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                             16 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Borophosphosilicate Glass Films in Silicon Microelectronics, Part 1: Chemical Vapor Deposition, Composition, and Properties V. Y. Vasilev
2004
33 5 p. 271-284
14 p.
artikel
2 Borophosphosilicate Glass Films in Silicon Microelectronics, Part 1: Chemical Vapor Deposition, Composition, and Properties Vasilev, V. Y.
2004
33 5 p. 271-284
artikel
3 Controlling Electrical Transport through Bundles of Single-Wall Carbon Nanotubes I. I. Bobrinetskii
2004
33 5 p. 292-297
6 p.
artikel
4 Controlling Electrical Transport through Bundles of Single-Wall Carbon Nanotubes Bobrinetskii, I. I.
2004
33 5 p. 292-297
artikel
5 Custom Logic: A Toolkit for the Design of VLSI Custom Control MOS Logic P. N. Bibilo
2004
33 5 p. 310-327
18 p.
artikel
6 Custom Logic: A Toolkit for the Design of VLSI Custom Control MOS Logic Bibilo, P. N.
2004
33 5 p. 310-327
artikel
7 Deposition of Nanoscale Films with Fractal Topography I. N. Serov
2004
33 5 p. 263-270
8 p.
artikel
8 Deposition of Nanoscale Films with Fractal Topography Serov, I. N.
2004
33 5 p. 263-270
artikel
9 In Celebration of Tatevos M. Agakhanyan's 80th Birthday 2004
33 5 p. 261-262
2 p.
artikel
10 In Celebration of Tatevos M. Agakhanyan's 80th Birthday 2004
33 5 p. 261-262
artikel
11 Numerical Solution of the ThomasFermi Equation for the Centrally Symmetric Atom N. A. Zaitsev
2004
33 5 p. 303-309
7 p.
artikel
12 Numerical Solution of the Thomas–Fermi Equation for the Centrally Symmetric Atom Zaitsev, N. A.
2004
33 5 p. 303-309
artikel
13 Silicon-Surface Restructuring under Cleaning as a Method for Improving Al/Mo-to-Si Contact Resistance and Microwave-BJT Parameters Yu. P. Snitovsky
2004
33 5 p. 298-302
5 p.
artikel
14 Silicon-Surface Restructuring under Cleaning as a Method for Improving Al/Mo-to-Si Contact Resistance and Microwave-BJT Parameters Snitovsky, Yu. P.
2004
33 5 p. 298-302
artikel
15 Uniformity of Optical Constants in Amorphous Ta2O5 Thin Films as Measured by Spectroscopic Ellipsometry V. A. Shvets
2004
33 5 p. 285-291
7 p.
artikel
16 Uniformity of Optical Constants in Amorphous Ta2O5 Thin Films as Measured by Spectroscopic Ellipsometry Shvets, V. A.
2004
33 5 p. 285-291
artikel
                             16 gevonden resultaten
 
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