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                             32 results found
no title author magazine year volume issue page(s) type
1 About the N-series X-ray lines in the electron excited spectra of heavy elements Scheffel, Andy
2008
161 3-4 p. 471-473
article
2 Analysis of ultra light elements with newly developed ultra-soft X-ray spectrometer for electron probe microanalysis Ogiwara, Toshiya
2008
161 3-4 p. 451-454
article
3 Application of EPMA and analytical TEM to brazed metal-supported catalytic converters Richter, Silvia
2007
161 3-4 p. 405-411
article
4 Application of EPMA and XRF for the investigation of particulate pollutants in the field of cultural heritage Kontozova-Deutsch, Velichka
2008
161 3-4 p. 465-469
article
5 Applications of focused ion beam SIMS in materials science McPhail, David S.
2008
161 3-4 p. 387-397
article
6 Applications of microanalysis in the cultural heritage field Joosten, Ineke
2008
161 3-4 p. 295-299
article
7 A SIMS study of lithium, boron and chlorine in basalts from Reykjanes (southwestern Iceland) Raffone, Nicola
2008
161 3-4 p. 307-312
article
8 Block lift-out sample preparation for 3D experiments in a dual beam focused ion beam microscope Schaffer, Miroslava
2007
161 3-4 p. 421-425
article
9 Chemical and microstructural characterization of natural hydroxyapatite derived from pig bones Janus, Anna Maria
2007
161 3-4 p. 349-353
article
10 Combined cathodoluminescence spectroscopy, electron microprobe and laser ablation ICP mass spectrometry analysis: an attempt to correlate luminescence and chemical composition of monazite Vaggelli, Gloria
2008
161 3-4 p. 313-321
article
11 Combined SEM-EDX and μ-Raman spectroscopy for the characterisation of glass/Al-rich refractory interfaces Falcone, Roberto
2008
161 3-4 p. 381-386
article
12 Conventional wavelength dispersive spectroscopy versus parallel beam spectroscopy – a basic overview van Hoek, Corrie
2007
161 3-4 p. 287-293
article
13 Electron beam and Mössbauer techniques combined to optimise base metal partitioning in the furnace Andrews, Lesley
2008
161 3-4 p. 445-450
article
14 First X-ray fluorescence excited Kossel diffraction in SEM Langer, Enrico
2008
161 3-4 p. 455-458
article
15 Improvements in trace element detection in energy dispersive spectrometry using an X-ray filter (FEDS) and applications to petrological problems Cossio, Roberto
2007
161 3-4 p. 337-342
article
16 Investigation of InxGa1−xN layers by local methods Domracheva, Yana V.
2007
161 3-4 p. 371-375
article
17 Investigation of the relative sensitivity factor for the quantification of ion microprobe results for Nd isotopes in simulated nuclear fuel Portier, Stéphane
2007
161 3-4 p. 479-483
article
18 Light elements microanalysis of steel/B4C melts for nuclear power plants accident studies Sao Joao, Sergio
2007
161 3-4 p. 343-348
article
19 Micro X-ray fluorescence as a potential technique to monitor in-situ air pollution Bontempi, Elza
2007
161 3-4 p. 301-305
article
20 Model-based quantification of EELS: is standardless quantification possible? Verbeeck, Jo
2008
161 3-4 p. 439-443
article
21 Modern developments and applications in microbeam analysis. Proceedings of the 10th Workshop of the European Microbeam Analysis Society (EMAS), Antwerp, Belgium, May 6–10, 2007 Van’t dack, Luc
2008
161 3-4 p. 285-286
article
22 Monte Carlo calculations in X-ray microanalysis of epitaxial layers Popova, Tatiana B.
2008
161 3-4 p. 459-463
article
23 Multilayers for light element electron probe microanalysis Reed, Stephen J. B.
2008
161 3-4 p. 433-437
article
24 New model ultra-soft X-ray spectrometer for microanalysis Fukushima, Sei
2008
161 3-4 p. 399-404
article
25 SIMS analysis of chlorine in metasomatised upper-mantle rocks Ottolini, Luisa P.
2007
161 3-4 p. 329-336
article
26 Soluble fraction of stabilising elements in ferritic stainless steel Almagro, Juan F.
2008
161 3-4 p. 323-327
article
27 Study of structural material resulting from the nuclear fuel cycle using SEM-WDX, EPMA and SIMS techniques Lamontagne, Jérôme
2007
161 3-4 p. 355-362
article
28 The M emission spectra of the heavy rare earth elements 67 ≤ Z ≤ 71 Dellith, Jan
2007
161 3-4 p. 475-478
article
29 Van Gogh’s painting grounds: an examination of barium sulphate extender using analytical electron microscopy – SEM/FIB/TEM/EDX Haswell, R.
2008
161 3-4 p. 363-369
article
30 Virtual standard for wavelength-dispersive electron-probe microanalysis Merlet, Claude
2007
161 3-4 p. 427-432
article
31 Volume and composition surface changes in alkali silicate glass irradiated with electrons Jurek, Karel
2008
161 3-4 p. 377-380
article
32 X-ray fluorescence as an additional analytical method for a scanning electron microscope Procop, Mathias
2007
161 3-4 p. 413-419
article
                             32 results found
 
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