| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Borophosphosilicate Glass Films in Silicon Microelectronics, Part 1: Chemical Vapor Deposition, Composition, and Properties
|
V. Y. Vasilev
|
|
2004
|
33 |
5 |
p. 271-284
14 p.
|
artikel
|
| 2 |
Borophosphosilicate Glass Films in Silicon Microelectronics, Part 1: Chemical Vapor Deposition, Composition, and Properties
|
Vasilev, V. Y.
|
|
2004
|
33 |
5 |
p. 271-284
|
artikel
|
| 3 |
Controlling Electrical Transport through Bundles of Single-Wall Carbon Nanotubes
|
I. I. Bobrinetskii
|
|
2004
|
33 |
5 |
p. 292-297
6 p.
|
artikel
|
| 4 |
Controlling Electrical Transport through Bundles of Single-Wall Carbon Nanotubes
|
Bobrinetskii, I. I.
|
|
2004
|
33 |
5 |
p. 292-297
|
artikel
|
| 5 |
Custom Logic: A Toolkit for the Design of VLSI Custom Control MOS Logic
|
P. N. Bibilo
|
|
2004
|
33 |
5 |
p. 310-327
18 p.
|
artikel
|
| 6 |
Custom Logic: A Toolkit for the Design of VLSI Custom Control MOS Logic
|
Bibilo, P. N.
|
|
2004
|
33 |
5 |
p. 310-327
|
artikel
|
| 7 |
Deposition of Nanoscale Films with Fractal Topography
|
I. N. Serov
|
|
2004
|
33 |
5 |
p. 263-270
8 p.
|
artikel
|
| 8 |
Deposition of Nanoscale Films with Fractal Topography
|
Serov, I. N.
|
|
2004
|
33 |
5 |
p. 263-270
|
artikel
|
| 9 |
In Celebration of Tatevos M. Agakhanyan's 80th Birthday
|
|
|
2004
|
33 |
5 |
p. 261-262
2 p.
|
artikel
|
| 10 |
In Celebration of Tatevos M. Agakhanyan's 80th Birthday
|
|
|
2004
|
33 |
5 |
p. 261-262
|
artikel
|
| 11 |
Numerical Solution of the ThomasFermi Equation for the Centrally Symmetric Atom
|
N. A. Zaitsev
|
|
2004
|
33 |
5 |
p. 303-309
7 p.
|
artikel
|
| 12 |
Numerical Solution of the Thomas–Fermi Equation for the Centrally Symmetric Atom
|
Zaitsev, N. A.
|
|
2004
|
33 |
5 |
p. 303-309
|
artikel
|
| 13 |
Silicon-Surface Restructuring under Cleaning as a Method for Improving Al/Mo-to-Si Contact Resistance and Microwave-BJT Parameters
|
Yu. P. Snitovsky
|
|
2004
|
33 |
5 |
p. 298-302
5 p.
|
artikel
|
| 14 |
Silicon-Surface Restructuring under Cleaning as a Method for Improving Al/Mo-to-Si Contact Resistance and Microwave-BJT Parameters
|
Snitovsky, Yu. P.
|
|
2004
|
33 |
5 |
p. 298-302
|
artikel
|
| 15 |
Uniformity of Optical Constants in Amorphous Ta2O5 Thin Films as Measured by Spectroscopic Ellipsometry
|
V. A. Shvets
|
|
2004
|
33 |
5 |
p. 285-291
7 p.
|
artikel
|
| 16 |
Uniformity of Optical Constants in Amorphous Ta2O5 Thin Films as Measured by Spectroscopic Ellipsometry
|
Shvets, V. A.
|
|
2004
|
33 |
5 |
p. 285-291
|
artikel
|
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