no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
1 |
CVD diamond coating of AlN ceramic substrates to enhance heat removal
|
Ralchenko, V. G. |
|
2006 |
35 |
4 |
p. 205-209 |
article |
2 |
CVD diamond coating of AlN ceramic substrates to enhance heat removal
|
Ralchenko, V. G. |
|
|
35 |
4 |
p. 205-209 |
article |
3 |
Degradation pattern of thin HfO2 films on Si(100) under ultrahigh-vacuum annealing: An investigation by x-ray photoelectron spectroscopy and low-energy ion scattering
|
Zenkevich, A. V. |
|
2006 |
35 |
4 |
p. 210-215 |
article |
4 |
Degradation pattern of thin HfO2 films on Si(100) under ultrahigh-vacuum annealing: An investigation by x-ray photoelectron spectroscopy and low-energy ion scattering
|
Zenkevich, A. V. |
|
|
35 |
4 |
p. 210-215 |
article |
5 |
Influence of defects in gate-oxide peripheral regions on the electrical characteristics of MOS structures
|
Savenko, A. Yu. |
|
|
35 |
4 |
p. 222-234 |
article |
6 |
Influence of defects in gate-oxide peripheral regions on the electrical characteristics of MOS structures
|
Savenko, A. Yu. |
|
2006 |
35 |
4 |
p. 222-234 |
article |
7 |
Integrated receivers for wireless communications: A review
|
Korotkov, A. S. |
|
2006 |
35 |
4 |
p. 243-261 |
article |
8 |
Integrated receivers for wireless communications: A review
|
Korotkov, A. S. |
|
|
35 |
4 |
p. 243-261 |
article |
9 |
Periodically doped MOSFET structure
|
Uritsky, V. Ya. |
|
2006 |
35 |
4 |
p. 216-221 |
article |
10 |
Periodically doped MOSFET structure
|
Uritsky, V. Ya. |
|
|
35 |
4 |
p. 216-221 |
article |
11 |
PRALU-to-VHDL conversion of parallel-algorithm descriptions for control units
|
Bibilo, P. N. |
|
|
35 |
4 |
p. 262-275 |
article |
12 |
PRALU-to-VHDL conversion of parallel-algorithm descriptions for control units
|
Bibilo, P. N. |
|
2006 |
35 |
4 |
p. 262-275 |
article |
13 |
Testing the electromigration resistance of Al metallization patterns by electrical-resistance measurement
|
Gorlov, M. I. |
|
2006 |
35 |
4 |
p. 235-242 |
article |