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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
7 results found
| no | title | author | magazine | year | volume | issue | page(s) | type |
| 1 | Achieving sub-1.6-nm resolutions of a low-voltage microscopic focused-ion-beam system not involving aberration correction |
Zhukov, V. A. |
2008 |
37 | 2 |
p. 98-106 |
article |
|
| 2 | Diluted magnetic semiconductors: Actual structure and magnetic and transport properties |
Chuev, M. A. |
2008 |
37 | 2 |
p. 73-88 |
article |
|
| 3 | Flip-chip bump-lead fabrication: A review |
Zenin, V. V. |
2008 |
37 | 2 |
p. 107-113 |
article |
|
| 4 | Microwave method for SOS quality testing |
Borodovskii, P. A. |
2008 |
37 | 2 |
p. 89-97 |
article |
|
| 5 | New approach to the mathematical modeling of thermal regimes for electronic equipment |
Kuznetsov, G. V. |
2008 |
37 | 2 |
p. 131-138 |
article |
|
| 6 | Radiation effects in a BiCMOS LSI interface transceiver |
Belous, A. I. |
2008 |
37 | 2 |
p. 121-130 |
article |
|
| 7 | Silicon readout ICs for third-generation 2D IR focal-plane arrays operating over the wavelength range 8–12 μm |
Lee, I. I. |
2008 |
37 | 2 |
p. 114-120 |
article |
7 results found