carboxylates. II. Crystal chemical data on Ln(CH3CHCH3COO)3 where Ln=Er, Tm or Yb
|
Nabar, M. A.
|
|
1983
|
16 |
5 |
p. 576
|
article
|
| 29 |
The doping method in quantitative X-ray diffraction phase analysis. Addendum
|
Popović, S.
|
|
1983
|
16 |
5 |
p. 505-507
|
article
|
| 30 |
The effect of finite detector slit height on peak positions and shapes in powder diffraction
|
Prince, E.
|
|
1983
|
16 |
5 |
p. 508-511
|
article
|
| 31 |
Thermal expansivity of α-LiIO3 between 20 and 520 K
|
Abrahams, S. C.
|
|
1983
|
16 |
5 |
p. 453-457
|
article
|
| 32 |
X-ray Rietveld refinement using Debye–Scherrer geometry
|
Thompson, P.
|
|
1983
|
16 |
5 |
p. 458-472
|
article
|
Journal description