| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Absolute Determination of Characteristic X-Ray Yields with a Wavelength-Dispersive Spectrometer
|
Merlet, Claude
|
|
2006
|
155 |
1-2 |
p. 199-204
|
artikel
|
| 2 |
Accurate Determination of Trace Amounts of Oxygen in CrAlN Hard Coatings by a Combination of WDS–EPMA and SIMS
|
Dreer, Sabine
|
|
2006
|
155 |
1-2 |
p. 125-128
|
artikel
|
| 3 |
Advanced X-Ray Laboratory Microbeam Techniques Applied to Metallurgy
|
Gelfi, Marcello
|
|
2006
|
155 |
1-2 |
p. 151-155
|
artikel
|
| 4 |
Advances in Electron Backscatter Diffraction for the Characterisation of Interfaces
|
Randle, Valerie
|
|
2006
|
155 |
1-2 |
p. 31-37
|
artikel
|
| 5 |
A New Method of Surface Preparation for High Spatial Resolution EPMA/SEM with an Argon Ion Beam
|
Takahashi, Hideyuki
|
|
2006
|
155 |
1-2 |
p. 295-300
|
artikel
|
| 6 |
A New Method to Examine Interfacial Reactions of a Multilayered System NiAl–Hf–hBN on a Sapphire Fibre
|
Richter, Silvia
|
|
2006
|
155 |
1-2 |
p. 257-262
|
artikel
|
| 7 |
A Novel Method of Analytical Transmission Electron Microscopy for Measuring Highly Accurately Segregation to Special Grain Boundaries or Planar Interfaces
|
Walther, Thomas
|
|
2006
|
155 |
1-2 |
p. 313-318
|
artikel
|
| 8 |
Assessment of Inorganic Fibre Burden in Biological Samples by Scanning Electron Microscopy – Energy Dispersive Spectroscopy
|
Belluso, Elena
|
|
2006
|
155 |
1-2 |
p. 95-100
|
artikel
|
| 9 |
Atomic Level Characterization Based on Focus Modulation Electron Microscopy
|
Takai, Yoshizo
|
|
2006
|
155 |
1-2 |
p. 11-17
|
artikel
|
| 10 |
Cathodoluminescence Microscopy and Spectroscopy of Opto-Electronic Materials
|
Phillips, Matthew R.
|
|
2006
|
155 |
1-2 |
p. 51-58
|
artikel
|
| 11 |
Co-Localization of Copper, Zinc and Lead with Calcium in Their Accumulation Sites in the Housefly’s Abdomen by Micro-PIXE
|
Tylko, Grzegorz
|
|
2006
|
155 |
1-2 |
p. 301-304
|
artikel
|
| 12 |
Comparison of 3D Surface Reconstruction Data from Certified Depth Standards Obtained by SEM and an Infinite Focus Measurement Machine (IFM)
|
Schroettner, Hartmuth
|
|
2006
|
155 |
1-2 |
p. 279-284
|
artikel
|
| 13 |
DAC-EuCheMS Affairs
|
|
|
2006
|
155 |
1-2 |
p. 327
|
artikel
|
| 14 |
Detector Calibration and Measurement of Fundamental Parameters for X-Ray Spectrometry
|
Scholze, Frank
|
|
2006
|
155 |
1-2 |
p. 275-278
|
artikel
|
| 15 |
Direct Visualization of Electromagnetic Microfields by Superposition of Two Kinds of Electron Holograms
|
Ohshita, Akinori
|
|
2006
|
155 |
1-2 |
p. 225-228
|
artikel
|
| 16 |
EDX-Spectra Simulation in Electron Probe Microanalysis. Optimization of Excitation Conditions and Detection Limits
|
Eggert, Frank
|
|
2006
|
155 |
1-2 |
p. 129-136
|
artikel
|
| 17 |
Electrically Cooled SiLi Detectors for Application in X-Ray Equipment
|
Sokolov, Alexander
|
|
2006
|
155 |
1-2 |
p. 285-288
|
artikel
|
| 18 |
Electron Excited L X-Ray Spectra of the Elements 24 ≤ Z ≤ 33
|
Aßmann, Andrea
|
|
2006
|
155 |
1-2 |
p. 87-89
|
artikel
|
| 19 |
Electron Excited L X-Ray Spectra of the Elements 14 ≤ Z ≤ 22
|
Aßmann, Andrea
|
|
2006
|
155 |
1-2 |
p. 83-86
|
artikel
|
| 20 |
Electron Probe Microanalysis of HfO2 Thin Films on Conductive and Insulating Substrates
|
Lulla, Marina
|
|
2006
|
155 |
1-2 |
p. 195-198
|
artikel
|
| 21 |
EPMA Investigation of Roman Coin Silvering Techniques
|
Kraft, Gunther
|
|
2006
|
155 |
1-2 |
p. 179-182
|
artikel
|
| 22 |
ESEM Applications: From Cultural Heritage Conservation to Nano-Behaviour
|
Doehne, Eric
|
|
2006
|
155 |
1-2 |
p. 45-50
|
artikel
|
| 23 |
External Micro-PIXE Measurements: Preliminary Results on Volcanic Rocks from Nyiragongo Volcano
|
Santo, Alba P.
