IBL Tool - Digital Library

Digital Library

Journal description

All volumes of the corresponding journal

All issues of the corresponding volume

All articles of the corresponding issues

14 results found

no	title	author	magazine	year	volume	issue	page(s)	type
1	MBE-Grown GaAs Films on GaAs(111)A Substrates Misoriented toward 21¯1¯	G. B. Galiev		2003	32	1	p. 14-20 7 p.	article
2	MBE-Grown GaAs Films on GaAs(111)A Substrates Misoriented toward [21¯1¯]	Galiev, G. B.		2003	32	1	p. 14-20	article
3	Methods for the Prediction of Total-Dose Effects on Modern Integrated Semiconductor Devices in Space: A Review	V. V. Belyakov		2003	32	1	p. 25-39 15 p.	article
4	Methods for the Prediction of Total-Dose Effects on Modern Integrated Semiconductor Devices in Space: A Review	Belyakov, V. V.		2003	32	1	p. 25-39	article
5	Modeling Molecular-Ion Implantation into Solids	A. V. Chernyaev		2003	32	1	p. 21-25 5 p.	article
6	Modeling Molecular-Ion Implantation into Solids	Chernyaev, A. V.		2003	32	1	p. 21-25	article
7	Self-aligned Technology Applied to Planar Power MOSFETs	M. A. Korolev		2003	32	1	p. 11-13 3 p.	article
8	Self-aligned Technology Applied to Planar Power MOSFETs	Korolev, M. A.		2003	32	1	p. 11-13	article
9	SOI-MOSFET Threshold-Voltage Characteristics	S. M. Zakharov		2003	32	1	p. 1-10 10 p.	article
10	SOI-MOSFET Threshold-Voltage Characteristics	Zakharov, S. M.		2003	32	1	p. 1-10	article
11	Statistical Simulation for Process Design and Optimization in IC Manufacture	A. A. Kouleshoff		2003	32	1	p. 39-50 12 p.	article
12	Statistical Simulation for Process Design and Optimization in IC Manufacture	Kouleshoff, A. A.		2003	32	1	p. 39-50	article
13	Statistical Yield Modeling for IC Manufacture: Hierarchical Fault Distributions	Yu. I. Bogdanov		2003	32	1	p. 51-62 12 p.	article
14	Statistical Yield Modeling for IC Manufacture: Hierarchical Fault Distributions	Bogdanov, Yu. I.		2003	32	1	p. 51-62	article

14 results found

Koninklijke Bibliotheek - National Library of the Netherlands