|
|
2006
|
155 |
1-2 |
p. 263-267
|
artikel
|
| 24 |
Fission Gas Bubbles Characterisation in Irradiated UO2 Fuel by SEM, EPMA and SIMS
|
Lamontagne, Jérôme
|
|
2006
|
155 |
1-2 |
p. 183-187
|
artikel
|
| 25 |
Imaging and Microanalysis in Environmental Scanning Electron Microscopy
|
Thiel, Bradley L.
|
|
2006
|
155 |
1-2 |
p. 39-44
|
artikel
|
| 26 |
Imaging Single Atoms with Z-Contrast Scanning Transmission Electron Microscopy in Two and Three Dimensions
|
Voyles, Paul M.
|
|
2006
|
155 |
1-2 |
p. 5-10
|
artikel
|
| 27 |
Influence of Second-Order Lines on the Quantitative Wavelength Dispersive Spectrometry Analysis at Low Accelerating Voltages
|
Mikli, Valdek
|
|
2006
|
155 |
1-2 |
p. 205-208
|
artikel
|
| 28 |
In-Situ Investigation of Discolouration Processes Between Historic Oil Paint Pigments
|
White, Rachel
|
|
2006
|
155 |
1-2 |
p. 319-322
|
artikel
|
| 29 |
Installation of a Shielded SIMS for the Analysis of Irradiated Nuclear Fuels
|
Brémier, Stéphane
|
|
2006
|
155 |
1-2 |
p. 113-120
|
artikel
|
| 30 |
Laboratory Microbeam Analysis Applied to Cultural Heritage Studies
|
Benedetti, Dario
|
|
2006
|
155 |
1-2 |
p. 101-104
|
artikel
|
| 31 |
Light-Lithophile Element Metasomatism of Finero Peridotite (W ALPS): A Secondary-Ion Mass Spectrometry Study
|
Raffone, Nicola
|
|
2006
|
155 |
1-2 |
p. 251-255
|
artikel
|
| 32 |
Low Voltage Contrast with an SEM Transmission Electron Detector
|
Grillon, François
|
|
2006
|
155 |
1-2 |
p. 157-161
|
artikel
|
| 33 |
Microanalysis of Glass Surfaces after Thermal Exposure
|
Gedeon, Ondrej
|
|
2006
|
155 |
1-2 |
p. 147-150
|
artikel
|
| 34 |
Microanalysis of Hydrogen, Boron and Fluorine in Vesuvianite by Means of SIMS, EPMA and FTIR
|
Bellatreccia, Fabio
|
|
2006
|
155 |
1-2 |
p. 91-94
|
artikel
|
| 35 |
Micro Analysis on Hallstatt Textiles: Colour and Condition
|
Joosten, Ineke
|
|
2006
|
155 |
1-2 |
p. 169-174
|
artikel
|
| 36 |
Micro-PIXE Analysis of Monazite from the Dora Maira Massif, Western Italian Alps
|
Vaggelli, Gloria
|
|
2006
|
155 |
1-2 |
p. 305-311
|
artikel
|
| 37 |
Modern Developments and Applications in Microbeam Analysis. Proceedings of the 9th Workshop of the European Microbeam Analysis Society (EMAS) and the 3rd Meeting of the International Union of Microbeam Analysis Societies (IUMAS), Florence, Italy, May 22–26, 2005
|
Rinaldi, Romano
|
|
2006
|
155 |
1-2 |
p. 1-3
|
artikel
|
| 38 |
Monte Carlo Simulation in Electron Probe Microanalysis. Comparison of Different Simulation Algorithms
|
Salvat, Francesc
|
|
2006
|
155 |
1-2 |
p. 67-74
|
artikel
|
| 39 |
New Orientation Formation During Recrystallization of Cold Deformed, High Symmetry Aluminium Bicrystals
|
Paul, Henryk
|
|
2006
|
155 |
1-2 |
p. 235-242
|
artikel
|
| 40 |
Off-Line Metrology on SEM Images Using Gray Scale Morphology
|
Zois, Elias N.
|
|
2006
|
155 |
1-2 |
p. 323-326
|
artikel
|
| 41 |
Orientation Imaging in Scanning Electron and Transmission Electron Microscopy for Characterization of the Shear Banding Phenomenon
|
Paul, Henryk
|
|
2006
|
155 |
1-2 |
p. 243-250
|
artikel
|
| 42 |
Orientation Imaging Microscopy for the Transmission Electron Microscope
|
Dingley, David J.
|
|
2006
|
155 |
1-2 |
p. 19-29
|
artikel
|
| 43 |
Pile-Up Correction for Improved Accuracy and Speed of X-Ray Analysis
|
Statham, Peter J.
|
|
2006
|
155 |
1-2 |
p. 289-294
|
artikel
|
| 44 |
Preparation of Reference Glasses for in-situ Analysis of Lithium and Boron
|
Le Fevre, Brieuc
|
|
2006
|
155 |
1-2 |
p. 189-194
|
artikel
|
| 45 |
Quantitative Bulk and Trace Element X-Ray Mapping Using Multiple Detectors
|
Moran, Ken
|
|
2006
|
155 |
1-2 |
p. 59-66
|
artikel
|
| 46 |
Quantitative X-Ray Microanalysis of Heterogeneous Materials Using Monte Carlo Simulations
|
Gauvin, Raynald
|
|
2006
|
155 |
1-2 |
p. 75-81
|
artikel
|
| 47 |
Shave-Off Depth Profiling for Nano-Devices
|
Nojima, Masashi
|
|
2006
|
155 |
1-2 |
p. 219-223
|
artikel
|
| 48 |
Spatial Resolution of a Wavelength-Dispersive Electron Probe Microanalyzer Equipped with a Thermal Field Emission Gun
|
Kimura, Takashi
|
|
2006
|
155 |
1-2 |
p. 175-178
|
artikel
|
| 49 |
Strategies for Quantification of Light Elements in Minerals by SIMS: H, B and F
|
Ottolini, Luisa
|
|
2006
|
155 |
1-2 |
p. 229-233
|
artikel
|
| 50 |
The Blue Pigment Used in Vallemaggia (Switzerland) in the Half of 19th Century by Painters Vanoni and Pedrazzi
|
Cavallo, Giovanni
|
|
2006
|
155 |
1-2 |
p. 121-124
|
artikel
|
| 51 |
The L Spectrum of Fe and Fe3O4
|
Scheffel, Andy
|
|
2006
|
155 |
1-2 |
p. 269-274
|
artikel
|
| 52 |
The Valence State Analysis of Ti in FeTiO3 by Soft X-Ray Spectroscopy
|
Fukushima, Sei
|
|
2006
|
155 |
1-2 |
p. 141-145
|
artikel
|
| 53 |
Van Gogh’s Painting Grounds: Quantitative Determination of Bulking Agents (Extenders) Using SEM/EDX
|
Haswell, Ralph
|
|
2006
|
155 |
1-2 |
p. 163-167
|
artikel
|
| 54 |
WDXRF, EPMA and SEM/EDX Quantitative Chemical Analyses of Small Glass Samples
|
Falcone, Roberto
|
|
2006
|
155 |
1-2 |
p. 137-140
|
artikel
|
| 55 |
X-Ray Mapping and Interpretation of Scatter Diagrams
|
Moran, Ken
|
|
2006
|
155 |
1-2 |
p. 209-217
|
artikel
|
| 56 |
Yttrium Geothermometry Applied to Garnets from Different Metamorphic Grades Analysed by EPMA and µ-PIXE Techniques
|
Borghi, Alessandro
|
|
2006
|
155 |
1-2 |
p. 105-112
|
artikel
|
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